{"id":"https://openalex.org/W2033708812","doi":"https://doi.org/10.1109/tim.2013.2241513","title":"Establishment of S-parameter Traceability for 3.5 mm Coaxial Lines from 10 MHz to 100 MHz","display_name":"Establishment of S-parameter Traceability for 3.5 mm Coaxial Lines from 10 MHz to 100 MHz","publication_year":2013,"publication_date":"2013-02-19","ids":{"openalex":"https://openalex.org/W2033708812","doi":"https://doi.org/10.1109/tim.2013.2241513","mag":"2033708812"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2013.2241513","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2241513","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026725703","display_name":"Ryoko Kishikawa","orcid":"https://orcid.org/0000-0002-5545-4136"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Ryoko Kishikawa","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071891582","display_name":"Masaaki Shida","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masaaki Shida","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031714807","display_name":"Masahiro Horibe","orcid":"https://orcid.org/0000-0002-1193-607X"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiro Horibe","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5026725703"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.09647953,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"62","issue":"6","first_page":"1847","last_page":"1852"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12146","display_name":"Power Line Communications and Noise","score":0.9925000071525574,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.7990975975990295},{"id":"https://openalex.org/keywords/traceability","display_name":"Traceability","score":0.7220304012298584},{"id":"https://openalex.org/keywords/coaxial","display_name":"Coaxial","score":0.7090897560119629},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.685125470161438},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.6677003502845764},{"id":"https://openalex.org/keywords/network-analyzer","display_name":"Network analyzer (electrical)","score":0.5867987275123596},{"id":"https://openalex.org/keywords/reflection-coefficient","display_name":"Reflection coefficient","score":0.556786298751831},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5175818204879761},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4522760510444641},{"id":"https://openalex.org/keywords/nist","display_name":"NIST","score":0.4432111382484436},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.43993744254112244},{"id":"https://openalex.org/keywords/insertion-loss","display_name":"Insertion loss","score":0.4225602447986603},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4070778787136078},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4051267206668854},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.375762403011322},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3403599262237549},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.33710911870002747},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.18087193369865417},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1008448600769043}],"concepts":[{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.7990975975990295},{"id":"https://openalex.org/C153876917","wikidata":"https://www.wikidata.org/wiki/Q899704","display_name":"Traceability","level":2,"score":0.7220304012298584},{"id":"https://openalex.org/C51221625","wikidata":"https://www.wikidata.org/wiki/Q1751466","display_name":"Coaxial","level":2,"score":0.7090897560119629},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.685125470161438},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.6677003502845764},{"id":"https://openalex.org/C99101257","wikidata":"https://www.wikidata.org/wiki/Q1529374","display_name":"Network analyzer (electrical)","level":2,"score":0.5867987275123596},{"id":"https://openalex.org/C41700454","wikidata":"https://www.wikidata.org/wiki/Q1852282","display_name":"Reflection coefficient","level":2,"score":0.556786298751831},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5175818204879761},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4522760510444641},{"id":"https://openalex.org/C111219384","wikidata":"https://www.wikidata.org/wiki/Q6954384","display_name":"NIST","level":2,"score":0.4432111382484436},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.43993744254112244},{"id":"https://openalex.org/C90327742","wikidata":"https://www.wikidata.org/wiki/Q947396","display_name":"Insertion loss","level":2,"score":0.4225602447986603},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4070778787136078},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4051267206668854},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.375762403011322},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3403599262237549},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.33710911870002747},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.18087193369865417},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1008448600769043},{"id":"https://openalex.org/C204321447","wikidata":"https://www.wikidata.org/wiki/Q30642","display_name":"Natural language processing","level":1,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2013.2241513","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2241513","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1968803904","https://openalex.org/W2029885051","https://openalex.org/W2099471856","https://openalex.org/W2117707601","https://openalex.org/W2121284122","https://openalex.org/W2143891052","https://openalex.org/W2319191230"],"related_works":["https://openalex.org/W2807901368","https://openalex.org/W2067160763","https://openalex.org/W2092690554","https://openalex.org/W4205643331","https://openalex.org/W2090239554","https://openalex.org/W2058115773","https://openalex.org/W2789727165","https://openalex.org/W2508712609","https://openalex.org/W2151071362","https://openalex.org/W4229941974"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"the":[3,12,48,55,58,62,66,88],"National":[4],"Metrology":[5],"Institute":[6],"of":[7,11,15,47,69,87],"Japan's":[8],"(NMIJ)":[9],"development":[10],"International":[13],"System":[14],"Units":[16],"(SI)":[17],"traceable":[18],"S-parameter":[19],"standard":[20,39],"and":[21,57],"measurement":[22],"techniques":[23],"in":[24,80],"3.5":[25],"mm":[26],"coaxial":[27],"lines":[28],"at":[29,100],"radio":[30],"frequencies":[31],"(from":[32],"10":[33],"to":[34,76],"100":[35,101],"MHz).":[36],"The":[37,45,85],"primary":[38],"is":[40],"a":[41,70],"300-mm-length":[42],"air":[43,49],"line.":[44],"S-parameters":[46],"line":[50],"were":[51],"evaluated":[52],"by":[53,93],"measuring":[54],"dimensions":[56],"insertion":[59],"loss.":[60],"Using":[61],"offset":[63],"load":[64,72,90],"method,":[65],"reflection":[67],"coefficient":[68],"matched":[71,89],"termination":[73],"was":[74,97],"characterized":[75],"perform":[77],"thru-reflect-match":[78],"calibrations":[79],"vector":[81],"network":[82],"analyzer":[83],"measurements.":[84],"uncertainty":[86],"termination,":[91],"estimated":[92],"Monte":[94],"Carlo":[95],"simulations,":[96],"approximately":[98],"0.001":[99],"MHz.":[102]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2017,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}