{"id":"https://openalex.org/W2141822875","doi":"https://doi.org/10.1109/tim.2013.2246912","title":"A Novel Electrical Resistance Tomography System Based on ${\\rm{C}}^{4}{\\rm D}$ Technique","display_name":"A Novel Electrical Resistance Tomography System Based on ${\\rm{C}}^{4}{\\rm D}$ Technique","publication_year":2013,"publication_date":"2013-03-11","ids":{"openalex":"https://openalex.org/W2141822875","doi":"https://doi.org/10.1109/tim.2013.2246912","mag":"2141822875"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2013.2246912","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2246912","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072259811","display_name":"Baoliang Wang","orcid":"https://orcid.org/0000-0002-0045-0576"},"institutions":[{"id":"https://openalex.org/I4391767838","display_name":"State Key Laboratory of Industrial Control Technology","ror":"https://ror.org/03a33a786","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391767838","https://openalex.org/I76130692"]},{"id":"https://openalex.org/I55712492","display_name":"Zhejiang University of Technology","ror":"https://ror.org/02djqfd08","country_code":"CN","type":"education","lineage":["https://openalex.org/I55712492"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Baoliang Wang","raw_affiliation_strings":["State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University , Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4391767838"]},{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University , Hangzhou, China","institution_ids":["https://openalex.org/I55712492","https://openalex.org/I4391767838"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058072230","display_name":"Yuanyuan Hu","orcid":"https://orcid.org/0000-0001-8511-1401"},"institutions":[{"id":"https://openalex.org/I55712492","display_name":"Zhejiang University of Technology","ror":"https://ror.org/02djqfd08","country_code":"CN","type":"education","lineage":["https://openalex.org/I55712492"]},{"id":"https://openalex.org/I4391767838","display_name":"State Key Laboratory of Industrial Control Technology","ror":"https://ror.org/03a33a786","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391767838","https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanyuan Hu","raw_affiliation_strings":["State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University , Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4391767838"]},{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University , Hangzhou, China","institution_ids":["https://openalex.org/I55712492","https://openalex.org/I4391767838"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001621646","display_name":"Haifeng Ji","orcid":"https://orcid.org/0000-0002-5518-7912"},"institutions":[{"id":"https://openalex.org/I55712492","display_name":"Zhejiang University of Technology","ror":"https://ror.org/02djqfd08","country_code":"CN","type":"education","lineage":["https://openalex.org/I55712492"]},{"id":"https://openalex.org/I4391767838","display_name":"State Key Laboratory of Industrial Control Technology","ror":"https://ror.org/03a33a786","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391767838","https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haifeng Ji","raw_affiliation_strings":["State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University , Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4391767838"]},{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University , Hangzhou, China","institution_ids":["https://openalex.org/I55712492","https://openalex.org/I4391767838"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038128825","display_name":"Zhiyao Huang","orcid":"https://orcid.org/0000-0003-1858-5994"},"institutions":[{"id":"https://openalex.org/I4391767838","display_name":"State Key Laboratory of Industrial Control Technology","ror":"https://ror.org/03a33a786","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391767838","https://openalex.org/I76130692"]},{"id":"https://openalex.org/I55712492","display_name":"Zhejiang University of Technology","ror":"https://ror.org/02djqfd08","country_code":"CN","type":"education","lineage":["https://openalex.org/I55712492"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiyao Huang","raw_affiliation_strings":["State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University , Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4391767838"]},{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University , Hangzhou, China","institution_ids":["https://openalex.org/I55712492","https://openalex.org/I4391767838"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100675990","display_name":"Haiqing Li","orcid":"https://orcid.org/0000-0003-0329-8933"},"institutions":[{"id":"https://openalex.org/I4391767838","display_name":"State Key Laboratory of Industrial Control Technology","ror":"https://ror.org/03a33a786","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391767838","https://openalex.org/I76130692"]},{"id":"https://openalex.org/I55712492","display_name":"Zhejiang University of Technology","ror":"https://ror.org/02djqfd08","country_code":"CN","type":"education","lineage":["https://openalex.org/I55712492"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiqing Li","raw_affiliation_strings":["State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University , Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4391767838"]},{"raw_affiliation_string":"State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering, Zhejiang University , Hangzhou, China","institution_ids":["https://openalex.org/I55712492","https://openalex.org/I4391767838"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5072259811"],"corresponding_institution_ids":["https://openalex.org/I4391767838","https://openalex.org/I55712492"],"apc_list":null,"apc_paid":null,"fwci":2.6009,"has_fulltext":false,"cited_by_count":54,"citation_normalized_percentile":{"value":0.90767,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"62","issue":"5","first_page":"1017","last_page":"1024"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9871000051498413,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.675137996673584},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.6739159226417542},{"id":"https://openalex.org/keywords/electrical-resistivity-and-conductivity","display_name":"Electrical