{"id":"https://openalex.org/W2009300823","doi":"https://doi.org/10.1109/tim.2014.2313415","title":"A Generalized Rectangular Cavity Approach for Determination of Complex Permittivity of Materials","display_name":"A Generalized Rectangular Cavity Approach for Determination of Complex Permittivity of Materials","publication_year":2014,"publication_date":"2014-04-14","ids":{"openalex":"https://openalex.org/W2009300823","doi":"https://doi.org/10.1109/tim.2014.2313415","mag":"2009300823"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2014.2313415","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2014.2313415","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100656326","display_name":"Abhishek Jha","orcid":"https://orcid.org/0000-0001-9161-0450"},"institutions":[{"id":"https://openalex.org/I94234084","display_name":"Indian Institute of Technology Kanpur","ror":"https://ror.org/05pjsgx75","country_code":"IN","type":"education","lineage":["https://openalex.org/I94234084"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Abhishek Kumar Jha","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology, Kanpur, India","Department of Electrical Engineering, Indian Institute of Technology-Kanpur, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, Kanpur, India","institution_ids":["https://openalex.org/I94234084"]},{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology-Kanpur, India","institution_ids":["https://openalex.org/I94234084"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042578932","display_name":"M. Jaleel Akhtar","orcid":"https://orcid.org/0000-0001-6918-3595"},"institutions":[{"id":"https://openalex.org/I94234084","display_name":"Indian Institute of Technology Kanpur","ror":"https://ror.org/05pjsgx75","country_code":"IN","type":"education","lineage":["https://openalex.org/I94234084"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Mohammad Jaleel Akhtar","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology, Kanpur, India","Department of Electrical Engineering, Indian Institute of Technology-Kanpur, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, Kanpur, India","institution_ids":["https://openalex.org/I94234084"]},{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology-Kanpur, India","institution_ids":["https://openalex.org/I94234084"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100656326"],"corresponding_institution_ids":["https://openalex.org/I94234084"],"apc_list":null,"apc_paid":null,"fwci":5.7416,"has_fulltext":false,"cited_by_count":134,"citation_normalized_percentile":{"value":0.96482641,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"63","issue":"11","first_page":"2632","last_page":"2641"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12155","display_name":"Microwave Dielectric Ceramics Synthesis","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/permittivity","display_name":"Permittivity","score":0.7397355437278748},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.5458990335464478},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.5352210998535156},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4318314790725708},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4268985092639923},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3992225229740143},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3937093913555145},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19228464365005493},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.11368289589881897}],"concepts":[{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.7397355437278748},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.5458990335464478},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.5352210998535156},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4318314790725708},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4268985092639923},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3992225229740143},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3937093913555145},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19228464365005493},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.11368289589881897}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2014.2313415","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2014.2313415","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W258258802","https://openalex.org/W1489096603","https://openalex.org/W1978228265","https://openalex.org/W1991159378","https://openalex.org/W2008586937","https://openalex.org/W2019466808","https://openalex.org/W2023081558","https://openalex.org/W2031283893","https://openalex.org/W2034944253","https://openalex.org/W2057929876","https://openalex.org/W2071467620","https://openalex.org/W2095948265","https://openalex.org/W2096183784","https://openalex.org/W2106719123","https://openalex.org/W2114498483","https://openalex.org/W2122749531","https://openalex.org/W2149666187","https://openalex.org/W2159290301","https://openalex.org/W2161379396","https://openalex.org/W2188044751","https://openalex.org/W2324971177","https://openalex.org/W4205614673","https://openalex.org/W4247381894","https://openalex.org/W4253687614","https://openalex.org/W4285719527","https://openalex.org/W6609599397"],"related_works":["https://openalex.org/W2018139810","https://openalex.org/W2165585480","https://openalex.org/W4321376593","https://openalex.org/W2006415218","https://openalex.org/W2001603662","https://openalex.org/W2034633965","https://openalex.org/W4390291482","https://openalex.org/W2150185389","https://openalex.org/W2368086687","https://openalex.org/W2139466730"],"abstract_inverted_index":{"A":[0,194],"novel":[1],"cavity-based":[2],"unified":[3,176],"approach":[4,76,177],"to":[5,31,165],"measure":[6],"the":[7,15,47,53,60,64,74,83,88,94,98,109,118,127,131,138,141,144,151,156,162,167,170,191,203,218,223,228],"complex":[8],"permittivity":[9,149,220],"of":[10,17,34,55,73,87,108,120,150,169,196,205,234,240],"dielectric":[11,106,198],"samples":[12,199,239],"placed":[13],"in":[14,112,190,227],"E-plane":[16],"a":[18,78,121,206,211,231],"rectangular":[19,183],"cavity":[20,26,49,61,90],"is":[21,28,91,159,178,215],"presented.":[22],"The":[23,43,70,105,148,174],"proposed":[24,75,175],"generalized":[25],"method":[27],"not":[29],"limited":[30],"test":[32,65,110,152],"specimens":[33],"smaller":[35],"electrical":[36],"dimensions,":[37],"and":[38,63,136,143,210,222],"requires":[39],"two":[40,182],"basic":[41],"steps.":[42],"first":[44,157],"step":[45,72,158],"modifies":[46],"conventional":[48],"perturbation":[50],"technique,":[51],"where":[52,82],"effects":[54],"possible":[56],"air":[57],"gap":[58],"between":[59,140,217],"slot":[62,187],"specimen":[66,111,153],"are":[67,115,200],"also":[68],"considered.":[69],"second":[71],"employs":[77],"numerical":[79,95,171],"optimization":[80,123,172],"scheme,":[81],"actual":[84],"3-D":[85],"geometry":[86],"fabricated":[89],"simulated":[92,145],"using":[93,155],"field":[96],"simulator,":[97],"Computer":[99],"Simulation":[100],"Technology":[101],"(CST)":[102],"Microwave":[103],"Studio.":[104],"properties":[107],"this":[113],"case":[114],"determined":[116,154],"with":[117,202],"help":[119,204],"MATLAB-based":[122],"routine,":[124],"which":[125],"calls":[126],"CST":[128],"modules":[129],"over":[130],"component":[132],"object":[133],"model":[134],"interface":[135],"minimizes":[137],"error":[139,233],"measured":[142,201,219],"scattering":[146],"coefficients.":[147],"provided":[160],"as":[161],"initial":[163],"guess":[164],"improve":[166],"convergence":[168],"scheme.":[173],"validated":[179],"by":[180],"designing":[181],"cavities":[184],"having":[185,230],"different":[186],"sizes":[188],"operating":[189],"TE107":[192],"mode.":[193],"number":[195],"standard":[197],"vector":[207],"network":[208],"analyzer,":[209],"very":[212],"good":[213],"agreement":[214],"observed":[216],"values":[221],"published":[224],"data":[225],"available":[226],"literature":[229],"typical":[232],"less":[235],"than":[236],"2%":[237],"for":[238],"even":[241],"larger":[242],"dimensions.":[243]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":9},{"year":2023,"cited_by_count":20},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":23},{"year":2020,"cited_by_count":12},{"year":2019,"cited_by_count":12},{"year":2018,"cited_by_count":11},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":9},{"year":2015,"cited_by_count":11},{"year":2014,"cited_by_count":3}],"updated_date":"2026-03-18T14:38:29.013473","created_date":"2025-10-10T00:00:00"}