{"id":"https://openalex.org/W2108799310","doi":"https://doi.org/10.1109/tim.2013.2238014","title":"The North American Josephson Voltage Interlaboratory Comparison","display_name":"The North American Josephson Voltage Interlaboratory Comparison","publication_year":2013,"publication_date":"2013-01-23","ids":{"openalex":"https://openalex.org/W2108799310","doi":"https://doi.org/10.1109/tim.2013.2238014","mag":"2108799310"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2013.2238014","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2238014","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://nrc-publications.canada.ca/eng/view/accepted/?id=292376cd-6c7f-46e1-b224-9f9260ab65da","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044881733","display_name":"Harold Parks","orcid":"https://orcid.org/0000-0002-8144-5460"},"institutions":[{"id":"https://openalex.org/I192454743","display_name":"Sandia National Laboratories California","ror":"https://ror.org/058m7ey48","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1330989302","https://openalex.org/I192454743","https://openalex.org/I198811213","https://openalex.org/I198811213","https://openalex.org/I4210104735"]},{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Harold V. Parks","raw_affiliation_strings":["Sandia National Laboratories, Albuquerque, NM, USA","Sandia National Lab, Albuquerque, NM (USA)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sandia National Laboratories, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I4210104735"]},{"raw_affiliation_string":"Sandia National Lab, Albuquerque, NM (USA)","institution_ids":["https://openalex.org/I192454743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064231652","display_name":"Yi-hua Tang","orcid":"https://orcid.org/0000-0003-3754-5293"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yi-hua Tang","raw_affiliation_strings":["National Institute for Standards and Technology, Gaithersburg, MD, USA","National Institute of STandards and Technology (NIST), Gaithersburg, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute for Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"National Institute of STandards and Technology (NIST), Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068771379","display_name":"Paul Reese","orcid":null},"institutions":[{"id":"https://openalex.org/I131579929","display_name":"Mansfield University","ror":"https://ror.org/01emtgd92","country_code":"US","type":"education","lineage":["https://openalex.org/I131579929"]},{"id":"https://openalex.org/I4210138265","display_name":"Bionetics (United States)","ror":"https://ror.org/04brs8j34","country_code":"US","type":"company","lineage":["https://openalex.org/I4210138265"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Paul Reese","raw_affiliation_strings":["Covidien, Inc., Mansfield, MA, USA","Bionetics Corporation, Patrick AFB, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Covidien, Inc., Mansfield, MA, USA","institution_ids":["https://openalex.org/I131579929"]},{"raw_affiliation_string":"Bionetics Corporation, Patrick AFB, FL, USA","institution_ids":["https://openalex.org/I4210138265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069997199","display_name":"Jeff Gust","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jeff Gust","raw_affiliation_strings":["Fluke Corporation, Everett, WA, USA","Fluke Corp, Everett, WA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fluke Corporation, Everett, WA, USA","institution_ids":[]},{"raw_affiliation_string":"Fluke Corp, Everett, WA, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005792925","display_name":"James J. Novak","orcid":null},"institutions":[{"id":"https://openalex.org/I192454743","display_name":"Sandia National Laboratories California","ror":"https://ror.org/058m7ey48","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1330989302","https://openalex.org/I192454743","https://openalex.org/I198811213","https://openalex.org/I198811213","https://openalex.org/I4210104735"]},{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James J. Novak","raw_affiliation_strings":["Sandia National Laboratories, Albuquerque, NM, USA","Sandia National Lab, Albuquerque, NM (USA)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sandia National Laboratories, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I4210104735"]},{"raw_affiliation_string":"Sandia National Lab, Albuquerque, NM (USA)","institution_ids":["https://openalex.org/I192454743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9602,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.79685023,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"62","issue":"6","first_page":"1608","last_page":"1614"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11993","display_name":"Atomic and Subatomic Physics Research","score":0.9671000242233276,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9589999914169312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/zener-diode","display_name":"Zener diode","score":0.766899049282074},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.656944990158081},{"id":"https://openalex.org/keywords/josephson-effect","display_name":"Josephson effect","score":0.46375420689582825},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.434065580368042},{"id":"https://openalex.org/keywords/standard-uncertainty","display_name":"Standard