{"id":"https://openalex.org/W2012484456","doi":"https://doi.org/10.1109/tim.2014.2320831","title":"Dense Spectral Grid NVNA Phase Measurements Using Vector Signal Generators","display_name":"Dense Spectral Grid NVNA Phase Measurements Using Vector Signal Generators","publication_year":2014,"publication_date":"2014-05-16","ids":{"openalex":"https://openalex.org/W2012484456","doi":"https://doi.org/10.1109/tim.2014.2320831","mag":"2012484456"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2014.2320831","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2014.2320831","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068584900","display_name":"Yichi Zhang","orcid":"https://orcid.org/0000-0002-5299-2895"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yichi Zhang","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101894798","display_name":"Zhao He","orcid":"https://orcid.org/0000-0001-6017-8909"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhao He","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046370742","display_name":"Hang Li","orcid":"https://orcid.org/0000-0001-9996-9695"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hang Li","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008759875","display_name":"Meining Nie","orcid":"https://orcid.org/0000-0003-2982-0400"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Meining Nie","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5068584900"],"corresponding_institution_ids":["https://openalex.org/I4210162136"],"apc_list":null,"apc_paid":null,"fwci":1.884,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.87160815,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"63","issue":"12","first_page":"2983","last_page":"2992"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6872662305831909},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.6306624412536621},{"id":"https://openalex.org/keywords/spectrum-analyzer","display_name":"Spectrum analyzer","score":0.47876206040382385},{"id":"https://openalex.org/keywords/grid","display_name":"Grid","score":0.4787132740020752},{"id":"https://openalex.org/keywords/tone","display_name":"Tone (literature)","score":0.4512150287628174},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4363562762737274},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.431535542011261},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4304337501525879},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3878413438796997},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2639188766479492},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2598060369491577},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18841511011123657},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1505739688873291},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.07491269707679749}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6872662305831909},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.6306624412536621},{"id":"https://openalex.org/C158007255","wikidata":"https://www.wikidata.org/wiki/Q1055222","display_name":"Spectrum analyzer","level":2,"score":0.47876206040382385},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.4787132740020752},{"id":"https://openalex.org/C2780583480","wikidata":"https://www.wikidata.org/wiki/Q1366327","display_name":"Tone (literature)","level":2,"score":0.4512150287628174},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4363562762737274},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.431535542011261},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4304337501525879},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3878413438796997},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2639188766479492},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2598060369491577},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18841511011123657},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1505739688873291},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07491269707679749},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2014.2320831","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2014.2320831","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4699999988079071,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1494697675","https://openalex.org/W1973612022","https://openalex.org/W1992097434","https://openalex.org/W2063267636","https://openalex.org/W2078317750","https://openalex.org/W2098946547","https://openalex.org/W2102959510","https://openalex.org/W2113475782","https://openalex.org/W2116824438","https://openalex.org/W2117315946","https://openalex.org/W2120338989","https://openalex.org/W2123705331","https://openalex.org/W2147573548","https://openalex.org/W2151754530","https://openalex.org/W2155497149","https://openalex.org/W2160731097","https://openalex.org/W6665956284"],"related_works":["https://openalex.org/W2391061712","https://openalex.org/W2094171095","https://openalex.org/W217756519","https://openalex.org/W2360439310","https://openalex.org/W1979303977","https://openalex.org/W2372452257","https://openalex.org/W2546380746","https://openalex.org/W2132162064","https://openalex.org/W2348795485","https://openalex.org/W4233192307"],"abstract_inverted_index":{"This":[0],"paper":[1,73],"proposes":[2],"a":[3,12,31,59,63,106],"practical":[4],"approach":[5,95],"for":[6,74],"dense-spectral-grid":[7],"phase":[8,27,40,65,83,99],"measurements":[9],"based":[10],"on":[11,105],"nonlinear":[13],"vector":[14],"network":[15],"analyzer":[16],"(NVNA).":[17],"With":[18],"the":[19,39,54,76,93,97],"multitone":[20,61],"outputs":[21],"of":[22,42,49,58,85],"commercial":[23],"VSGs":[24],"as":[25],"both":[26,92],"references":[28],"and":[29,96],"standards,":[30],"modified":[32],"NVNA":[33],"is":[34,68],"presented":[35],"to":[36,53],"effectively":[37],"obtain":[38],"spectra":[41],"modulated":[43],"RF":[44],"signals":[45],"with":[46,91],"spectral":[47,108],"resolution":[48],"1-100":[50],"kHz.":[51],"Due":[52],"limited":[55],"tone":[56,78],"number":[57],"VSG":[60],"standard,":[62],"multistep":[64,98],"calibration":[66,100],"method":[67,101],"also":[69],"proposed":[70],"in":[71,80],"this":[72],"multiplying":[75],"calibratable":[77],"numbers":[79],"practice.":[81],"A":[82],"accuracy":[84],"\u00b12\u00b0":[86],"has":[87],"been":[88],"experimentally":[89],"achieved":[90],"VSG-based":[94],"at":[102],"2.4":[103],"GHz":[104],"1-100-kHz":[107],"grid.":[109]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}