{"id":"https://openalex.org/W2063948917","doi":"https://doi.org/10.1109/tim.2012.2230733","title":"Noise and Correlation Study of Quantum Hall Devices","display_name":"Noise and Correlation Study of Quantum Hall Devices","publication_year":2013,"publication_date":"2013-01-08","ids":{"openalex":"https://openalex.org/W2063948917","doi":"https://doi.org/10.1109/tim.2012.2230733","mag":"2063948917"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2012.2230733","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2230733","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052377826","display_name":"J. Schurr","orcid":"https://orcid.org/0000-0001-7985-5770"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Jurgen Schurr","raw_affiliation_strings":["Physikalisch Technische Bundesanstalt, Brunswick, Germany","Physikalisch-Technische Bundesanstalt, Braunschweig (Germany)"],"affiliations":[{"raw_affiliation_string":"Physikalisch Technische Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]},{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt, Braunschweig (Germany)","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112601529","display_name":"F. J. Ahlers","orcid":null},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Franz Ahlers","raw_affiliation_strings":["Physikalisch Technische Bundesanstalt, Brunswick, Germany","Physikalisch-Technische Bundesanstalt, Braunschweig (Germany)"],"affiliations":[{"raw_affiliation_string":"Physikalisch Technische Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]},{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt, Braunschweig (Germany)","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086308147","display_name":"Luca Callegaro","orcid":"https://orcid.org/0000-0001-5997-9960"},"institutions":[{"id":"https://openalex.org/I4210136559","display_name":"Istituto Nazionale di Ricerca Metrologica","ror":"https://ror.org/03vn1bh77","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210104593","https://openalex.org/I4210136559","https://openalex.org/I4392021227"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca Callegaro","raw_affiliation_strings":["Istituto Nationale di Ricerca Metrologica (INRIM), Turin, Italy","Istituto Nazionale di Ricerca Metrologica, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Istituto Nationale di Ricerca Metrologica (INRIM), Turin, Italy","institution_ids":["https://openalex.org/I4210136559"]},{"raw_affiliation_string":"Istituto Nazionale di Ricerca Metrologica, Turin, Italy","institution_ids":["https://openalex.org/I4210136559"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5052377826"],"corresponding_institution_ids":["https://openalex.org/I1285933455"],"apc_list":null,"apc_paid":null,"fwci":0.8816,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.74825241,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"62","issue":"6","first_page":"1574","last_page":"1580"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10382","display_name":"Quantum and electron transport phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10382","display_name":"Quantum and electron transport phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10037","display_name":"Physics of Superconductivity and Magnetism","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/quantum-hall-effect","display_name":"Quantum Hall effect","score":0.8031169176101685},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6711993217468262},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.610937774181366},{"id":"https://openalex.org/keywords/noise-temperature","display_name":"Noise temperature","score":0.49976420402526855},{"id":"https://openalex.org/keywords/nyquist\u2013shannon-sampling-theorem","display_name":"Nyquist\u2013Shannon sampling theorem","score":0.4860961437225342},{"id":"https://openalex.org/keywords/johnson\u2013nyquist-noise","display_name":"Johnson\u2013Nyquist noise","score":0.4738788306713104},{"id":"https://openalex.org/keywords/quantum-noise","display_name":"Quantum noise","score":0.4585755467414856},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.4449060261249542},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4388718605041504},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33788442611694336},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3279736638069153},{"id":"https://openalex.org/keywords/quantum","display_name":"Quantum","score":0.3053484559059143},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.22723731398582458},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.22441792488098145},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22023746371269226},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.17509740591049194},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.13405868411064148},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.12755164504051208},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.12455731630325317}],"concepts":[{"id":"https://openalex.org/C200369452","wikidata":"https://www.wikidata.org/wiki/Q1047822","display_name":"Quantum