uncertainty","score":0.4224329888820648},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3613315224647522},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.31548404693603516},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27575650811195374},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.24882087111473083},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20334425568580627},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.18809840083122253},{"id":"https://openalex.org/keywords/superconductivity","display_name":"Superconductivity","score":0.12273117899894714},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.10844448208808899}],"concepts":[{"id":"https://openalex.org/C50566616","wikidata":"https://www.wikidata.org/wiki/Q180586","display_name":"Zener diode","level":4,"score":0.766899049282074},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.656944990158081},{"id":"https://openalex.org/C12038964","wikidata":"https://www.wikidata.org/wiki/Q764228","display_name":"Josephson effect","level":3,"score":0.46375420689582825},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.434065580368042},{"id":"https://openalex.org/C2994224358","wikidata":"https://www.wikidata.org/wiki/Q13649246","display_name":"Standard uncertainty","level":3,"score":0.4224329888820648},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3613315224647522},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.31548404693603516},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27575650811195374},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.24882087111473083},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20334425568580627},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.18809840083122253},{"id":"https://openalex.org/C54101563","wikidata":"https://www.wikidata.org/wiki/Q124131","display_name":"Superconductivity","level":2,"score":0.12273117899894714},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.10844448208808899}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tim.2013.2238014","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2238014","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:cisti-icist.nrc-cnrc.ca:cistinparc:21276424","is_oa":true,"landing_page_url":"https://nrc-publications.canada.ca/fra/voir/objet/?id=292376cd-6c7f-46e1-b224-9f9260ab65da","pdf_url":"https://nrc-publications.canada.ca/eng/view/accepted/?id=292376cd-6c7f-46e1-b224-9f9260ab65da","source":{"id":"https://openalex.org/S7407055245","display_name":"NPARC","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"},{"id":"pmh:oai:osti.gov:1426916","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/1426916","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"pmh:oai:cisti-icist.nrc-cnrc.ca:cistinparc:21276424","is_oa":true,"landing_page_url":"https://nrc-publications.canada.ca/fra/voir/objet/?id=292376cd-6c7f-46e1-b224-9f9260ab65da","pdf_url":"https://nrc-publications.canada.ca/eng/view/accepted/?id=292376cd-6c7f-46e1-b224-9f9260ab65da","source":{"id":"https://openalex.org/S7407055245","display_name":"NPARC","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"},{"id":"https://openalex.org/F4320306101","display_name":"National Aeronautics and Space Administration","ror":"https://ror.org/027ka1x80"},{"id":"https://openalex.org/F4320332369","display_name":"National Nuclear Security Administration","ror":"https://ror.org/03sk1we31"},{"id":"https://openalex.org/F4320338291","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12"}],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W2108799310.pdf"},"referenced_works_count":19,"referenced_works":["https://openalex.org/W94194614","https://openalex.org/W1974013824","https://openalex.org/W1977348711","https://openalex.org/W2000305036","https://openalex.org/W2116044800","https://openalex.org/W2121049048","https://openalex.org/W2138497278","https://openalex.org/W2143929293","https://openalex.org/W2144173567","https://openalex.org/W2155132204","https://openalex.org/W2156337971","https://openalex.org/W2168491819","https://openalex.org/W2171771463","https://openalex.org/W2337743103","https://openalex.org/W2524421309","https://openalex.org/W2768354245","https://openalex.org/W4251428492","https://openalex.org/W6603863532","https://openalex.org/W6703544159"],"related_works":["https://openalex.org/W3130844878","https://openalex.org/W3084598117","https://openalex.org/W3139964550","https://openalex.org/W2360378882","https://openalex.org/W2108853753","https://openalex.org/W4244491248","https://openalex.org/W2022562201","https://openalex.org/W2388252395","https://openalex.org/W2354141393","https://openalex.org/W2126299787"],"abstract_inverted_index":{"The":[0],"ninth":[1],"North":[2],"American":[3],"Josephson":[4],"voltage":[5,44],"standard":[6],"(JVS)":[7],"interlaboratory":[8],"comparison":[9,20],"(ILC)":[10],"at":[11],"10":[12],"V":[13],"was":[14,21,46],"completed":[15],"in":[16],"2011.":[17],"An":[18],"on-site":[19],"conducted":[22],"between":[23],"the":[24,34,50,54,59,62,72],"National":[25],"Institute":[26],"of":[27,40],"Standards":[28],"and":[29,33,65,76],"Technology":[30],"compact":[31],"JVS":[32],"pivot":[35,51],"laboratory":[36,52],"system.":[37],"A":[38],"set":[39],"four":[41],"traveling":[42,74],"Zener":[43],"standards":[45,75],"then":[47],"shipped":[48],"from":[49,61],"to":[53],"other":[55],"participants.":[56],"We":[57],"give":[58],"results":[60],"2011":[63],"ILC":[64],"review":[66],"recent":[67],"comparisons":[68],"which":[69],"have":[70],"used":[71],"same":[73],"similar":[77],"procedures.":[78]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}