{"id":"https://openalex.org/W2045213918","doi":"https://doi.org/10.1109/tim.2013.2277618","title":"Fast S-Transform for Time-Varying Voltage Flicker Analysis","display_name":"Fast S-Transform for Time-Varying Voltage Flicker Analysis","publication_year":2013,"publication_date":"2013-08-21","ids":{"openalex":"https://openalex.org/W2045213918","doi":"https://doi.org/10.1109/tim.2013.2277618","mag":"2045213918"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2013.2277618","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2277618","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000148796","display_name":"Wenxuan Yao","orcid":"https://orcid.org/0000-0002-5011-2196"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenxuan Yao","raw_affiliation_strings":["Hunan University, College of Electrical and Information Engineering, Changsha, China","Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, , China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan University, College of Electrical and Information Engineering, Changsha, China","institution_ids":["https://openalex.org/I16609230"]},{"raw_affiliation_string":"Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, , China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030526515","display_name":"Qiu Tang","orcid":"https://orcid.org/0000-0001-9935-712X"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiu Tang","raw_affiliation_strings":["Hunan University, College of Electrical and Information Engineering, Changsha, China","Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, , China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan University, College of Electrical and Information Engineering, Changsha, China","institution_ids":["https://openalex.org/I16609230"]},{"raw_affiliation_string":"Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, , China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053930549","display_name":"Zhaosheng Teng","orcid":"https://orcid.org/0000-0001-8293-9086"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaosheng Teng","raw_affiliation_strings":["Hunan University, College of Electrical and Information Engineering, Changsha, China","Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, , China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan University, College of Electrical and Information Engineering, Changsha, China","institution_ids":["https://openalex.org/I16609230"]},{"raw_affiliation_string":"Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, , China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076911490","display_name":"Yunpeng Gao","orcid":"https://orcid.org/0000-0001-9932-5822"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunpeng Gao","raw_affiliation_strings":["Hunan University, College of Electrical and Information Engineering, Changsha, China","Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, , China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan University, College of Electrical and Information Engineering, Changsha, China","institution_ids":["https://openalex.org/I16609230"]},{"raw_affiliation_string":"Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, , China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100682305","display_name":"He Wen","orcid":"https://orcid.org/0000-0001-8024-1899"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"He Wen","raw_affiliation_strings":["Hunan University, College of Electrical and Information Engineering, Changsha, China","Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, , China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan University, College of Electrical and Information Engineering, Changsha, China","institution_ids":["https://openalex.org/I16609230"]},{"raw_affiliation_string":"Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, , China","institution_ids":["https://openalex.org/I16609230"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9602,"has_fulltext":false,"cited_by_count":39,"citation_normalized_percentile":{"value":0.78810543,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"63","issue":"1","first_page":"72","last_page":"79"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flicker","display_name":"Flicker","score":0.8638665676116943},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.5953572392463684},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.5852939486503601},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5633770227432251},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.530647873878479},{"id":"https://openalex.org/keywords/time\u2013frequency-analysis","display_name":"Time\u2013frequency analysis","score":0.5096220970153809},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4901624619960785},{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.426835298538208},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4160591959953308},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3666360378265381},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3261955678462982},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19475114345550537},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.10621914267539978},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.08388546109199524}],"concepts":[{"id":"https://openalex.org/C19743564","wikidata":"https://www.wikidata.org/wiki/Q25378119","display_name":"Flicker","level":2,"score":0.8638665676116943},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.5953572392463684},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.5852939486503601},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5633770227432251},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.530647873878479},{"id":"https://openalex.org/C142433447","wikidata":"https://www.wikidata.org/wiki/Q7806653","display_name":"Time\u2013frequency analysis","level":3,"score":0.5096220970153809},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4901624619960785},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.426835298538208},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4160591959953308},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3666360378265381},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3261955678462982},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19475114345550537},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.10621914267539978},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.08388546109199524},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2013.2277618","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2277618","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8700000047683716,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1977066927","https://openalex.org/W1986754283","https://openalex.org/W2023609935","https://openalex.org/W2025117380","https://openalex.org/W2045691758","https://openalex.org/W2052061826","https://openalex.org/W2061100755","https://openalex.org/W2065056494","https://openalex.org/W2078959178","https://openalex.org/W2088164280","https://openalex.org/W2088974521","https://openalex.org/W2098865395","https://openalex.org/W2098949509","https://openalex.org/W2100218807","https://openalex.org/W2113236514","https://openalex.org/W2114794982","https://openalex.org/W2115702193","https://openalex.org/W2116812861","https://openalex.org/W2117650193","https://openalex.org/W2123133018","https://openalex.org/W2136567725","https://openalex.org/W2137320913","https://openalex.org/W2138280758","https://openalex.org/W2145895464","https://openalex.org/W2147205936","https://openalex.org/W2148251748","https://openalex.org/W2150890277","https://openalex.org/W2159860553","https://openalex.org/W2165267347","https://openalex.org/W2179315331"],"related_works":["https://openalex.org/W2024367938","https://openalex.org/W2782295999","https://openalex.org/W2162306796","https://openalex.org/W1970292246","https://openalex.org/W1947057263","https://openalex.org/W2016162169","https://openalex.org/W4247952185","https://openalex.org/W1642462315","https://openalex.org/W2015118744","https://openalex.org/W2355447608"],"abstract_inverted_index":{"Voltage":[0],"flicker":[1,32,38,45,80],"analysis":[2,104],"is":[3,22,25,47,66,125],"one":[4],"of":[5,9,78,105,109,138],"the":[6,29,43,63,71,74,93,102,110,114,134,139],"elementary":[7],"tools":[8],"power":[10,14],"quality":[11],"assessment":[12],"in":[13,33,60,113],"systems.":[15],"A":[16,36],"new":[17],"algorithm,":[18],"fast":[19],"S-transform":[20],"(FST)":[21],"proposed":[23,83,111,140],"and":[24,73,119,130,136],"used":[26,67],"to":[27,62,68],"analyze":[28],"time-varying":[30],"voltage":[31,37,123],"this":[34],"paper.":[35],"waveform":[39],"envelope,":[40],"which":[41],"captures":[42],"main":[44],"characteristic,":[46],"obtained":[48],"by":[49],"Teager-Kaiser":[50],"energy":[51],"operator":[52],"instantaneously.":[53],"FST":[54,65],"achieves":[55],"much":[56],"lower":[57],"computational":[58],"complexity":[59],"comparison":[61],"S-transform.":[64],"extract":[69],"both":[70],"time":[72],"frequency":[75],"domain":[76],"information":[77],"each":[79],"component.":[81],"The":[82,107,128],"algorithm":[84,112],"can":[85],"be":[86],"easily":[87],"implemented":[88],"with":[89],"hardware":[90],"multipliers,":[91],"making":[92],"method":[94],"a":[95],"good":[96],"choice":[97],"for":[98,101],"real-time":[99],"applications":[100],"time-frequency":[103],"flicker.":[106],"implementation":[108],"dual-core":[115],"processor-digital":[116],"signal":[117],"processor":[118],"advanced":[120],"RISC":[121],"machines-based":[122],"flickermeter":[124],"also":[126],"introduced.":[127],"simulation":[129],"application":[131],"results":[132],"validate":[133],"accuracy":[135],"efficiency":[137],"algorithm.":[141]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}