{"id":"https://openalex.org/W1984777011","doi":"https://doi.org/10.1109/tim.2013.2259751","title":"Integrated System for Monitoring and Control of the National Time and Frequency Standard","display_name":"Integrated System for Monitoring and Control of the National Time and Frequency Standard","publication_year":2013,"publication_date":"2013-05-27","ids":{"openalex":"https://openalex.org/W1984777011","doi":"https://doi.org/10.1109/tim.2013.2259751","mag":"1984777011"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2013.2259751","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2259751","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058672349","display_name":"Janusz Kaczmarek","orcid":"https://orcid.org/0000-0003-1511-6287"},"institutions":[{"id":"https://openalex.org/I46305939","display_name":"University of Zielona G\u00f3ra","ror":"https://ror.org/04fzm7v55","country_code":"PL","type":"education","lineage":["https://openalex.org/I46305939"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Janusz Kaczmarek","raw_affiliation_strings":["Institute of Electrical Metrology, University of Zielona G\u00f3ra, Zielona Gora, Poland","Inst. of Electr. Metrol., Univ. of Zielona Gora, Gora, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electrical Metrology, University of Zielona G\u00f3ra, Zielona Gora, Poland","institution_ids":["https://openalex.org/I46305939"]},{"raw_affiliation_string":"Inst. of Electr. Metrol., Univ. of Zielona Gora, Gora, Poland","institution_ids":["https://openalex.org/I46305939"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042358383","display_name":"W. Miczulski","orcid":"https://orcid.org/0000-0002-8175-0078"},"institutions":[{"id":"https://openalex.org/I46305939","display_name":"University of Zielona G\u00f3ra","ror":"https://ror.org/04fzm7v55","country_code":"PL","type":"education","lineage":["https://openalex.org/I46305939"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Wieslaw Miczulski","raw_affiliation_strings":["Institute of Electrical Metrology, University of Zielona G\u00f3ra, Zielona Gora, Poland","Inst. of Electr. Metrol., Univ. of Zielona Gora, Gora, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electrical Metrology, University of Zielona G\u00f3ra, Zielona Gora, Poland","institution_ids":["https://openalex.org/I46305939"]},{"raw_affiliation_string":"Inst. of Electr. Metrol., Univ. of Zielona Gora, Gora, Poland","institution_ids":["https://openalex.org/I46305939"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048118568","display_name":"Miros\u0142aw Kozio\u0142","orcid":"https://orcid.org/0000-0001-5039-2004"},"institutions":[{"id":"https://openalex.org/I46305939","display_name":"University of Zielona G\u00f3ra","ror":"https://ror.org/04fzm7v55","country_code":"PL","type":"education","lineage":["https://openalex.org/I46305939"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Miroslaw Koziol","raw_affiliation_strings":["Inst. of Electr. Metrol., Univ. of Zielona Gora, Gora, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Inst. of Electr. Metrol., Univ. of Zielona Gora, Gora, Poland","institution_ids":["https://openalex.org/I46305939"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068761242","display_name":"A. Czubla","orcid":"https://orcid.org/0000-0003-4629-6639"},"institutions":[{"id":"https://openalex.org/I4210142792","display_name":"Central Office of Measures","ror":"https://ror.org/039f8sh24","country_code":"PL","type":"government","lineage":["https://openalex.org/I4210142792"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Albin Czubla","raw_affiliation_strings":["Laboratory of Time and Frequency, Electricity Department, Central Office of Measures, Warsaw, Poland","Electr. Dept., Central Office of Measures, Warsaw, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Time and Frequency, Electricity Department, Central Office of Measures, Warsaw, Poland","institution_ids":["https://openalex.org/I4210142792"]},{"raw_affiliation_string":"Electr. Dept., Central Office of Measures, Warsaw, Poland","institution_ids":["https://openalex.org/I4210142792"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3263,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.79795357,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"62","issue":"10","first_page":"2828","last_page":"2838"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12004","display_name":"Advanced Frequency and Time Standards","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12004","display_name":"Advanced Frequency and Time Standards","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9771000146865845,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.7525743246078491},{"id":"https://openalex.org/keywords/atomic-clock","display_name":"Atomic clock","score":0.667283833026886},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.6564317941665649},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6317784786224365},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.618744432926178},{"id":"https://openalex.org/keywords/realization","display_name":"Realization (probability)","score":0.59188312292099},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.49127691984176636},{"id":"https://openalex.org/keywords/frequency-standard","display_name":"Frequency standard","score":0.4582594335079193},{"id":"https://openalex.org/keywords/automatic-frequency-control","display_name":"Automatic frequency