{"id":"https://openalex.org/W2044688178","doi":"https://doi.org/10.1109/tim.2014.2317295","title":"On the Crack Characteristic Signal From an Open-Ended Coaxial Probe","display_name":"On the Crack Characteristic Signal From an Open-Ended Coaxial Probe","publication_year":2014,"publication_date":"2014-05-22","ids":{"openalex":"https://openalex.org/W2044688178","doi":"https://doi.org/10.1109/tim.2014.2317295","mag":"2044688178"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2014.2317295","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2014.2317295","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066941650","display_name":"Kristen M. Donnell","orcid":"https://orcid.org/0000-0001-8725-5484"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Kristen M. Donnell","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057912138","display_name":"Andrew McClanahan","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrew McClanahan","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088505165","display_name":"Reza Zoughi","orcid":"https://orcid.org/0000-0001-9421-1551"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Reza Zoughi","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5066941650"],"corresponding_institution_ids":["https://openalex.org/I20382870"],"apc_list":null,"apc_paid":null,"fwci":2.1785,"has_fulltext":false,"cited_by_count":30,"citation_normalized_percentile":{"value":0.86814074,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"63","issue":"7","first_page":"1877","last_page":"1879"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/conductor","display_name":"Conductor","score":0.7909754514694214},{"id":"https://openalex.org/keywords/coaxial","display_name":"Coaxial","score":0.6915048360824585},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.6114256978034973},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.6075719594955444},{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.5914098620414734},{"id":"https://openalex.org/keywords/aerospace","display_name":"Aerospace","score":0.543533205986023},{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.45905646681785583},{"id":"https://openalex.org/keywords/eddy-current-testing","display_name":"Eddy-current testing","score":0.42665329575538635},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.42528003454208374},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3644552230834961},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.306646466255188},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3065779507160187},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.25768351554870605},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1554107666015625},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.15017274022102356},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.07849019765853882}],"concepts":[{"id":"https://openalex.org/C34800285","wikidata":"https://www.wikidata.org/wiki/Q5159395","display_name":"Conductor","level":2,"score":0.7909754514694214},{"id":"https://openalex.org/C51221625","wikidata":"https://www.wikidata.org/wiki/Q1751466","display_name":"Coaxial","level":2,"score":0.6915048360824585},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.6114256978034973},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.6075719594955444},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.5914098620414734},{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.543533205986023},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.45905646681785583},{"id":"https://openalex.org/C6441794","wikidata":"https://www.wikidata.org/wiki/Q1420867","display_name":"Eddy-current testing","level":3,"score":0.42665329575538635},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.42528003454208374},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3644552230834961},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.306646466255188},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3065779507160187},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.25768351554870605},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1554107666015625},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.15017274022102356},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.07849019765853882},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2014.2317295","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2014.2317295","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1065432908","https://openalex.org/W1595965035","https://openalex.org/W1987382434","https://openalex.org/W2025804814","https://openalex.org/W2133668280","https://openalex.org/W2150751743","https://openalex.org/W2155567358","https://openalex.org/W2161668661","https://openalex.org/W2472921269","https://openalex.org/W2476699259","https://openalex.org/W4255320586","https://openalex.org/W4285719527","https://openalex.org/W6635793054","https://openalex.org/W6720792631","https://openalex.org/W6721239629"],"related_works":["https://openalex.org/W2744634501","https://openalex.org/W2085805524","https://openalex.org/W2003522138","https://openalex.org/W4296871629","https://openalex.org/W2333795440","https://openalex.org/W2369672268","https://openalex.org/W1680801918","https://openalex.org/W2102849516","https://openalex.org/W1972402538","https://openalex.org/W4230069654"],"abstract_inverted_index":{"Detection":[0],"of":[1,34,64,84],"surface-breaking":[2],"cracks":[3],"in":[4,10,117],"metals":[5],"is":[6],"an":[7,71],"important":[8],"issue":[9],"many":[11],"industries":[12],"(e.g.,":[13],"transportation,":[14],"aerospace,":[15],"nuclear).":[16],"Commonly,":[17],"eddy":[18],"current":[19],"and":[20,59,123],"ultrasonic":[21],"techniques":[22],"are":[23],"used":[24],"for":[25,104],"this":[26,105],"purpose.":[27],"In":[28],"recent":[29],"years,":[30],"a":[31,50,60,62,76,114,128],"significant":[32],"amount":[33],"work":[35],"has":[36],"also":[37],"been":[38,68],"conducted":[39],"using":[40],"microwave":[41,51],"methods.":[42],"Consequently,":[43],"to":[44,110,113],"better":[45],"understand":[46],"the":[47,80,85,93,101,118],"interaction":[48,126],"between":[49],"probe":[52,119],"(i.e.,":[53],"open-ended":[54,72],"rectangular":[55],"waveguide":[56],"or":[57],"coax)":[58],"crack,":[61],"number":[63],"electromagnetic":[65],"models":[66,90],"have":[67],"developed.":[69],"For":[70],"coaxial":[73],"probe,":[74,86],"when":[75],"crack":[77],"coincides":[78],"with":[79,127],"center":[81,120],"conductor":[82,121],"region":[83],"all":[87],"previously":[88],"developed":[89],"significantly":[91],"underestimate":[92],"results":[94],"obtained":[95],"from":[96],"measurements.":[97],"This":[98],"paper":[99],"examines":[100],"primary":[102],"reason":[103],"discrepancy,":[106],"which":[107],"turns":[108],"out":[109],"be":[111],"due":[112],"geometrical":[115],"perturbation":[116],"geometry":[122],"its":[124],"subsequent":[125],"crack.":[129]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":4},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}