{"id":"https://openalex.org/W2131356494","doi":"https://doi.org/10.1109/tim.2013.2238431","title":"Flat Frequency Response in the Electronic Measurement of Boltzmann's Constant","display_name":"Flat Frequency Response in the Electronic Measurement of Boltzmann's Constant","publication_year":2013,"publication_date":"2013-02-04","ids":{"openalex":"https://openalex.org/W2131356494","doi":"https://doi.org/10.1109/tim.2013.2238431","mag":"2131356494"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2013.2238431","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2238431","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103077484","display_name":"Jifeng Qu","orcid":"https://orcid.org/0000-0002-2026-9184"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jifeng Qu","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102117038","display_name":"Yunfeng Fu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunfeng Fu","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100718734","display_name":"Jianqiang Zhang","orcid":"https://orcid.org/0000-0003-4839-3854"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianqiang Zhang","raw_affiliation_strings":["National Institute of Metrology, Beijing, China","ShanDong Computer Science Center, Jinan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]},{"raw_affiliation_string":"ShanDong Computer Science Center, Jinan, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069441015","display_name":"Horst Rogalla","orcid":"https://orcid.org/0000-0003-3946-0891"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I188538660","display_name":"University of Colorado Boulder","ror":"https://ror.org/02ttsq026","country_code":"US","type":"education","lineage":["https://openalex.org/I188538660"]},{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL","US"],"is_corresponding":false,"raw_author_name":"Horst Rogalla","raw_affiliation_strings":["Department of Applied Physics, University of Twente, Enschede, Netherlands","Department of Electrical Engineering, University of Colorado, Boulder, CO, USA","National Institute for Standards and Technology, Boulder, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Applied Physics, University of Twente, Enschede, Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Department of Electrical Engineering, University of Colorado, Boulder, CO, USA","institution_ids":["https://openalex.org/I188538660"]},{"raw_affiliation_string":"National Institute for Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015821500","display_name":"Alessio Pollarolo","orcid":"https://orcid.org/0000-0002-7501-9289"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alessio Pollarolo","raw_affiliation_strings":["National Institute for Standards and Technology, Boulder, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute for Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081723705","display_name":"Samuel P. Benz","orcid":"https://orcid.org/0000-0002-8679-0765"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Samuel P. Benz","raw_affiliation_strings":["National Institute for Standards and Technology, Boulder, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute for Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.2609,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.88937664,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"62","issue":"6","first_page":"1518","last_page":"1523"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/boltzmann-constant","display_name":"Boltzmann constant","score":0.449897438287735},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.44460293650627136},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.41085922718048096},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.34752610325813293},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3358607888221741},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3145580291748047},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2904858887195587},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.20374822616577148},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19383153319358826},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.15604105591773987}],"concepts":[{"id":"https://openalex.org/C35304006","wikidata":"https://www.wikidata.org/wiki/Q5962","display_name":"Boltzmann constant","level":2,"score":0.449897438287735},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.44460293650627136},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.41085922718048096},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.34752610325813293},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3358607888221741},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3145580291748047},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2904858887195587},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.20374822616577148},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19383153319358826},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.15604105591773987}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2013.2238431","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2238431","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1968778486","https://openalex.org/W2019628272","https://openalex.org/W2024940833","https://openalex.org/W2027493053","https://openalex.org/W2038462420","https://openalex.org/W2039440308","https://openalex.org/W2039857817","https://openalex.org/W2044835563","https://openalex.org/W2048244524","https://openalex.org/W2080647002","https://openalex.org/W2081335266","https://openalex.org/W2090888886","https://openalex.org/W2108814491","https://openalex.org/W2116889615","https://openalex.org/W2121469695","https://openalex.org/W2121611756","https://openalex.org/W2129999714","https://openalex.org/W2139126750","https://openalex.org/W2149576900","https://openalex.org/W2158168847","https://openalex.org/W2169061325","https://openalex.org/W3097297264","https://openalex.org/W6660210649"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2899084033","https://openalex.org/W2386767533","https://openalex.org/W1971690248","https://openalex.org/W1989020926","https://openalex.org/W2467380741","https://openalex.org/W2067371143","https://openalex.org/W2063173065","https://openalex.org/W4251023981","https://openalex.org/W2027493053"],"abstract_inverted_index":{"A":[0,30,69],"new":[1],"quantum-voltage-calibrated":[2],"Johnson":[3],"noise":[4,28,79],"thermometer":[5],"was":[6,134],"developed":[7],"at":[8],"the":[9,16,55,88,93,103,119,130],"National":[10,120],"Institute":[11,121],"of":[12,36,42,50,73,92,118,122],"Metrology":[13],"to":[14,102,116],"demonstrate":[15],"electrical":[17,25],"approach":[18],"that":[19,117],"determines":[20],"Boltzmann's":[21],"constantk,":[22],"by":[23,136],"comparing":[24],"and":[26,39,62,66,81,86,124],"thermal":[27],"power.":[29],"measurement":[31,104,126],"with":[32,100],"an":[33],"integration":[34],"period":[35],"19":[37],"h":[38],"a":[40,47,67,110],"bandwidth":[41],"638":[43],"kHz":[44],"results":[45],"in":[46,128],"relative":[48,70,131],"offset":[49],"1":[51],"\u00d7":[52,75],"10-6,":[53],"from":[54],"current":[56],"Committee":[57],"on":[58],"Data":[59],"for":[60],"Science":[61],"Technology":[63,125],"value":[64],"ofk,":[65,127],"type":[68],"standard":[71],"uncertainty":[72,133],"17":[74],"10-6.":[76],"Closely":[77],"matched":[78],"powers":[80],"transmission-line":[82],"impedances":[83],"were":[84],"achieved,":[85],"consequently,":[87],"quadratic":[89],"fitting":[90],"parameters":[91],"ratio":[94],"spectrum":[95],"show":[96],"flat":[97,107],"frequency":[98],"responses":[99],"respect":[101],"bandwidth.":[105],"This":[106],"response":[108],"produces":[109],"dramatically":[111],"reduced":[112],"systematic":[113],"error":[114],"compared":[115],"Standards":[123],"which":[129],"combined":[132],"dominated":[135],"this":[137],"error.":[138]},"counts_by_year":[{"year":2023,"cited_by_count":3},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":4},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":5}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}