control","score":0.4451368451118469},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.43455901741981506},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4142829179763794},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.3775731921195984},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.376497745513916},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.3548942804336548},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.34930121898651123},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.13621217012405396},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11890062689781189}],"concepts":[{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.7525743246078491},{"id":"https://openalex.org/C196597080","wikidata":"https://www.wikidata.org/wiki/Q227467","display_name":"Atomic clock","level":2,"score":0.667283833026886},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.6564317941665649},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6317784786224365},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.618744432926178},{"id":"https://openalex.org/C2781089630","wikidata":"https://www.wikidata.org/wiki/Q21856745","display_name":"Realization (probability)","level":2,"score":0.59188312292099},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.49127691984176636},{"id":"https://openalex.org/C131221115","wikidata":"https://www.wikidata.org/wiki/Q362396","display_name":"Frequency standard","level":2,"score":0.4582594335079193},{"id":"https://openalex.org/C25915539","wikidata":"https://www.wikidata.org/wiki/Q220786","display_name":"Automatic frequency control","level":2,"score":0.4451368451118469},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.43455901741981506},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4142829179763794},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.3775731921195984},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.376497745513916},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.3548942804336548},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34930121898651123},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.13621217012405396},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11890062689781189},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2013.2259751","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2259751","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/17","display_name":"Partnerships for the goals","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W13790537","https://openalex.org/W187697205","https://openalex.org/W261720488","https://openalex.org/W343917741","https://openalex.org/W1483426796","https://openalex.org/W1490488263","https://openalex.org/W1977860103","https://openalex.org/W2015507318","https://openalex.org/W2036428591","https://openalex.org/W2066506161","https://openalex.org/W2099082889","https://openalex.org/W2100846830","https://openalex.org/W2101227453","https://openalex.org/W2107633943","https://openalex.org/W2110710585","https://openalex.org/W2122299057","https://openalex.org/W2134462166","https://openalex.org/W2156512812","https://openalex.org/W2160745468","https://openalex.org/W2169762568","https://openalex.org/W2538265676","https://openalex.org/W2731048996","https://openalex.org/W4246797778","https://openalex.org/W4248510537","https://openalex.org/W4285719527","https://openalex.org/W4388297464","https://openalex.org/W6600537125","https://openalex.org/W6607669828","https://openalex.org/W6609705352","https://openalex.org/W6611719806","https://openalex.org/W6628916124","https://openalex.org/W6672618952"],"related_works":["https://openalex.org/W1945428211","https://openalex.org/W4255244685","https://openalex.org/W1969851202","https://openalex.org/W2080045028","https://openalex.org/W2568099659","https://openalex.org/W3195555701","https://openalex.org/W2178439540","https://openalex.org/W1642170474","https://openalex.org/W2362473452","https://openalex.org/W2950992837"],"abstract_inverted_index":{"In":[0,43,149],"Poland,":[1],"the":[2,21,24,37,47,52,58,68,88,105,110,126,152,159,168,181],"national":[3],"time":[4,26,41],"and":[5,29,35,40,76,81,99,107,129,156,177],"frequency":[6,184],"standard":[7,182],"(NTFS)":[8],"is":[9,161],"realized":[10],"by":[11],"means":[12],"of":[13,23,50,54,60,71,91,109,113,119,125,132,154,158,170],"three":[14],"caesium":[15],"atomic":[16,38,127],"clocks,":[17],"a":[18,137],"system":[19,85],"for":[20,32,143,172,175],"generation":[22],"Polish":[25],"scale":[27],"UTC(PL),":[28],"measuring":[30,93],"systems":[31,94],"comparing":[33],"directly":[34],"indirectly":[36],"clocks":[39,128],"scale.":[42],"order":[44],"to":[45,140,163],"ensure":[46],"best":[48],"realization":[49],"NTFS,":[51],"Institute":[53],"Electrical":[55],"Metrology":[56],"at":[57,97],"University":[59],"Zielona":[61],"G\u00f3ra":[62],"(IME":[63],"UZ),":[64],"in":[65,179,192],"cooperation":[66],"with":[67],"Central":[69],"Office":[70],"Measures":[72],"(GUM),":[73],"has":[74],"developed":[75],"built":[77],"an":[78],"integrated":[79],"monitoring":[80],"control":[82],"system.":[83],"This":[84],"significantly":[86],"increases":[87],"functional":[89],"capabilities":[90],"autonomous":[92],"used":[95],"previously":[96],"GUM":[98],"adds":[100],"new":[101,138],"features":[102,115],"that":[103],"increase":[104],"reliability":[106],"safety":[108],"NTFS.":[111],"Examples":[112],"such":[114],"are:":[116],"automatic":[117],"detection":[118],"invalid":[120],"operating":[121],"conditions":[122],"(including":[123],"breakdowns)":[124],"remote":[130],"notification":[131],"alarms,":[133],"as":[134,136],"well":[135],"approach":[139],"predicting":[141,173],"corrections":[142,174],"UTC(PL)":[144,176],"using":[145],"neural":[146],"networks":[147],"(NNs).":[148],"this":[150],"paper,":[151],"presentation":[153],"hardware":[155],"software":[157],"NTFS":[160],"limited":[162],"their":[164],"general":[165],"features.":[166],"However,":[167],"application":[169],"NNs":[171],"automation":[178],"determining":[180],"radio":[183],"deviation":[185],"from":[186],"its":[187],"nominal":[188],"value":[189],"are":[190],"presented":[191],"more":[193],"detail.":[194]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}