Hall effect","level":3,"score":0.8031169176101685},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6711993217468262},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.610937774181366},{"id":"https://openalex.org/C52660251","wikidata":"https://www.wikidata.org/wiki/Q17083145","display_name":"Noise temperature","level":3,"score":0.49976420402526855},{"id":"https://openalex.org/C288623","wikidata":"https://www.wikidata.org/wiki/Q679800","display_name":"Nyquist\u2013Shannon sampling theorem","level":2,"score":0.4860961437225342},{"id":"https://openalex.org/C104419016","wikidata":"https://www.wikidata.org/wiki/Q1337490","display_name":"Johnson\u2013Nyquist noise","level":3,"score":0.4738788306713104},{"id":"https://openalex.org/C111996192","wikidata":"https://www.wikidata.org/wiki/Q7269075","display_name":"Quantum noise","level":3,"score":0.4585755467414856},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.4449060261249542},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4388718605041504},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33788442611694336},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3279736638069153},{"id":"https://openalex.org/C84114770","wikidata":"https://www.wikidata.org/wiki/Q46344","display_name":"Quantum","level":2,"score":0.3053484559059143},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.22723731398582458},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.22441792488098145},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22023746371269226},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.17509740591049194},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.13405868411064148},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.12755164504051208},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.12455731630325317},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2012.2230733","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2230733","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:iris.inrim.it:11696/31584","is_oa":false,"landing_page_url":"http://hdl.handle.net/11696/31584","pdf_url":null,"source":{"id":"https://openalex.org/S4306400708","display_name":"CINECA IRIS Institutional Research Information System (IRIS Istituto Nazionale di Ricerca Metrologica)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I27837315","host_organization_name":"University of Michigan","host_organization_lineage":["https://openalex.org/I27837315"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5600000023841858,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1483090339","https://openalex.org/W1543058413","https://openalex.org/W1965647794","https://openalex.org/W1972357097","https://openalex.org/W1972569485","https://openalex.org/W1973795823","https://openalex.org/W1983202983","https://openalex.org/W1988801174","https://openalex.org/W1992636231","https://openalex.org/W1992866344","https://openalex.org/W2009059839","https://openalex.org/W2027032410","https://openalex.org/W2027493053","https://openalex.org/W2028112598","https://openalex.org/W2035229943","https://openalex.org/W2038462420","https://openalex.org/W2042637500","https://openalex.org/W2058424454","https://openalex.org/W2061000251","https://openalex.org/W2064630837","https://openalex.org/W2074220468","https://openalex.org/W2076602648","https://openalex.org/W2080522061","https://openalex.org/W2086672464","https://openalex.org/W2086673423","https://openalex.org/W2147026261","https://openalex.org/W2163899311","https://openalex.org/W2171036925","https://openalex.org/W2324072402","https://openalex.org/W3098956640","https://openalex.org/W3138941559","https://openalex.org/W4234600779","https://openalex.org/W6792167075"],"related_works":["https://openalex.org/W2349405112","https://openalex.org/W1983231378","https://openalex.org/W1987957470","https://openalex.org/W2435435549","https://openalex.org/W1987711453","https://openalex.org/W2030646752","https://openalex.org/W4200487688","https://openalex.org/W4321274089","https://openalex.org/W2104029590","https://openalex.org/W1983564948"],"abstract_inverted_index":{"We":[0],"report":[1],"voltage":[2],"noise":[3,31,55],"measurements":[4],"on":[5],"the":[6,19,22,65,69],"cryogenic":[7],"quantum":[8,40],"Hall":[9,41],"resistance":[10],"(QHR)":[11],"and":[12],"present":[13],"two":[14,36],"new":[15],"findings":[16],"to":[17,57],"illustrate":[18],"potential":[20],"of":[21,39,68],"two-channel":[23],"instrumentation":[24],"used.":[25],"Without":[26],"applied":[27,52],"current,":[28,53],"only":[29],"Johnson-Nyquist":[30],"is":[32],"present,":[33],"but":[34],"at":[35],"separate":[37],"pairs":[38],"terminals,":[42],"it":[43],"can":[44],"be":[45],"cross-correlated":[46],"via":[47],"a":[48],"longitudinal":[49],"resistance.":[50],"With":[51],"excess":[54],"due":[56],"dissipation":[58],"bursts":[59],"appears,":[60],"which":[61],"increases":[62],"dramatically":[63],"with":[64],"noninteger":[66],"fraction":[67],"filling":[70],"factor.":[71]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}