{"id":"https://openalex.org/W1781422893","doi":"https://doi.org/10.1109/tim.2013.2253973","title":"Characterization of 100-$\\Omega$ Metal Foil Standard Resistors","display_name":"Characterization of 100-$\\Omega$ Metal Foil Standard Resistors","publication_year":2013,"publication_date":"2013-05-03","ids":{"openalex":"https://openalex.org/W1781422893","doi":"https://doi.org/10.1109/tim.2013.2253973","mag":"1781422893"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2013.2253973","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2253973","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041117747","display_name":"Atsushi Domae","orcid":"https://orcid.org/0000-0002-3582-1373"},"institutions":[{"id":"https://openalex.org/I165522056","display_name":"Tokyo Denki University","ror":"https://ror.org/01pa62v70","country_code":"JP","type":"education","lineage":["https://openalex.org/I165522056"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Atsushi Domae","raw_affiliation_strings":["Graduate School of Engineering, Tokyo Denki University, Tokyo, Japan","National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Tokyo Denki University, Tokyo, Japan","institution_ids":["https://openalex.org/I165522056"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052274255","display_name":"Takehiko Oe","orcid":"https://orcid.org/0000-0003-3424-1745"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takehiko Oe","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091535307","display_name":"Masaya Kumagai","orcid":"https://orcid.org/0000-0003-4766-8625"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Masaya Kumagai","raw_affiliation_strings":["Alpha Electronics Corporation, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Alpha Electronics Corporation, Tokyo, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034708827","display_name":"Matsuo Zama","orcid":"https://orcid.org/0000-0002-6189-1746"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Matsuo Zama","raw_affiliation_strings":["Alpha Electronics Corporation, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Alpha Electronics Corporation, Tokyo, Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089866154","display_name":"Nobu\u2010Hisa Kaneko","orcid":"https://orcid.org/0000-0003-3857-7940"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobu-hisa Kaneko","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5041117747"],"corresponding_institution_ids":["https://openalex.org/I165522056","https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":0.8816,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.72847021,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"62","issue":"6","first_page":"1776","last_page":"1782"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10382","display_name":"Quantum and electron transport phenomena","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.9249410629272461},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6497092843055725},{"id":"https://openalex.org/keywords/omega","display_name":"Omega","score":0.6438724398612976},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.6245775818824768},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5064171552658081},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.48773011565208435},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.47596853971481323},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.463750422000885},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.44862088561058044},{"id":"https://openalex.org/keywords/foil-method","display_name":"FOIL method","score":0.442663311958313},{"id":"https://openalex.org/keywords/phase-angle","display_name":"Phase angle (astronomy)","score":0.44124481081962585},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.30055832862854004},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24747201800346375},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.23759806156158447},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16261699795722961}],"concepts":[{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.9249410629272461},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6497092843055725},{"id":"https://openalex.org/C2779557605","wikidata":"https://www.wikidata.org/wiki/Q9890","display_name":"Omega","level":2,"score":0.6438724398612976},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.6245775818824768},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5064171552658081},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.48773011565208435},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.47596853971481323},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.463750422000885},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.44862088561058044},{"id":"https://openalex.org/C7363328","wikidata":"https://www.wikidata.org/wiki/Q5426847","display_name":"FOIL method","level":2,"score":0.442663311958313},{"id":"https://openalex.org/C170222088","wikidata":"https://www.wikidata.org/wiki/Q2059855","display_name":"Phase angle (astronomy)","level":2,"score":0.44124481081962585},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.30055832862854004},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24747201800346375},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.23759806156158447},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16261699795722961},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2013.2253973","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2253973","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320311508","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1601105001","https://openalex.org/W1964550101","https://openalex.org/W1972561780","https://openalex.org/W1978515977","https://openalex.org/W1991212066","https://openalex.org/W2017642372","https://openalex.org/W2017724148","https://openalex.org/W2062805954","https://openalex.org/W2066475491","https://openalex.org/W2091747029","https://openalex.org/W2096203650","https://openalex.org/W2118864369","https://openalex.org/W2140816342","https://openalex.org/W2170928511","https://openalex.org/W2310596054","https://openalex.org/W4238953532","https://openalex.org/W6698483354"],"related_works":["https://openalex.org/W3200817179","https://openalex.org/W1960166976","https://openalex.org/W2380067098","https://openalex.org/W1992708211","https://openalex.org/W1548152478","https://openalex.org/W238609530","https://openalex.org/W2137172615","https://openalex.org/W2902194312","https://openalex.org/W1513895807","https://openalex.org/W1978046530"],"abstract_inverted_index":{"Aiming":[0],"to":[1,99],"produce":[2],"devices":[3],"for":[4,14],"use":[5],"in":[6,17],"high-precision":[7],"measurements":[8],"(e.g.,":[9],"as":[10],"a":[11,26,50,81],"working":[12],"standard":[13,23],"calibration":[15],"work":[16],"National":[18],"Meteorology":[19],"Institutes),":[20],"we":[21],"develop":[22],"resistors":[24],"with":[25],"four-terminal-pair":[27],"design":[28],"using":[29],"high-stability":[30],"100-\u03a9":[31],"metal-foil":[32],"resistor":[33,96],"components.":[34],"The":[35],"current":[36,51,56],"and":[37,43,64],"frequency":[38,66,82],"dependence":[39,57,67],"of":[40,52,74,83,94],"the":[41,61,69,87,91,95],"resistance":[42],"phase":[44],"angle":[45],"have":[46],"been":[47],"characterized.":[48],"Below":[49],"5":[53],"mA,":[54],"no":[55,65],"is":[58,78,97],"found":[59,79],"within":[60,68],"uncertainty":[62,72],"range,":[63],"expanded":[70],"measurement":[71,89],"range":[73],"around":[75],"2.5":[76],"\u03bc\u03a9/\u03a9":[77],"below":[80],"2":[84],"kHz.":[85],"From":[86],"phase-angle":[88],"results,":[90],"time":[92],"constant":[93],"estimated":[98],"be":[100],"less":[101],"than":[102],"3.7":[103],"ns.":[104]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}