{"id":"https://openalex.org/W1970585877","doi":"https://doi.org/10.1109/tim.2014.2313952","title":"Improved Electrothermal Simulation for Low-Frequency Characterization of a Single-Junction Thermal Converter","display_name":"Improved Electrothermal Simulation for Low-Frequency Characterization of a Single-Junction Thermal Converter","publication_year":2014,"publication_date":"2014-04-10","ids":{"openalex":"https://openalex.org/W1970585877","doi":"https://doi.org/10.1109/tim.2014.2313952","mag":"1970585877"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2014.2313952","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2014.2313952","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024388326","display_name":"Yasutaka Amagai","orcid":"https://orcid.org/0000-0001-6816-8158"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Yasutaka Amagai","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073180314","display_name":"Hiroyuki Fujiki","orcid":"https://orcid.org/0000-0001-6472-6693"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Fujiki","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5024388326"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.04200235,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"63","issue":"12","first_page":"3011","last_page":"3018"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thermocouple","display_name":"Thermocouple","score":0.8164811134338379},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6343221068382263},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.6030358672142029},{"id":"https://openalex.org/keywords/thermal-transfer","display_name":"Thermal transfer","score":0.533099353313446},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.512332558631897},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.5048275589942932},{"id":"https://openalex.org/keywords/heat-transfer","display_name":"Heat transfer","score":0.4869428873062134},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.47484758496284485},{"id":"https://openalex.org/keywords/thermoelectric-effect","display_name":"Thermoelectric effect","score":0.4324350655078888},{"id":"https://openalex.org/keywords/time-constant","display_name":"Time constant","score":0.42028099298477173},{"id":"https://openalex.org/keywords/junction-temperature","display_name":"Junction temperature","score":0.4143759608268738},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40660056471824646},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.34931206703186035},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2693798542022705},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21627619862556458},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.19915658235549927},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18048244714736938},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.0841912031173706}],"concepts":[{"id":"https://openalex.org/C168068576","wikidata":"https://www.wikidata.org/wiki/Q190241","display_name":"Thermocouple","level":2,"score":0.8164811134338379},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6343221068382263},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.6030358672142029},{"id":"https://openalex.org/C2779478220","wikidata":"https://www.wikidata.org/wiki/Q3312622","display_name":"Thermal transfer","level":3,"score":0.533099353313446},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.512332558631897},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.5048275589942932},{"id":"https://openalex.org/C50517652","wikidata":"https://www.wikidata.org/wiki/Q179635","display_name":"Heat transfer","level":2,"score":0.4869428873062134},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.47484758496284485},{"id":"https://openalex.org/C63024428","wikidata":"https://www.wikidata.org/wiki/Q552456","display_name":"Thermoelectric effect","level":2,"score":0.4324350655078888},{"id":"https://openalex.org/C81370116","wikidata":"https://www.wikidata.org/wiki/Q1335249","display_name":"Time constant","level":2,"score":0.42028099298477173},{"id":"https://openalex.org/C167781694","wikidata":"https://www.wikidata.org/wiki/Q6311800","display_name":"Junction temperature","level":3,"score":0.4143759608268738},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40660056471824646},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.34931206703186035},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2693798542022705},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21627619862556458},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.19915658235549927},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18048244714736938},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0841912031173706},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C109693293","wikidata":"https://www.wikidata.org/wiki/Q1496072","display_name":"Inkwell","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2014.2313952","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2014.2313952","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8399999737739563,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W195801994","https://openalex.org/W1978338331","https://openalex.org/W1983432042","https://openalex.org/W1983976661","https://openalex.org/W2048798043","https://openalex.org/W2051678003","https://openalex.org/W2070205567","https://openalex.org/W2078611551","https://openalex.org/W2100359301","https://openalex.org/W2121432520","https://openalex.org/W2132559919","https://openalex.org/W2145879242","https://openalex.org/W2146268052","https://openalex.org/W2149537533","https://openalex.org/W2151094621","https://openalex.org/W2162988893","https://openalex.org/W2163417809","https://openalex.org/W2165410023","https://openalex.org/W2167606261","https://openalex.org/W2173680989","https://openalex.org/W2988859072","https://openalex.org/W3099686640"],"related_works":["https://openalex.org/W2590129836","https://openalex.org/W2529845338","https://openalex.org/W1681038858","https://openalex.org/W2389907258","https://openalex.org/W2009824898","https://openalex.org/W2044140289","https://openalex.org/W45452875","https://openalex.org/W603735358","https://openalex.org/W2796312332","https://openalex.org/W2904426239"],"abstract_inverted_index":{"We":[0],"perform":[1],"a":[2,10,27,152],"numerical":[3],"simulation":[4,105],"for":[5,37,63],"the":[6,57,60,64,82,86,90,95,100,104,107,113,124,134],"low-frequency":[7,24,43],"characterization":[8,25],"of":[9,26,34,53,59,85,99,133],"single-junction":[11],"thermal":[12,28,75],"converter":[13,29],"down":[14],"to":[15,71,94],"1":[16,128],"Hz":[17,32],"using":[18],"an":[19,73],"improved":[20,120],"electrothermal":[21],"model.":[22],"The":[23,130],"below":[30,127],"10":[31],"is":[33,56,139,151],"great":[35],"importance":[36],"linking":[38],"ac-dc":[39,136],"transfer":[40,137],"standards":[41,46],"and":[42],"ac":[44],"voltage":[45],"based":[47],"on":[48],"sampling":[49],"methods.":[50],"One":[51],"feature":[52],"our":[54,119,149],"model":[55,79,121,150],"incorporation":[58],"heat":[61],"capacity":[62],"thermocouple,":[65],"which":[66,116],"has":[67],"previously":[68],"been":[69],"neglected":[70],"reproduce":[72],"accurate":[74],"time":[76],"constant.":[77],"Our":[78],"also":[80],"includes":[81],"temperature":[83],"dependence":[84],"Seebeck":[87],"coefficient":[88],"in":[89,92],"thermocouple":[91],"addition":[93],"temperature-dependent":[96],"material":[97],"parameters":[98],"heater.":[101],"To":[102],"verify":[103],"results,":[106,115],"calculated":[108],"results":[109,146],"are":[110],"compared":[111],"with":[112],"experimental":[114],"shows":[117],"that":[118,148],"well":[122],"reproduces":[123],"measured":[125],"data":[126],"Hz.":[129,144],"estimated":[131],"uncertainty":[132],"simulated":[135],"differences":[138],"49":[140],"\u03bcV/V":[141],"at":[142,156],"4":[143],"These":[145],"suggest":[147],"useful":[153],"predictive":[154],"tool":[155],"low":[157],"frequencies.":[158]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}