{"id":"https://openalex.org/W2172971245","doi":"https://doi.org/10.1109/tim.2013.2237993","title":"Differential Sampling Measurement of a 7 V RMS Sine Wave With a Programmable Josephson Voltage Standard","display_name":"Differential Sampling Measurement of a 7 V RMS Sine Wave With a Programmable Josephson Voltage Standard","publication_year":2013,"publication_date":"2013-02-06","ids":{"openalex":"https://openalex.org/W2172971245","doi":"https://doi.org/10.1109/tim.2013.2237993","mag":"2172971245"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2013.2237993","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2237993","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015731532","display_name":"Alain R\u00fcfenacht","orcid":"https://orcid.org/0000-0002-1579-9738"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Alain Rufenacht","raw_affiliation_strings":["National Institute for Standards and Technology, Boulder, CO, USA"],"affiliations":[{"raw_affiliation_string":"National Institute for Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111809224","display_name":"Charles J. Burroughs","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Charles J. Burroughs","raw_affiliation_strings":["National Institute for Standards and Technology, Boulder, CO, USA"],"affiliations":[{"raw_affiliation_string":"National Institute for Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020282923","display_name":"Paul D. Dresselhaus","orcid":"https://orcid.org/0000-0003-2493-0504"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Paul D. Dresselhaus","raw_affiliation_strings":["National Institute for Standards and Technology, Boulder, CO, USA"],"affiliations":[{"raw_affiliation_string":"National Institute for Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081723705","display_name":"Samuel P. Benz","orcid":"https://orcid.org/0000-0002-8679-0765"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Samuel P. Benz","raw_affiliation_strings":["National Institute for Standards and Technology, Boulder, CO, USA"],"affiliations":[{"raw_affiliation_string":"National Institute for Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5015731532"],"corresponding_institution_ids":["https://openalex.org/I1321296531"],"apc_list":null,"apc_paid":null,"fwci":5.6748,"has_fulltext":false,"cited_by_count":69,"citation_normalized_percentile":{"value":0.96406772,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"62","issue":"6","first_page":"1587","last_page":"1593"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9843999743461609,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9605000019073486,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sine-wave","display_name":"Sine wave","score":0.7999102473258972},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.674241304397583},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6671726703643799},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5841928720474243},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5798214673995972},{"id":"https://openalex.org/keywords/sine","display_name":"Sine","score":0.558537483215332},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4524660110473633},{"id":"https://openalex.org/keywords/differential","display_name":"Differential (mechanical device)","score":0.4172510802745819},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32670408487319946},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.23673281073570251},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21820583939552307},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14391440153121948},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.07081156969070435}],"concepts":[{"id":"https://openalex.org/C66907618","wikidata":"https://www.wikidata.org/wiki/Q207527","display_name":"Sine wave","level":3,"score":0.7999102473258972},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.674241304397583},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6671726703643799},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5841928720474243},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5798214673995972},{"id":"https://openalex.org/C186661526","wikidata":"https://www.wikidata.org/wiki/Q13647261","display_name":"Sine","level":2,"score":0.558537483215332},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4524660110473633},{"id":"https://openalex.org/C93226319","wikidata":"https://www.wikidata.org/wiki/Q193137","display_name":"Differential (mechanical device)","level":2,"score":0.4172510802745819},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32670408487319946},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.23673281073570251},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21820583939552307},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14391440153121948},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.07081156969070435},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2013.2237993","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2013.2237993","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8199999928474426,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306111","display_name":"U.S. Department of Commerce","ror":"https://ror.org/04chq2495"},{"id":"https://openalex.org/F4320332178","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1979514275","https://openalex.org/W1992286365","https://openalex.org/W2024184388","https://openalex.org/W2029281991","https://openalex.org/W2031821198","https://openalex.org/W2036892989","https://openalex.org/W2059203732","https://openalex.org/W2069048675","https://openalex.org/W2086693638","https://openalex.org/W2101272815","https://openalex.org/W2115975834","https://openalex.org/W2121060861","https://openalex.org/W2123177410","https://openalex.org/W2128269426","https://openalex.org/W2137624056","https://openalex.org/W2138243688","https://openalex.org/W2140713694","https://openalex.org/W2144865045","https://openalex.org/W2146719296","https://openalex.org/W2150998315","https://openalex.org/W2157471008","https://openalex.org/W2161487808","https://openalex.org/W2161570818","https://openalex.org/W2164930374","https://openalex.org/W2165751916","https://openalex.org/W2167465161","https://openalex.org/W2170375577","https://openalex.org/W2177379911","https://openalex.org/W2177411483"],"related_works":["https://openalex.org/W2886467464","https://openalex.org/W2379854577","https://openalex.org/W2362063739","https://openalex.org/W2351293857","https://openalex.org/W2424761688","https://openalex.org/W2487672730","https://openalex.org/W2091217334","https://openalex.org/W2409813437","https://openalex.org/W2335270510","https://openalex.org/W2163912294"],"abstract_inverted_index":{"A":[0,77,80],"10":[1,86],"V":[2,16,99],"programmable":[3],"Josephson":[4],"voltage":[5,30,49],"standard":[6],"has":[7],"enabled":[8],"sine":[9,101],"waves":[10],"with":[11,22,92],"voltages":[12,71],"up":[13],"to":[14,18],"7":[15,98],"RMS":[17,70,100],"be":[19],"accurately":[20],"measured":[21],"a":[23,74,97,105],"differential":[24,62],"sampling":[25,63],"measurement":[26,64],"technique.":[27],"Expanding":[28],"the":[29,36,40,47,54,61,93],"range":[31],"for":[32],"this":[33],"technique":[34,65,94],"enables":[35],"direct":[37],"calibration":[38],"of":[39,43,60,82],"low-frequency":[41],"ranges":[42],"commercial":[44],"calibrators":[45],"in":[46,85],"ac":[48],"mode.":[50],"This":[51],"paper":[52],"reviews":[53],"practically":[55],"achievable":[56],"performance":[57],"and":[58],"challenges":[59],"that":[66],"arise":[67],"when":[68,95],"measuring":[69,96],"greater":[72],"than":[73],"few":[75],"volts.":[76],"relative":[78],"Type":[79],"uncertainty":[81],"4":[83],"parts":[84],"<sup":[87],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[88],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">7</sup>":[89],"was":[90],"achieved":[91],"wave":[102],"generated":[103],"by":[104],"calibrator":[106],"at":[107],"62.5":[108],"Hz.":[109]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":10},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":17},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":10},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":8},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}