resistivity and conductivity","score":0.6469385027885437},{"id":"https://openalex.org/keywords/electrical-resistance-and-conductance","display_name":"Electrical resistance and conductance","score":0.6400784254074097},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.6201634407043457},{"id":"https://openalex.org/keywords/demodulation","display_name":"Demodulation","score":0.5739587545394897},{"id":"https://openalex.org/keywords/electrical-resistivity-tomography","display_name":"Electrical resistivity tomography","score":0.5498769283294678},{"id":"https://openalex.org/keywords/conductivity","display_name":"Conductivity","score":0.5201045274734497},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.48928186297416687},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.45528659224510193},{"id":"https://openalex.org/keywords/contact-resistance","display_name":"Contact resistance","score":0.4303331971168518},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3617929220199585},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3227512836456299},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.26379233598709106},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.22432202100753784},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1971249282360077},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1420215368270874},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.10901010036468506}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.675137996673584},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.6739159226417542},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.6469385027885437},{"id":"https://openalex.org/C94857076","wikidata":"https://www.wikidata.org/wiki/Q106603432","display_name":"Electrical resistance and conductance","level":2,"score":0.6400784254074097},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.6201634407043457},{"id":"https://openalex.org/C195251586","wikidata":"https://www.wikidata.org/wiki/Q1185939","display_name":"Demodulation","level":3,"score":0.5739587545394897},{"id":"https://openalex.org/C60591178","wikidata":"https://www.wikidata.org/wiki/Q488986","display_name":"Electrical resistivity tomography","level":3,"score":0.5498769283294678},{"id":"https://openalex.org/C131540310","wikidata":"https://www.wikidata.org/wiki/Q907564","display_name":"Conductivity","level":2,"score":0.5201045274734497},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.48928186297416687},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.45528659224510193},{"id":"https://openalex.org/C123671423","wikidata":"https://www.wikidata.org/wiki/Q332329","display_name":"Contact resistance","level":3,"score":0.4303331971168518},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3617929220199585},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3227512836456299},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.26379233598709106},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.22432202100753784},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1971249282360077},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1420215368270874},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.10901010036468506},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2013.2246912","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2246912","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.47999998927116394,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1971205498","https://openalex.org/W1981975911","https://openalex.org/W1988781305","https://openalex.org/W2005993487","https://openalex.org/W2013470276","https://openalex.org/W2071925886","https://openalex.org/W2073407006","https://openalex.org/W2106616447","https://openalex.org/W2108257763","https://openalex.org/W2116818806","https://openalex.org/W2122489585","https://openalex.org/W2151779750","https://openalex.org/W2155537702","https://openalex.org/W2185766964"],"related_works":["https://openalex.org/W1996543123","https://openalex.org/W4253199194","https://openalex.org/W2553917976","https://openalex.org/W2375739220","https://openalex.org/W759704566","https://openalex.org/W2735298218","https://openalex.org/W4313171082","https://openalex.org/W4353073795","https://openalex.org/W2388624679","https://openalex.org/W2531822039"],"abstract_inverted_index":{"For":[0],"the":[1,7,10,13,22,29,53,64,71,82,88,102,110,118,122],"traditional":[2],"electrical":[3,25,36],"resistance":[4,26,37],"tomography":[5,27,38],"systems,":[6],"contact":[8,62],"between":[9,55],"electrodes":[11,56],"and":[12,70,87,117],"liquid":[14,54],"may":[15],"result":[16],"in":[17,28],"electrode":[18],"corrosion,":[19],"which":[20],"limits":[21],"application":[23],"of":[24,52,90,121],"industry.":[30],"In":[31],"this":[32,80],"paper,":[33],"a":[34,42],"new":[35],"system":[39,97,123],"based":[40,100],"on":[41,79,101],"capacitively-coupled":[43],"contactless":[44],"conductivity":[45,50,111],"technique":[46],"is":[47,68,76,92,98,124],"developed.":[48,77],"The":[49,66,94],"distribution":[51,112],"can":[57,114],"be":[58,115],"measured":[59],"without":[60],"direct":[61],"with":[63],"liquid.":[65],"sensor":[67,91],"designed":[69,99],"finite":[72],"element":[73],"method":[74],"model":[75],"Based":[78],"model,":[81],"sensitivity":[83],"fields":[84],"are":[85],"calculated":[86],"structure":[89],"optimized.":[93],"data":[95],"acquisition":[96],"phase-sensitive":[103],"demodulation":[104],"method.":[105],"Experimental":[106],"results":[107],"show":[108],"that":[109],"images":[113],"reconstructed,":[116],"real-time":[119],"performance":[120],"evaluated.":[125]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":3}],"updated_date":"2026-02-25T23:00:34.991745","created_date":"2025-10-10T00:00:00"}