{"id":"https://openalex.org/W2089907070","doi":"https://doi.org/10.1109/tim.2013.2263675","title":"A Simple Synchrophasor Estimation Algorithm Considering IEEE Standard C37.118.1-2011 and Protection Requirements","display_name":"A Simple Synchrophasor Estimation Algorithm Considering IEEE Standard C37.118.1-2011 and Protection Requirements","publication_year":2013,"publication_date":"2013-06-26","ids":{"openalex":"https://openalex.org/W2089907070","doi":"https://doi.org/10.1109/tim.2013.2263675","mag":"2089907070"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2013.2263675","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2263675","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011488073","display_name":"Sarasij Das","orcid":"https://orcid.org/0000-0002-6724-0979"},"institutions":[{"id":"https://openalex.org/I125749732","display_name":"Western University","ror":"https://ror.org/02grkyz14","country_code":"CA","type":"education","lineage":["https://openalex.org/I125749732"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Sarasij Das","raw_affiliation_strings":["University of Western Ontario, London, ONT, Canada","University of Western Ontario , London (ON) , Canada"],"affiliations":[{"raw_affiliation_string":"University of Western Ontario, London, ONT, Canada","institution_ids":["https://openalex.org/I125749732"]},{"raw_affiliation_string":"University of Western Ontario , London (ON) , Canada","institution_ids":["https://openalex.org/I125749732"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060061883","display_name":"T.S. Sidhu","orcid":"https://orcid.org/0000-0001-7812-5303"},"institutions":[{"id":"https://openalex.org/I39470171","display_name":"University of Ontario Institute of Technology","ror":"https://ror.org/016zre027","country_code":"CA","type":"education","lineage":["https://openalex.org/I39470171"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Tarlochan Sidhu","raw_affiliation_strings":["Faculty of Engineering and Applied Science, University of Ontario Institute of Technology, Oshawa, ONT, Canada","Fac. of Eng. & Appl. Sci., Univ. of Ontario Inst. of Technol., Oshawa, ON, Canada"],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering and Applied Science, University of Ontario Institute of Technology, Oshawa, ONT, Canada","institution_ids":["https://openalex.org/I39470171"]},{"raw_affiliation_string":"Fac. of Eng. & Appl. Sci., Univ. of Ontario Inst. of Technol., Oshawa, ON, Canada","institution_ids":["https://openalex.org/I39470171"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5011488073"],"corresponding_institution_ids":["https://openalex.org/I125749732"],"apc_list":null,"apc_paid":null,"fwci":3.6037,"has_fulltext":false,"cited_by_count":49,"citation_normalized_percentile":{"value":0.93457219,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"62","issue":"10","first_page":"2704","last_page":"2715"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10305","display_name":"Power System Optimization and Stability","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10305","display_name":"Power System Optimization and Stability","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phasor","display_name":"Phasor","score":0.9644260406494141},{"id":"https://openalex.org/keywords/overshoot","display_name":"Overshoot (microwave communication)","score":0.64849853515625},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.6085143089294434},{"id":"https://openalex.org/keywords/power-system-protection","display_name":"Power-system protection","score":0.5258023142814636},{"id":"https://openalex.org/keywords/simple","display_name":"Simple (philosophy)","score":0.5037075877189636},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.45570170879364014},{"id":"https://openalex.org/keywords/units-of-measurement","display_name":"Units of measurement","score":0.4554330110549927},{"id":"https://openalex.org/keywords/smart-grid","display_name":"Smart grid","score":0.4494572877883911},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4445621967315674},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.38577863574028015},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.37294334173202515},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3499029874801636},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.32961970567703247},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18102622032165527}],"concepts":[{"id":"https://openalex.org/C176605952","wikidata":"https://www.wikidata.org/wiki/Q827674","display_name":"Phasor","level":4,"score":0.9644260406494141},{"id":"https://openalex.org/C2780323453","wikidata":"https://www.wikidata.org/wiki/Q7113957","display_name":"Overshoot (microwave communication)","level":2,"score":0.64849853515625},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.6085143089294434},{"id":"https://openalex.org/C38361682","wikidata":"https://www.wikidata.org/wiki/Q1756067","display_name":"Power-system protection","level":4,"score":0.5258023142814636},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.5037075877189636},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.45570170879364014},{"id":"https://openalex.org/C151233233","wikidata":"https://www.wikidata.org/wiki/Q47574","display_name":"Units of measurement","level":2,"score":0.4554330110549927},{"id":"https://openalex.org/C10558101","wikidata":"https://www.wikidata.org/wiki/Q689855","display_name":"Smart grid","level":2,"score":0.4494572877883911},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4445621967315674},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.38577863574028015},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.37294334173202515},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3499029874801636},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.32961970567703247},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18102622032165527},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2013.2263675","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2263675","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4699999988079071,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W208605634","https://openalex.org/W1539653475","https://openalex.org/W1583396463","https://openalex.org/W1795763706","https://openalex.org/W1972358508","https://openalex.org/W2001271659","https://openalex.org/W2082835930","https://openalex.org/W2099383227","https://openalex.org/W2100464720","https://openalex.org/W2102370178","https://openalex.org/W2103507343","https://openalex.org/W2105817167","https://openalex.org/W2106609598","https://openalex.org/W2109708000","https://openalex.org/W2119047501","https://openalex.org/W2127723003","https://openalex.org/W2137756662","https://openalex.org/W2139755757","https://openalex.org/W2152807154","https://openalex.org/W2161228828","https://openalex.org/W2162701178","https://openalex.org/W2167780868","https://openalex.org/W2170173961","https://openalex.org/W2538649447","https://openalex.org/W3141140486","https://openalex.org/W4241473042"],"related_works":["https://openalex.org/W2182509182","https://openalex.org/W2125787228","https://openalex.org/W2138143921","https://openalex.org/W2102647849","https://openalex.org/W1923806246","https://openalex.org/W2547260311","https://openalex.org/W2166008706","https://openalex.org/W4244071503","https://openalex.org/W2102650188","https://openalex.org/W2582236778"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3],"simple":[4],"synchrophasor":[5,27],"estimation":[6,123],"algorithm":[7],"has":[8,125],"been":[9,127],"proposed":[10,44,100],"considering":[11],"power":[12],"system":[13,105],"steady":[14,49],"state,":[15],"dynamic":[16,31,52],"conditions,":[17],"and":[18,51,85],"protection":[19,74,113],"requirements.":[20],"The":[21],"new":[22,56],"IEEE":[23,57],"Standard":[24],"C37.118.1-2011":[25],"for":[26,34,64,73,89,112],"measurements":[28],"includes":[29],"the":[30,35,43,48,55,99,120],"performance":[32,117],"requirements":[33,53],"phasor":[36,122],"measurement":[37],"units.":[38],"It":[39,95],"is":[40,96,108],"shown":[41,97],"that":[42,98],"method":[45,101],"satisfies":[46],"all":[47],"state":[50],"of":[54],"Standard.":[58],"Presently,":[59],"synchrophasors":[60,69],"are":[61,70],"mainly":[62],"used":[63],"wide":[65],"area":[66],"monitoring.":[67],"Increasingly,":[68],"being":[71],"considered":[72],"applications":[75,80],"in":[76],"smart":[77],"grids.":[78],"Protection":[79],"require":[81],"shorter":[82],"response":[83],"times":[84],"lower":[86],"overshoot/undershoot":[87],"values":[88],"estimated":[90],"phasors":[91],"during":[92,104],"large":[93],"disturbances.":[94],"performs":[102],"satisfactorily":[103],"faults,":[106],"which":[107],"an":[109],"important":[110],"requirement":[111],"applications.":[114],"A":[115],"detailed":[116],"comparison":[118],"with":[119],"existing":[121],"algorithms":[124],"also":[126],"presented.":[128]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":5}],"updated_date":"2026-03-12T08:34:05.389933","created_date":"2025-10-10T00:00:00"}