{"id":"https://openalex.org/W1993822067","doi":"https://doi.org/10.1109/tim.2013.2245182","title":"Low-Frequency Characterization in Thermal Converters Using AC-Programmable Josephson Voltage Standard System","display_name":"Low-Frequency Characterization in Thermal Converters Using AC-Programmable Josephson Voltage Standard System","publication_year":2013,"publication_date":"2013-03-07","ids":{"openalex":"https://openalex.org/W1993822067","doi":"https://doi.org/10.1109/tim.2013.2245182","mag":"1993822067"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2013.2245182","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2245182","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024388326","display_name":"Yasutaka Amagai","orcid":"https://orcid.org/0000-0001-6816-8158"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Yasutaka Amagai","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053181770","display_name":"Michitaka Maruyama","orcid":"https://orcid.org/0000-0003-4699-8331"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Michitaka Maruyama","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073180314","display_name":"Hiroyuki Fujiki","orcid":"https://orcid.org/0000-0001-6472-6693"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Fujiki","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5024388326"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":2.1281,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.88005222,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"62","issue":"6","first_page":"1621","last_page":"1626"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11757","display_name":"Seismic Waves and Analysis","score":0.9889000058174133,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12510","display_name":"Magneto-Optical Properties and Applications","score":0.9848999977111816,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6308574676513672},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.5532455444335938},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.5509551763534546},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.5312718152999878},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.47540101408958435},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.4716697633266449},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.47094690799713135},{"id":"https://openalex.org/keywords/root-mean-square","display_name":"Root mean square","score":0.4625067114830017},{"id":"https://openalex.org/keywords/josephson-effect","display_name":"Josephson effect","score":0.4462423026561737},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.41834646463394165},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41026678681373596},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4100935161113739},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4044870138168335},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25591111183166504},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17615655064582825},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.17244777083396912},{"id":"https://openalex.org/keywords/superconductivity","display_name":"Superconductivity","score":0.09214848279953003},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.078684002161026}],"concepts":[{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6308574676513672},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5532455444335938},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.5509551763534546},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.5312718152999878},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.47540101408958435},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.4716697633266449},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.47094690799713135},{"id":"https://openalex.org/C71907059","wikidata":"https://www.wikidata.org/wiki/Q223323","display_name":"Root mean square","level":2,"score":0.4625067114830017},{"id":"https://openalex.org/C12038964","wikidata":"https://www.wikidata.org/wiki/Q764228","display_name":"Josephson effect","level":3,"score":0.4462423026561737},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.41834646463394165},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41026678681373596},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4100935161113739},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4044870138168335},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25591111183166504},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17615655064582825},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.17244777083396912},{"id":"https://openalex.org/C54101563","wikidata":"https://www.wikidata.org/wiki/Q124131","display_name":"Superconductivity","level":2,"score":0.09214848279953003},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.078684002161026},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2013.2245182","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2245182","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1977109428","https://openalex.org/W1978338331","https://openalex.org/W1979514275","https://openalex.org/W1992286365","https://openalex.org/W2031821198","https://openalex.org/W2052091528","https://openalex.org/W2059203732","https://openalex.org/W2069048675","https://openalex.org/W2070205567","https://openalex.org/W2101272815","https://openalex.org/W2107481531","https://openalex.org/W2119568377","https://openalex.org/W2121382939","https://openalex.org/W2122230150","https://openalex.org/W2128269426","https://openalex.org/W2132559919","https://openalex.org/W2137624056","https://openalex.org/W2138243688","https://openalex.org/W2145879242","https://openalex.org/W2154544822","https://openalex.org/W2163417809","https://openalex.org/W2163724237","https://openalex.org/W2164930374","https://openalex.org/W2165410023","https://openalex.org/W2165751916","https://openalex.org/W2167606261","https://openalex.org/W3099686640"],"related_works":["https://openalex.org/W3015838480","https://openalex.org/W2071668446","https://openalex.org/W1980429525","https://openalex.org/W2085930114","https://openalex.org/W2326770010","https://openalex.org/W3049121420","https://openalex.org/W2374263760","https://openalex.org/W4255647936","https://openalex.org/W1486069742","https://openalex.org/W2461589354"],"abstract_inverted_index":{"We":[0],"have":[1],"measured":[2,29,71],"the":[3,64,86,108,112,120],"low-frequency":[4,134],"characteristics":[5],"of":[6,33,88,94,119],"thermal":[7,37],"voltage":[8,24,93,136],"converters":[9],"down":[10],"to":[11,44,63],"1":[12,47,57],"Hz":[13,51,58,90,102],"using":[14,39,73,127],"a":[15,34,116,130],"differential":[16,123],"sampling":[17,124],"measurement":[18,98,125],"system":[19,41,75,126],"based":[20],"on":[21],"ac-programmable":[22],"Josephson":[23],"standard":[25,117],"(AC-PJVS)":[26],"system.":[27],"The":[28,67],"ac-dc":[30],"transfer":[31],"difference":[32],"planar":[35],"multijunction":[36],"converter":[38],"our":[40,74],"is":[42,76,129],"evaluated":[43],"be":[45],"<;":[46,53],"\u03bcV/V":[48,55,78],"above":[49,100],"10":[50,89,101],"and":[52,91],"35":[54],"at":[56,85],"with":[59,107],"lower":[60],"uncertainties":[61],"compared":[62],"conventional":[65,113],"method.":[66],"estimated":[68],"overall":[69],"uncertainty":[70],"by":[72,111],"3.1":[77],"(":[79],"<i":[80],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[81],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">k</i>":[82],"=":[83],"1)":[84],"frequency":[87],"root-mean-square":[92],"3":[95],"V.":[96],"Our":[97,122],"results":[99,109],"are":[103],"in":[104],"good":[105],"agreement":[106],"obtained":[110],"method":[114],"within":[115],"deviation":[118],"mean.":[121],"AC-PJVS":[128],"useful":[131],"tool":[132],"for":[133],"ac":[135],"metrology.":[137]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":4},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}