{"id":"https://openalex.org/W2057369303","doi":"https://doi.org/10.1109/tim.2012.2211471","title":"Electrical Performance of the Recessed Probe Launch Technique for Measurement of Embedded Multilayer Structures","display_name":"Electrical Performance of the Recessed Probe Launch Technique for Measurement of Embedded Multilayer Structures","publication_year":2012,"publication_date":"2012-08-30","ids":{"openalex":"https://openalex.org/W2057369303","doi":"https://doi.org/10.1109/tim.2012.2211471","mag":"2057369303"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2012.2211471","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2211471","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067038280","display_name":"Miroslav Kotzev","orcid":null},"institutions":[{"id":"https://openalex.org/I159176309","display_name":"Universit\u00e4t Hamburg","ror":"https://ror.org/00g30e956","country_code":"DE","type":"education","lineage":["https://openalex.org/I159176309"]},{"id":"https://openalex.org/I884043246","display_name":"Hamburg University of Technology","ror":"https://ror.org/04bs1pb34","country_code":"DE","type":"education","lineage":["https://openalex.org/I884043246"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Miroslav Kotzev","raw_affiliation_strings":["Institut f\u00fcr Theoretische Elektrotechnik, Technische Universit\u00e4t Hamburg, Hamburg, Germany","Inst. fur Theor. Elektrotechnik, Tech. Univ. Hamburg-Harburg, Hamburg, Germany"],"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Theoretische Elektrotechnik, Technische Universit\u00e4t Hamburg, Hamburg, Germany","institution_ids":["https://openalex.org/I159176309","https://openalex.org/I884043246"]},{"raw_affiliation_string":"Inst. fur Theor. Elektrotechnik, Tech. Univ. Hamburg-Harburg, Hamburg, Germany","institution_ids":["https://openalex.org/I884043246"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016276572","display_name":"Renato R\u00edmolo-Donad\u00edo","orcid":"https://orcid.org/0000-0002-3087-9162"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Renato Rimolo-Donadio","raw_affiliation_strings":["T. J. Watson Research Center, IBM, Yorktown Heights, NY, USA","IBM T. J. Watson Research Center, Yorktown Heights , NY, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"T. J. Watson Research Center, IBM, Yorktown Heights, NY, USA","institution_ids":[]},{"raw_affiliation_string":"IBM T. J. Watson Research Center, Yorktown Heights , NY, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077697454","display_name":"Young Kwark","orcid":"https://orcid.org/0000-0002-5574-1717"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Young H. Kwark","raw_affiliation_strings":["T. J. Watson Research Center, IBM, Yorktown Heights, NY, USA","IBM T. J. Watson Research Center, Yorktown Heights , NY, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"T. J. Watson Research Center, IBM, Yorktown Heights, NY, USA","institution_ids":[]},{"raw_affiliation_string":"IBM T. J. Watson Research Center, Yorktown Heights , NY, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087561550","display_name":"Christian Baks","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Christian W. Baks","raw_affiliation_strings":["T. J. Watson Research Center, IBM, Yorktown Heights, NY, USA","IBM T. J. Watson Research Center, Yorktown Heights , NY, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"T. J. Watson Research Center, IBM, Yorktown Heights, NY, USA","institution_ids":[]},{"raw_affiliation_string":"IBM T. J. Watson Research Center, Yorktown Heights , NY, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100653254","display_name":"Xiaoxiong Gu","orcid":"https://orcid.org/0000-0002-2430-0353"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xiaoxiong Gu","raw_affiliation_strings":["T. J. Watson Research Center, IBM, Yorktown Heights, NY, USA","IBM T. J. Watson Research Center, Yorktown Heights , NY, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"T. J. Watson Research Center, IBM, Yorktown Heights, NY, USA","institution_ids":[]},{"raw_affiliation_string":"IBM T. J. Watson Research Center, Yorktown Heights , NY, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078436847","display_name":"Christian Schuster","orcid":"https://orcid.org/0000-0003-4019-0788"},"institutions":[{"id":"https://openalex.org/I159176309","display_name":"Universit\u00e4t Hamburg","ror":"https://ror.org/00g30e956","country_code":"DE","type":"education","lineage":["https://openalex.org/I159176309"]},{"id":"https://openalex.org/I884043246","display_name":"Hamburg University of Technology","ror":"https://ror.org/04bs1pb34","country_code":"DE","type":"education","lineage":["https://openalex.org/I884043246"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Christian Schuster","raw_affiliation_strings":["Institut f\u00fcr Theoretische Elektrotechnik, Technische Universit\u00e4t Hamburg, Hamburg, Germany","Inst. fur Theor. Elektrotechnik, Tech. Univ. Hamburg-Harburg, Hamburg, Germany"],"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Theoretische Elektrotechnik, Technische Universit\u00e4t Hamburg, Hamburg, Germany","institution_ids":["https://openalex.org/I159176309","https://openalex.org/I884043246"]},{"raw_affiliation_string":"Inst. fur Theor. Elektrotechnik, Tech. