{"id":"https://openalex.org/W2049343443","doi":"https://doi.org/10.1109/tim.2013.2239057","title":"Uncertainty Evaluation of $-$100-dBc/Hz Flat Phase Noise Standard at 10 MHz","display_name":"Uncertainty Evaluation of $-$100-dBc/Hz Flat Phase Noise Standard at 10 MHz","publication_year":2013,"publication_date":"2013-02-05","ids":{"openalex":"https://openalex.org/W2049343443","doi":"https://doi.org/10.1109/tim.2013.2239057","mag":"2049343443"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2013.2239057","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2239057","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087716767","display_name":"Shinya Yanagimachi","orcid":"https://orcid.org/0000-0003-4956-7844"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shinya Yanagimachi","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024961684","display_name":"K. Watabe","orcid":"https://orcid.org/0000-0002-7073-7513"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ken-ichi Watabe","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060066899","display_name":"Takeshi Ikegami","orcid":"https://orcid.org/0000-0003-3521-8125"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takeshi Ikegami","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082512165","display_name":"Hitoshi Iida","orcid":"https://orcid.org/0000-0003-0055-9253"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hitoshi Iida","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007549738","display_name":"Yozo Shimada","orcid":"https://orcid.org/0000-0002-8474-6699"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yozo Shimada","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology , Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.09366596,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"62","issue":"6","first_page":"1545","last_page":"1549"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12004","display_name":"Advanced Frequency and Time Standards","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12004","display_name":"Advanced Frequency and Time Standards","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.8518055081367493},{"id":"https://openalex.org/keywords/dbc","display_name":"dBc","score":0.7790883779525757},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6910813450813293},{"id":"https://openalex.org/keywords/noise-spectral-density","display_name":"Noise spectral density","score":0.6286678910255432},{"id":"https://openalex.org/keywords/white-noise","display_name":"White noise","score":0.6271485090255737},{"id":"https://openalex.org/keywords/noise-generator","display_name":"Noise generator","score":0.604398250579834},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.5780555605888367},{"id":"https://openalex.org/keywords/noise-floor","display_name":"Noise floor","score":0.573566198348999},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.5518579483032227},{"id":"https://openalex.org/keywords/noise-temperature","display_name":"Noise temperature","score":0.5447888374328613},{"id":"https://openalex.org/keywords/noise-power","display_name":"Noise power","score":0.4970441162586212},{"id":"https://openalex.org/keywords/traceability","display_name":"Traceability","score":0.44143596291542053},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4183051586151123},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.36488211154937744},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.361934095621109},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.358803391456604},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3395114839076996},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2801480293273926},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.21930992603302002},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.18934759497642517},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.10380098223686218}],"concepts":[{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.8518055081367493},{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.7790883779525757},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6910813450813293},{"id":"https://openalex.org/C133976006","wikidata":"https://www.wikidata.org/wiki/Q3023291","display_name":"Noise spectral density","level":5,"score":0.6286678910255432},{"id":"https://openalex.org/C112633086","wikidata":"https://www.wikidata.org/wiki/Q381287","display_name":"White noise","level":2,"score":0.6271485090255737},{"id":"https://openalex.org/C74342258","wikidata":"https://www.wikidata.org/wiki/Q2133526","display_name":"Noise generator","level":5,"score":0.604398250579834},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.5780555605888367},{"id":"https://openalex.org/C187612029","wikidata":"https://www.wikidata.org/wiki/Q17083130","display_name":"Noise floor","level":4,"score":0.573566198348999},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.5518579483032227},{"id":"https://openalex.org/C52660251","wikidata":"https://www.wikidata.org/wiki/Q17083145","display_name":"Noise temperature","level":3,"score":0.5447888374328613},{"id":"https://openalex.org/C203234222","wikidata":"https://www.wikidata.org/wiki/Q2133519","display_name":"Noise power","level":3,"score":0.4970441162586212},{"id":"https://openalex.org/C153876917","wikidata":"https://www.wikidata.org/wiki/Q899704","display_name":"Traceability","level":2,"score":0.44143596291542053},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4183051586151123},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.36488211154937744},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.361934095621109},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.358803391456604},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3395114839076996},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2801480293273926},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.21930992603302002},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.18934759497642517},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.10380098223686218},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2013.2239057","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2239057","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W306655869","https://openalex.org/W2036177332","https://openalex.org/W2047876517","https://openalex.org/W2047928713","https://openalex.org/W2077191990","https://openalex.org/W2099867539","https://openalex.org/W2150692001","https://openalex.org/W2159102405","https://openalex.org/W2172193183","https://openalex.org/W3013975769","https://openalex.org/W3117221738","https://openalex.org/W4212819934","https://openalex.org/W6610664708","https://openalex.org/W6683733680","https://openalex.org/W6775236874"],"related_works":["https://openalex.org/W1988257008","https://openalex.org/W2118931924","https://openalex.org/W2141570529","https://openalex.org/W2180056344","https://openalex.org/W3021392142","https://openalex.org/W2015133066","https://openalex.org/W2099930065","https://openalex.org/W2541054142","https://openalex.org/W4256307153","https://openalex.org/W2742666096"],"abstract_inverted_index":{"We":[0,110],"describe":[1],"an":[2],"uncertainty":[3,82],"evaluation":[4],"of":[5,22,54,71,93,116,124],"the":[6,19,43,50,55,74,79,114],"-100-dBc/Hz":[7],"flat":[8,25,44,118],"phase":[9,26,45,119],"noise":[10,27,46,57,67,120],"standard":[11,28,121],"at":[12],"10":[13,99],"MHz,":[14],"which":[15],"ensures":[16],"traceability":[17],"to":[18,85],"International":[20],"System":[21],"Units.":[23],"The":[24],"signal":[29,47],"is":[30,83],"produced":[31],"using":[32],"a":[33,61,66,90,117],"carrier":[34],"combined":[35],"with":[36,60],"white":[37,56,126],"noise.":[38,127],"To":[39],"ensure":[40],"traceability,":[41],"both":[42],"power":[48,51,63],"and":[49,65,78,101,107],"spectral":[52],"density":[53],"are":[58,76],"determined":[59],"calibrated":[62],"meter":[64],"standard,":[68],"respectively.":[69],"Sources":[70],"uncertainties":[72],"in":[73],"system":[75],"discussed,":[77],"overall":[80],"expanded":[81],"found":[84],"be":[86],"0.6":[87],"dB":[88,97,103],"for":[89,98,104],"Fourier":[91],"frequency":[92],"1":[94],"Hz,":[95,100],"0.26":[96],"0.22":[102],"1,":[105],"10,":[106],"100":[108],"kHz.":[109],"also":[111],"report":[112],"on":[113],"validity":[115],"that":[122],"consists":[123],"high-power":[125]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}