{"id":"https://openalex.org/W2078087367","doi":"https://doi.org/10.1109/tim.2012.2218677","title":"Automatic Defect Detection on Hot-Rolled Flat Steel Products","display_name":"Automatic Defect Detection on Hot-Rolled Flat Steel Products","publication_year":2012,"publication_date":"2012-10-22","ids":{"openalex":"https://openalex.org/W2078087367","doi":"https://doi.org/10.1109/tim.2012.2218677","mag":"2078087367"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2012.2218677","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2218677","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078782964","display_name":"Santanu Ghorai","orcid":"https://orcid.org/0000-0003-0301-4849"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Santanu Ghorai","raw_affiliation_strings":["Department of Applied Electronics and Instrumentation Engineering, Heritage Institute of Technology, Kolkata, India","Dept. of Appl. Electron. & Instrum. Eng., Heritage Inst. of Technol., Kolkata, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Applied Electronics and Instrumentation Engineering, Heritage Institute of Technology, Kolkata, India","institution_ids":[]},{"raw_affiliation_string":"Dept. of Appl. Electron. & Instrum. Eng., Heritage Inst. of Technol., Kolkata, India","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080264301","display_name":"Anirban Mukherjee","orcid":"https://orcid.org/0000-0002-8463-4347"},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anirban Mukherjee","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Kharagpur, Kharagpur, India","Dept. of Electr. Eng., Indian Inst. of Technol. Kharagpur, Kharagpur, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Kharagpur, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Indian Inst. of Technol. Kharagpur, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083782838","display_name":"M. Gangadaran","orcid":null},"institutions":[{"id":"https://openalex.org/I4399598405","display_name":"Steel Authority of India Limited","ror":"https://ror.org/041yqj635","country_code":null,"type":"government","lineage":["https://openalex.org/I4399598405"]},{"id":"https://openalex.org/I87816474","display_name":"Tata Steel (India)","ror":"https://ror.org/001wtjx27","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210086519","https://openalex.org/I87816474"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"M. Gangadaran","raw_affiliation_strings":["Appropriate Automation Promotion Centre Group, Research and Development for Iron and Steel, Steel Authority of India Limited, Ranchi, India","Appropriate Autom. Promotion Centre Group, Steel Authority of India Ltd., Ranchi, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Appropriate Automation Promotion Centre Group, Research and Development for Iron and Steel, Steel Authority of India Limited, Ranchi, India","institution_ids":["https://openalex.org/I87816474"]},{"raw_affiliation_string":"Appropriate Autom. Promotion Centre Group, Steel Authority of India Ltd., Ranchi, India","institution_ids":["https://openalex.org/I4399598405"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103122405","display_name":"Pranab Kumar Dutta","orcid":"https://orcid.org/0000-0001-9906-719X"},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Pranab K. Dutta","raw_affiliation_strings":["Department of Electrical Engineering and the Head of the School of Medical Science and Technology, Indian Institute of Technology Kharagpur, Kharagpur, India","Dept. of Electr. Eng., Indian Inst. of Technol. Kharagpur, Kharagpur, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and the Head of the School of Medical Science and Technology, Indian Institute of Technology Kharagpur, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Indian Inst. of Technol. Kharagpur, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":11.6643,"has_fulltext":false,"cited_by_count":317,"citation_normalized_percentile":{"value":0.98337682,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":"62","issue":"3","first_page":"612","last_page":"621"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9890000224113464,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.750872015953064},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.6617911458015442},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.6537801623344421},{"id":"https://openalex.org/keywords/kernel","display_name":"Kernel (algebra)","score":0.5484325885772705},{"id":"https://openalex.org/keywords/thresholding","display_name":"Thresholding","score":0.5273569226264954},{"id":"https://openalex.org/keywords/haar","display_name":"Haar","score":0.4850837290287018},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.48304492235183716},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48108264803886414},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4675527811050415},{"id":"https://openalex.org/keywords/biorthogonal-system","display_name":"Biorthogonal system","score":0.46653372049331665},{"id":"https://openalex.org/keywords/haar-wavelet","display_name":"Haar wavelet","score":0.4239307641983032},{"id":"https://openalex.org/keywords/feature-vector","display_name":"Feature vector","score":0.41964519023895264},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.40982845425605774},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.39375603199005127},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3654314875602722},{"id":"https://openalex.org/keywords/discrete-wavelet-transform","display_name":"Discrete wavelet transform","score":0.27085185050964355},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.16596871614456177}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.750872015953064},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.6617911458015442},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.6537801623344421},{"id":"https://openalex.org/C74193536","wikidata":"https://www.wikidata.org/wiki/Q574844","display_name":"Kernel (algebra)","level":2,"score":0.5484325885772705},{"id":"https://openalex.org/C191178318","wikidata":"https://www.wikidata.org/wiki/Q2256906","display_name":"Thresholding","level":3,"score":0.5273569226264954},{"id":"https://openalex.org/C187029792","wikidata":"https://www.wikidata.org/wiki/Q2179112","display_name":"Haar","level":3,"score":0.4850837290287018},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.48304492235183716},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48108264803886414},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4675527811050415},{"id":"https://openalex.org/C158453530","wikidata":"https://www.wikidata.org/wiki/Q864692","display_name":"Biorthogonal system","level":4,"score":0.46653372049331665},{"id":"https://openalex.org/C2780423554","wikidata":"https://www.wikidata.org/wiki/Q766198","display_name":"Haar wavelet","level":5,"score":0.4239307641983032},{"id":"https://openalex.org/C83665646","wikidata":"https://www.wikidata.org/wiki/Q42139305","display_name":"Feature vector","level":2,"score":0.41964519023895264},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.40982845425605774},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.39375603199005127},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3654314875602722},{"id":"https://openalex.org/C46286280","wikidata":"https://www.wikidata.org/wiki/Q2414958","display_name":"Discrete wavelet transform","level":4,"score":0.27085185050964355},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.16596871614456177},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2012.2218677","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2218677","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Reduced inequalities","score":0.550000011920929,"id":"https://metadata.un.org/sdg/10"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1562727806","https://openalex.org/W1601740268","https://openalex.org/W1980301091","https://openalex.org/W2022158372","https://openalex.org/W2026156619","https://openalex.org/W2041797434","https://openalex.org/W2063466230","https://openalex.org/W2064014153","https://openalex.org/W2098815387","https://openalex.org/W2100690466","https://openalex.org/W2106358651","https://openalex.org/W2109925328","https://openalex.org/W2111007172","https://openalex.org/W2115755118","https://openalex.org/W2137922462","https://openalex.org/W2146049876","https://openalex.org/W2156909104","https://openalex.org/W2158202311","https://openalex.org/W2163523563","https://openalex.org/W2164653394","https://openalex.org/W2169035906","https://openalex.org/W3020710005","https://openalex.org/W3120421331","https://openalex.org/W4206454995","https://openalex.org/W4253920039","https://openalex.org/W6633809322"],"related_works":["https://openalex.org/W2766849256","https://openalex.org/W4361795924","https://openalex.org/W984746159","https://openalex.org/W1523827626","https://openalex.org/W1999916501","https://openalex.org/W4252903992","https://openalex.org/W2964066233","https://openalex.org/W4232769230","https://openalex.org/W2005569824","https://openalex.org/W111100742"],"abstract_inverted_index":{"Automatic":[0],"defect":[1,56,174,204],"detection":[2],"on":[3,13,162],"hot-rolled":[4],"steel":[5,118,132],"surface":[6,60,68,119,136],"is":[7,25,48,182],"challenging":[8],"owing":[9],"to":[10,27,50,72,134,185],"its":[11],"localization":[12],"a":[14,40,44,52,85],"large":[15],"surface,":[16],"variation":[17],"in":[18,104,138],"appearance,":[19],"and":[20,102,152,165],"their":[21],"rare":[22],"occurrences.":[23],"It":[24,141],"difficult":[26],"detect":[28],"these":[29],"defects":[30,69,143],"either":[31],"by":[32,36],"physics-based":[33],"models":[34],"or":[35,200],"small-sample":[37],"statistics":[38],"using":[39],"single":[41],"threshold.":[42],"As":[43],"result,":[45],"this":[46,187],"problem":[47,188],"focused":[49],"derive":[51],"set":[53,181],"of":[54,84,87,117,170,173,203],"good-quality":[55],"descriptors":[57,63],"from":[58,109],"the":[59,66,82,190],"images.":[61,120],"These":[62],"should":[64],"discriminate":[65],"various":[67],"when":[70],"fed":[71],"suitable":[73],"machine":[74,151],"learning":[75],"algorithms.":[76],"This":[77],"research":[78],"work":[79],"has":[80],"evaluated":[81],"performance":[83],"number":[86],"different":[88,105],"wavelet":[89,192],"feature":[90,180,193],"sets,":[91],"namely,":[92],"Haar,":[93],"Daubechies":[94,97],"2":[95],"(DB2),":[96],"4":[98],"(DB4),":[99],"biorthogonal":[100],"spline,":[101],"multiwavelet":[103],"decomposition":[106],"levels":[107],"derived":[108],"32":[110,112],"\u00d7":[111],"contiguous":[113],"(nonoverlapping)":[114],"pixel":[115],"blocks":[116],"We":[121],"have":[122],"developed":[123],"an":[124,130],"automated":[125],"visual":[126],"inspection":[127],"system":[128],"for":[129],"integrated":[131],"plant":[133],"capture":[135],"images":[137,168],"real":[139],"time.":[140],"localizes":[142],"employing":[144],"kernel":[145,157],"classifiers,":[146],"such":[147],"as":[148,195,197],"support":[149],"vector":[150],"recently":[153],"proposed":[154],"vector-valued":[155],"regularized":[156],"function":[158],"approximation.":[159],"Test":[160],"results":[161],"1000":[163],"defect-free":[164],"432":[166],"defective":[167],"comprising":[169],"24":[171],"types":[172],"classes":[175],"reveal":[176],"that":[177],"three-level":[178],"Haar":[179],"more":[183],"promising":[184],"address":[186],"than":[189],"other":[191],"sets":[194],"well":[196],"texture-based":[198],"segmentation":[199],"thresholding":[201],"technique":[202],"detection.":[205]},"counts_by_year":[{"year":2026,"cited_by_count":11},{"year":2025,"cited_by_count":27},{"year":2024,"cited_by_count":47},{"year":2023,"cited_by_count":46},{"year":2022,"cited_by_count":36},{"year":2021,"cited_by_count":23},{"year":2020,"cited_by_count":33},{"year":2019,"cited_by_count":25},{"year":2018,"cited_by_count":22},{"year":2017,"cited_by_count":17},{"year":2016,"cited_by_count":12},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":5}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}