{"id":"https://openalex.org/W2140937529","doi":"https://doi.org/10.1109/tim.2012.2230734","title":"A Simple Build-Up Method for the DC Voltage Scale of a Source","display_name":"A Simple Build-Up Method for the DC Voltage Scale of a Source","publication_year":2012,"publication_date":"2012-12-31","ids":{"openalex":"https://openalex.org/W2140937529","doi":"https://doi.org/10.1109/tim.2012.2230734","mag":"2140937529"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2012.2230734","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2230734","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007084161","display_name":"M.D. Early","orcid":null},"institutions":[{"id":"https://openalex.org/I1302741095","display_name":"Statistics New Zealand","ror":"https://ror.org/055qjgz33","country_code":"NZ","type":"government","lineage":["https://openalex.org/I1302741095","https://openalex.org/I2802073567"]},{"id":"https://openalex.org/I4387153315","display_name":"Measurement Standards Laboratory of New Zealand","ror":"https://ror.org/04022gq47","country_code":"NZ","type":"government","lineage":["https://openalex.org/I4387153315"]}],"countries":["NZ"],"is_corresponding":true,"raw_author_name":"Murray D. Early","raw_affiliation_strings":["Measurement Standards Laboratory of New Zealand, Lower Hutt, New Zealand","Measurement Standards Laboratory of New Zealand (MSL), Lower Hutt, New Zealand"],"affiliations":[{"raw_affiliation_string":"Measurement Standards Laboratory of New Zealand, Lower Hutt, New Zealand","institution_ids":["https://openalex.org/I1302741095","https://openalex.org/I4387153315"]},{"raw_affiliation_string":"Measurement Standards Laboratory of New Zealand (MSL), Lower Hutt, New Zealand","institution_ids":["https://openalex.org/I4387153315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012088426","display_name":"Martin \u0160\u00edra","orcid":"https://orcid.org/0000-0002-9322-5991"},"institutions":[{"id":"https://openalex.org/I4210124866","display_name":"\u010cesk\u00fd Metrologick\u00fd Institut","ror":"https://ror.org/02m5haa59","country_code":"CZ","type":"facility","lineage":["https://openalex.org/I4210124866"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Martin Sira","raw_affiliation_strings":["Czech Metrological Institute, Brno, Czech Republic","Czech Metrology Institute, Brno, Czech Republic"],"affiliations":[{"raw_affiliation_string":"Czech Metrological Institute, Brno, Czech Republic","institution_ids":["https://openalex.org/I4210124866"]},{"raw_affiliation_string":"Czech Metrology Institute, Brno, Czech Republic","institution_ids":["https://openalex.org/I4210124866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007913200","display_name":"Bengt-Olof Andersson","orcid":null},"institutions":[{"id":"https://openalex.org/I992397","display_name":"University of Bor\u00e5s","ror":"https://ror.org/01fdxwh83","country_code":"SE","type":"education","lineage":["https://openalex.org/I992397"]},{"id":"https://openalex.org/I2800664555","display_name":"RISE Research Institutes of Sweden","ror":"https://ror.org/03nnxqz81","country_code":"SE","type":"other","lineage":["https://openalex.org/I2800664555"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Bengt-Olof Andersson","raw_affiliation_strings":["SP Technical Research Institute of Sweden, Boras, Sweden","SP Technical Research Institute of Sweden, Bor\u00e5s, Sweden#TAB#"],"affiliations":[{"raw_affiliation_string":"SP Technical Research Institute of Sweden, Boras, Sweden","institution_ids":["https://openalex.org/I992397"]},{"raw_affiliation_string":"SP Technical Research Institute of Sweden, Bor\u00e5s, Sweden#TAB#","institution_ids":["https://openalex.org/I2800664555"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013229265","display_name":"L.A. Christian","orcid":null},"institutions":[{"id":"https://openalex.org/I4387153315","display_name":"Measurement Standards Laboratory of New Zealand","ror":"https://ror.org/04022gq47","country_code":"NZ","type":"government","lineage":["https://openalex.org/I4387153315"]},{"id":"https://openalex.org/I1302741095","display_name":"Statistics New Zealand","ror":"https://ror.org/055qjgz33","country_code":"NZ","type":"government","lineage":["https://openalex.org/I1302741095","https://openalex.org/I2802073567"]}],"countries":["NZ"],"is_corresponding":false,"raw_author_name":"Laurie