{"id":"https://openalex.org/W2151288128","doi":"https://doi.org/10.1109/tim.2013.2240953","title":"Metrological Traceability in Waveguide S-parameter Measurements at 1.0 THz Band","display_name":"Metrological Traceability in Waveguide S-parameter Measurements at 1.0 THz Band","publication_year":2013,"publication_date":"2013-02-12","ids":{"openalex":"https://openalex.org/W2151288128","doi":"https://doi.org/10.1109/tim.2013.2240953","mag":"2151288128"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2013.2240953","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2240953","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031714807","display_name":"Masahiro Horibe","orcid":"https://orcid.org/0000-0002-1193-607X"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Masahiro Horibe","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026725703","display_name":"Ryoko Kishikawa","orcid":"https://orcid.org/0000-0002-5545-4136"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryoko Kishikawa","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5031714807"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":1.8916,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.87603868,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"62","issue":"6","first_page":"1814","last_page":"1820"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/terahertz-radiation","display_name":"Terahertz radiation","score":0.8860585689544678},{"id":"https://openalex.org/keywords/traceability","display_name":"Traceability","score":0.7928876876831055},{"id":"https://openalex.org/keywords/waveguide","display_name":"Waveguide","score":0.656156063079834},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.6490641832351685},{"id":"https://openalex.org/keywords/frequency-band","display_name":"Frequency band","score":0.5892229676246643},{"id":"https://openalex.org/keywords/network-analyzer","display_name":"Network analyzer (electrical)","score":0.5278114080429077},{"id":"https://openalex.org/keywords/flange","display_name":"Flange","score":0.5185366272926331},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5171253681182861},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.48315900564193726},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.457919716835022},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3953108489513397},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3801156282424927},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.37935009598731995},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3324007987976074},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2881004214286804},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.17277497053146362},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.16988924145698547}],"concepts":[{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.8860585689544678},{"id":"https://openalex.org/C153876917","wikidata":"https://www.wikidata.org/wiki/Q899704","display_name":"Traceability","level":2,"score":0.7928876876831055},{"id":"https://openalex.org/C200687136","wikidata":"https://www.wikidata.org/wiki/Q11233438","display_name":"Waveguide","level":2,"score":0.656156063079834},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.6490641832351685},{"id":"https://openalex.org/C2778116611","wikidata":"https://www.wikidata.org/wiki/Q25110567","display_name":"Frequency band","level":3,"score":0.5892229676246643},{"id":"https://openalex.org/C99101257","wikidata":"https://www.wikidata.org/wiki/Q1529374","display_name":"Network analyzer (electrical)","level":2,"score":0.5278114080429077},{"id":"https://openalex.org/C2778417280","wikidata":"https://www.wikidata.org/wiki/Q955957","display_name":"Flange","level":2,"score":0.5185366272926331},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5171253681182861},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.48315900564193726},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.457919716835022},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3953108489513397},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3801156282424927},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.37935009598731995},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3324007987976074},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2881004214286804},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.17277497053146362},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.16988924145698547},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2013.2240953","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2240953","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.41999998688697815,"id":"https://metadata.un.org/sdg/11","display_name":"Sustainable cities and communities"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2004264444","https://openalex.org/W2095767625","https://openalex.org/W2109358498","https://openalex.org/W2128469309","https://openalex.org/W2139135134","https://openalex.org/W2164317502","https://openalex.org/W2537692582","https://openalex.org/W2542514660","https://openalex.org/W2734683349","https://openalex.org/W2993994907","https://openalex.org/W3035162787","https://openalex.org/W6676773617","https://openalex.org/W6772008352"],"related_works":["https://openalex.org/W2104820912","https://openalex.org/W2003525033","https://openalex.org/W2771182919","https://openalex.org/W2535680364","https://openalex.org/W2150139079","https://openalex.org/W2158451083","https://openalex.org/W2091290925","https://openalex.org/W2044175881","https://openalex.org/W2109804394","https://openalex.org/W2134151099"],"abstract_inverted_index":{"We":[0,24],"have":[1],"improved":[2],"the":[3,15,47,58],"measurement":[4],"uncertainty":[5],"for":[6,31],"rectangular":[7],"waveguide":[8,28],"vector":[9],"network":[10],"analyzer":[11],"(VNA)":[12],"measurements":[13,36],"in":[14,42,57],"WM-250":[16],"(WR":[17],"1.0),":[18],"750":[19],"GHz-1.1":[20],"THz":[21],"frequency":[22,60],"band.":[23,61],"developed":[25],"a":[26,55],"new":[27],"flange":[29],"design":[30],"precise":[32],"connections":[33],"and":[34],"dimensional":[35],"to":[37,40,51],"establish":[38],"traceability":[39],"SI":[41],"VNA":[43,56],"measurements.":[44],"This":[45],"is":[46],"first":[48],"such":[49],"achievement":[50],"be":[52],"reported":[53],"using":[54],"terahertz":[59]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}