{"id":"https://openalex.org/W1966200414","doi":"https://doi.org/10.1109/tim.2012.2224277","title":"Composite Damage Detection Based on Redundant Second-Generation Wavelet Transform and Fractal Dimension Tomography Algorithm of Lamb Wave","display_name":"Composite Damage Detection Based on Redundant Second-Generation Wavelet Transform and Fractal Dimension Tomography Algorithm of Lamb Wave","publication_year":2012,"publication_date":"2012-11-14","ids":{"openalex":"https://openalex.org/W1966200414","doi":"https://doi.org/10.1109/tim.2012.2224277","mag":"1966200414"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2012.2224277","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2224277","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100779843","display_name":"Xuefeng Chen","orcid":"https://orcid.org/0000-0002-0130-3172"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xuefeng Chen","raw_affiliation_strings":["State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xian, China","State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xian, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022516253","display_name":"Xiang Li","orcid":"https://orcid.org/0000-0002-3919-2658"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiang Li","raw_affiliation_strings":["State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xian, China","State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xian, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033308608","display_name":"Shibin Wang","orcid":"https://orcid.org/0000-0003-4923-0491"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shibin Wang","raw_affiliation_strings":["State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xian, China","State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xian, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101866259","display_name":"Zhibo Yang","orcid":"https://orcid.org/0000-0002-9815-5013"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhibo Yang","raw_affiliation_strings":["State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xian, China","State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xian, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101730541","display_name":"Binqiang Chen","orcid":"https://orcid.org/0000-0001-9712-084X"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Binqiang Chen","raw_affiliation_strings":["State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xian, China","State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xian, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103407942","display_name":"Zhengjia He","orcid":null},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengjia He","raw_affiliation_strings":["State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xian, China","State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xian, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an, China","institution_ids":["https://openalex.org/I87445476"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5100779843"],"corresponding_institution_ids":["https://openalex.org/I87445476"],"apc_list":null,"apc_paid":null,"fwci":6.115,"has_fulltext":false,"cited_by_count":45,"citation_normalized_percentile":{"value":0.95682492,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"62","issue":"5","first_page":"1354","last_page":"1363"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10534","display_name":"Structural Health Monitoring Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fractal-dimension","display_name":"Fractal dimension","score":0.6435937881469727},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.6430025100708008},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6228910684585571},{"id":"https://openalex.org/keywords/structural-health-monitoring","display_name":"Structural health monitoring","score":0.5536521077156067},{"id":"https://openalex.org/keywords/dimension","display_name":"Dimension (graph theory)","score":0.5487636923789978},{"id":"https://openalex.org/keywords/fractal","display_name":"Fractal","score":0.5325666069984436},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.46994927525520325},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4533320367336273},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.43700048327445984},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.4291078746318817},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.4215725064277649},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3878248333930969},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.35928159952163696},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.33499574661254883},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.28859943151474},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2470405101776123},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.18962568044662476},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.07792526483535767},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07460814714431763},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.07359591126441956}],"concepts":[{"id":"https://openalex.org/C26546657","wikidata":"https://www.wikidata.org/wiki/Q1412452","display_name":"Fractal dimension","level":3,"score":0.6435937881469727},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.6430025100708008},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6228910684585571},{"id":"https://openalex.org/C2776247918","wikidata":"https://www.wikidata.org/wiki/Q1423713","display_name":"Structural health monitoring","level":2,"score":0.5536521077156067},{"id":"https://openalex.org/C33676613","wikidata":"https://www.wikidata.org/wiki/Q13415176","display_name":"Dimension (graph theory)","level":2,"score":0.5487636923789978},{"id":"https://openalex.org/C40636538","wikidata":"https://www.wikidata.org/wiki/Q81392","display_name":"Fractal","level":2,"score":0.5325666069984436},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.46994927525520325},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4533320367336273},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.43700048327445984},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.4291078746318817},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.4215725064277649},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3878248333930969},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.35928159952163696},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.33499574661254883},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.28859943151474},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2470405101776123},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.18962568044662476},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.07792526483535767},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07460814714431763},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.07359591126441956},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2012.2224277","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2224277","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1482688420","https://openalex.org/W1873368203","https://openalex.org/W1965262908","https://openalex.org/W1970732892","https://openalex.org/W1976927415","https://openalex.org/W1981516546","https://openalex.org/W1984282535","https://openalex.org/W1989006121","https://openalex.org/W1998665038","https://openalex.org/W2000954165","https://openalex.org/W2004466338","https://openalex.org/W2013606760","https://openalex.org/W2023446088","https://openalex.org/W2039527846","https://openalex.org/W2046497434","https://openalex.org/W2046743657","https://openalex.org/W2052033750","https://openalex.org/W2053057395","https://openalex.org/W2058791216","https://openalex.org/W2079558277","https://openalex.org/W2091329046","https://openalex.org/W2092993031","https://openalex.org/W2106544870","https://openalex.org/W2112690945","https://openalex.org/W2114729090","https://openalex.org/W2135805075","https://openalex.org/W2146842127","https://openalex.org/W2151164317","https://openalex.org/W2154007667","https://openalex.org/W2160440076","https://openalex.org/W2160641319","https://openalex.org/W2577996219","https://openalex.org/W3151068732","https://openalex.org/W6628917323","https://openalex.org/W6639400149"],"related_works":["https://openalex.org/W2394117909","https://openalex.org/W2896054214","https://openalex.org/W2355197944","https://openalex.org/W2017118246","https://openalex.org/W2354661593","https://openalex.org/W2382240109","https://openalex.org/W2368475191","https://openalex.org/W2391311021","https://openalex.org/W2389188284","https://openalex.org/W2023813792"],"abstract_inverted_index":{"In":[0],"the":[1,29,50,54,58,72,78,82],"purpose":[2],"of":[3,11,18,71],"achieving":[4],"composite":[5,59,83],"structure":[6],"damage":[7,55,84],"identification":[8],"and":[9,48,64],"localization":[10],"structural":[12],"health":[13],"monitoring,":[14],"a":[15,45],"denoising":[16,34],"algorithm":[17],"redundant":[19],"second-generation":[20],"wavelet":[21],"transform":[22],"considering":[23],"neighboring":[24],"coefficients":[25],"is":[26,75],"selected":[27],"as":[28,44,66],"best":[30],"solution":[31],"from":[32],"18":[33],"schemes":[35],"performed":[36],"in":[37,77,81],"this":[38],"paper.":[39],"Through":[40],"introducing":[41],"fractal":[42],"dimension":[43],"damage-sensitive":[46],"feature":[47],"adopting":[49],"probabilistic":[51],"reconstruction":[52],"algorithm,":[53],"status":[56],"on":[57],"panel":[60],"could":[61],"be":[62],"identified":[63],"located":[65],"tomography":[67],"maps.":[68],"The":[69],"practicability":[70],"presented":[73],"approach":[74],"validated":[76],"experiment":[79],"operating":[80],"monitoring":[85],"system.":[86]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":8},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}