A. Christian","raw_affiliation_strings":["Measurement Standards Laboratory of New Zealand, Lower Hutt, New Zealand","Measurement Standards Laboratory of New Zealand (MSL), Lower Hutt, New Zealand"],"affiliations":[{"raw_affiliation_string":"Measurement Standards Laboratory of New Zealand, Lower Hutt, New Zealand","institution_ids":["https://openalex.org/I1302741095","https://openalex.org/I4387153315"]},{"raw_affiliation_string":"Measurement Standards Laboratory of New Zealand (MSL), Lower Hutt, New Zealand","institution_ids":["https://openalex.org/I4387153315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027860765","display_name":"Ove Gunnarsson","orcid":null},"institutions":[{"id":"https://openalex.org/I992397","display_name":"University of Bor\u00e5s","ror":"https://ror.org/01fdxwh83","country_code":"SE","type":"education","lineage":["https://openalex.org/I992397"]},{"id":"https://openalex.org/I2800664555","display_name":"RISE Research Institutes of Sweden","ror":"https://ror.org/03nnxqz81","country_code":"SE","type":"other","lineage":["https://openalex.org/I2800664555"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Ove Gunnarsson","raw_affiliation_strings":["SP Technical Research Institute of Sweden, Boras, Sweden","SP Technical Research Institute of Sweden, Bor\u00e5s, Sweden#TAB#"],"affiliations":[{"raw_affiliation_string":"SP Technical Research Institute of Sweden, Boras, Sweden","institution_ids":["https://openalex.org/I992397"]},{"raw_affiliation_string":"SP Technical Research Institute of Sweden, Bor\u00e5s, Sweden#TAB#","institution_ids":["https://openalex.org/I2800664555"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086825415","display_name":"Karl-Erik Rydler","orcid":"https://orcid.org/0000-0003-3885-8654"},"institutions":[{"id":"https://openalex.org/I992397","display_name":"University of Bor\u00e5s","ror":"https://ror.org/01fdxwh83","country_code":"SE","type":"education","lineage":["https://openalex.org/I992397"]},{"id":"https://openalex.org/I2800664555","display_name":"RISE Research Institutes of Sweden","ror":"https://ror.org/03nnxqz81","country_code":"SE","type":"other","lineage":["https://openalex.org/I2800664555"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Karl-Erik Rydler","raw_affiliation_strings":["SP Technical Research Institute of Sweden, Boras, Sweden","SP Technical Research Institute of Sweden, Bor\u00e5s, Sweden#TAB#"],"affiliations":[{"raw_affiliation_string":"SP Technical Research Institute of Sweden, Boras, Sweden","institution_ids":["https://openalex.org/I992397"]},{"raw_affiliation_string":"SP Technical Research Institute of Sweden, Bor\u00e5s, Sweden#TAB#","institution_ids":["https://openalex.org/I2800664555"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071684096","display_name":"Jir\u00ed Streit","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124866","display_name":"\u010cesk\u00fd Metrologick\u00fd Institut","ror":"https://ror.org/02m5haa59","country_code":"CZ","type":"facility","lineage":["https://openalex.org/I4210124866"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Jiri Streit","raw_affiliation_strings":["Czech Metrological Institute, Brno, Czech Republic","Czech Metrology Institute, Brno, CzechRepublic"],"affiliations":[{"raw_affiliation_string":"Czech Metrological Institute, Brno, Czech Republic","institution_ids":["https://openalex.org/I4210124866"]},{"raw_affiliation_string":"Czech Metrology Institute, Brno, CzechRepublic","institution_ids":["https://openalex.org/I4210124866"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5007084161"],"corresponding_institution_ids":["https://openalex.org/I1302741095","https://openalex.org/I4387153315"],"apc_list":null,"apc_paid":null,"fwci":0.982,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.79444262,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"62","issue":"6","first_page":"1600","last_page":"1607"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.6370753049850464},{"id":"https://openalex.org/keywords/simple","display_name":"Simple (philosophy)","score":0.6260292530059814},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.6032803654670715},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5952621102333069},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.576890230178833},{"id":"https://openalex.org/keywords/voltage-divider","display_name":"Voltage divider","score":0.5510809421539307},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5210637450218201},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.47093477845191956},{"id":"https://openalex.org/keywords/voltage-source","display_name":"Voltage source","score":0.44652867317199707},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.43052539229393005},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.31853607296943665},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2603650391101837},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06929853558540344}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.6370753049850464},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.6260292530059814},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.6032803654670715},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5952621102333069},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.576890230178833},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.5510809421539307},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5210637450218201},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.47093477845191956},{"id":"https://openalex.org/C144655898","wikidata":"https://www.wikidata.org/wiki/Q1161128","display_name":"Voltage source","level":3,"score":0.44652867317199707},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.43052539229393005},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.31853607296943665},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2603650391101837},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06929853558540344},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2012.2230734","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2230734","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6299999952316284,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1483090339","https://openalex.org/W1894610724","https://openalex.org/W1993076126","https://openalex.org/W2007955718","https://openalex.org/W2059783806","https://openalex.org/W2069417487","https://openalex.org/W2097433354","https://openalex.org/W2104183765","https://openalex.org/W2105670955","https://openalex.org/W2123130445","https://openalex.org/W2156521804"],"related_works":["https://openalex.org/W3010375258","https://openalex.org/W2392268897","https://openalex.org/W2951399158","https://openalex.org/W2606932918","https://openalex.org/W2183371787","https://openalex.org/W2113011472","https://openalex.org/W2102657213","https://openalex.org/W2132650951","https://openalex.org/W2068724228","https://openalex.org/W2101778776"],"abstract_inverted_index":{"We":[0,81],"report":[1],"on":[2,35],"the":[3,11,18,70,75,79,84,88,105,120,123],"performance":[4,65,121],"of":[5,22,28,69,74,87,122],"a":[6,23],"simple":[7],"method,":[8,14],"known":[9],"as":[10],"reference":[12],"step":[13],"to":[15,114],"build":[16],"up":[17,113],"dc":[19],"voltage":[20],"scale":[21],"source.":[24],"The":[25,50],"key":[26],"advantages":[27],"this":[29,56,93],"method":[30,89],"are":[31],"that":[32,37,104],"it":[33],"relies":[34],"equipment":[36],"is":[38,66,108],"readily":[39],"available":[40],"in":[41,78],"most":[42],"high-level":[43],"laboratories":[44],"and":[45,101],"can":[46,58],"be":[47,59],"fully":[48],"automated.":[49],"Type":[51],"A":[52],"uncertainties":[53],"achieved":[54,67],"by":[55,90,119],"approach":[57,94],"less":[60],"than":[61,110],"0.1":[62],"\u03bcV/V.":[63],"This":[64],"because":[68],"excellent":[71],"differential":[72],"linearity":[73],"DVM":[76],"used":[77],"method.":[80],"have":[82,102],"validated":[83],"overall":[85],"accuracy":[86],"directly":[91],"comparing":[92],"with":[95],"more":[96],"traditional":[97],"resistive":[98],"divider":[99],"techniques":[100],"established":[103],"expanded":[106],"uncertainty":[107],"better":[109],"0.2":[111],"\u03bcV/V":[112],"1000":[115],"V,":[116],"limited":[117],"only":[118],"instruments":[124],"used.":[125]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}