{"id":"https://openalex.org/W2034540461","doi":"https://doi.org/10.1109/tim.2013.2241136","title":"Determination of Equivalent Inductance of Current Shunts at Frequency Up to 200 kHz","display_name":"Determination of Equivalent Inductance of Current Shunts at Frequency Up to 200 kHz","publication_year":2013,"publication_date":"2013-02-14","ids":{"openalex":"https://openalex.org/W2034540461","doi":"https://doi.org/10.1109/tim.2013.2241136","mag":"2034540461"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2013.2241136","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2241136","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102021559","display_name":"Jiangtao Zhang","orcid":"https://orcid.org/0000-0001-8052-7600"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]},{"id":"https://openalex.org/I194450716","display_name":"Jilin University","ror":"https://ror.org/00js3aw79","country_code":"CN","type":"education","lineage":["https://openalex.org/I194450716"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jiangtao Zhang","raw_affiliation_strings":["Jilin University, Changchun, China","National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Jilin University, Changchun, China","institution_ids":["https://openalex.org/I194450716"]},{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103137434","display_name":"Xianlin Pan","orcid":"https://orcid.org/0000-0003-2657-358X"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]},{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xianlin Pan","raw_affiliation_strings":["Harbin Institute of Technology, Harbin, China","National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113748508","display_name":"Wenfang Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210090956","display_name":"Shandong Institute of Metrology","ror":"https://ror.org/00a4qwj68","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210090956"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenfang Liu","raw_affiliation_strings":["Henan Institute of Metrology, Zhengzhou, China"],"affiliations":[{"raw_affiliation_string":"Henan Institute of Metrology, Zhengzhou, China","institution_ids":["https://openalex.org/I4210090956"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026465216","display_name":"Yang Gu","orcid":"https://orcid.org/0000-0001-7555-716X"},"institutions":[{"id":"https://openalex.org/I4210123506","display_name":"Jiangsu Institute of Metrology","ror":"https://ror.org/035hazd92","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210123506"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Gu","raw_affiliation_strings":["Beijing Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210123506"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100730921","display_name":"Biao Wang","orcid":"https://orcid.org/0000-0003-0830-911X"},"institutions":[{"id":"https://openalex.org/I43337087","display_name":"Hebei University","ror":"https://ror.org/01p884a79","country_code":"CN","type":"education","lineage":["https://openalex.org/I43337087"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Biao Wang","raw_affiliation_strings":["Hebei University, Baoding, China"],"affiliations":[{"raw_affiliation_string":"Hebei University, Baoding, China","institution_ids":["https://openalex.org/I43337087"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025819137","display_name":"Deshi Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Deshi Zhang","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5102021559"],"corresponding_institution_ids":["https://openalex.org/I194450716","https://openalex.org/I4210162136"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.0971743,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"62","issue":"6","first_page":"1664","last_page":"1668"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9901000261306763,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9901000261306763,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9668999910354614,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.954800009727478,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.826163649559021},{"id":"https://openalex.org/keywords/equivalent-series-inductance","display_name":"Equivalent series inductance","score":0.785417914390564},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.7027528285980225},{"id":"https://openalex.org/keywords/leakage-inductance","display_name":"Leakage inductance","score":0.5961599349975586},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.588589608669281},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5305662155151367},{"id":"https://openalex.org/keywords/current-divider","display_name":"Current divider","score":0.5079770684242249},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.5051673054695129},{"id":"https://openalex.org/keywords/electrical-reactance","display_name":"Electrical reactance","score":0.49982404708862305},{"id":"https://openalex.org/keywords/lcr-meter","display_name":"LCR meter","score":0.4791642725467682},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4260081648826599},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4113911986351013},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.39166131615638733},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3721940517425537},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3438480794429779},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2621387839317322},{"id":"https://openalex.org/keywords/voltage-divider","display_name":"Voltage divider","score":0.2523444890975952}],"concepts":[{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.826163649559021},{"id":"https://openalex.org/C141490761","wikidata":"https://www.wikidata.org/wiki/Q5384728","display_name":"Equivalent series inductance","level":4,"score":0.785417914390564},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.7027528285980225},{"id":"https://openalex.org/C32976094","wikidata":"https://www.wikidata.org/wiki/Q1515253","display_name":"Leakage inductance","level":4,"score":0.5961599349975586},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.588589608669281},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5305662155151367},{"id":"https://openalex.org/C97264828","wikidata":"https://www.wikidata.org/wiki/Q4157078","display_name":"Current divider","level":4,"score":0.5079770684242249},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.5051673054695129},{"id":"https://openalex.org/C87652615","wikidata":"https://www.wikidata.org/wiki/Q193972","display_name":"Electrical reactance","level":4,"score":0.49982404708862305},{"id":"https://openalex.org/C55592779","wikidata":"https://www.wikidata.org/wiki/Q4198687","display_name":"LCR meter","level":4,"score":0.4791642725467682},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4260081648826599},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4113911986351013},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39166131615638733},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3721940517425537},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3438480794429779},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2621387839317322},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.2523444890975952}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2013.2241136","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2241136","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.49000000953674316}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1995911965","https://openalex.org/W2001438050","https://openalex.org/W2019432273","https://openalex.org/W2024885563","https://openalex.org/W2125069769","https://openalex.org/W2155733266","https://openalex.org/W2169046261","https://openalex.org/W2178540438"],"related_works":["https://openalex.org/W2371924276","https://openalex.org/W2357473788","https://openalex.org/W1995911965","https://openalex.org/W2073956216","https://openalex.org/W2127274970","https://openalex.org/W1996236166","https://openalex.org/W2347244011","https://openalex.org/W2499233234","https://openalex.org/W2127796981","https://openalex.org/W2034540461"],"abstract_inverted_index":{"We":[0],"report":[1],"on":[2],"the":[3,9,33,37,58,62,66,70],"measurement":[4,63],"techniques":[5],"and":[6,29,65],"results":[7],"of":[8,12,36,45,61,73],"equivalent":[10,34],"inductance":[11,35],"current":[13,27,71],"shunts":[14,39],"at":[15],"frequencies":[16],"from":[17],"50":[18],"to":[19],"200":[20],"kHz.":[21],"With":[22],"a":[23,43],"three-branch":[24],"binary":[25],"inductive":[26],"divider":[28],"difference":[30],"detection":[31],"transformer,":[32],"cagelike":[38],"was":[40],"measured":[41],"against":[42],"set":[44],"four-terminal":[46],"resistors":[47],"whose":[48],"time":[49],"constants":[50],"were":[51],"accurately":[52],"determined.":[53],"The":[54],"verification":[55],"experiments":[56],"for":[57],"systematic":[59],"errors":[60],"setup":[64],"phase":[67],"comparator":[68],"with":[69],"ratio":[72],"2:1":[74],"are":[75],"also":[76],"presented.":[77]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}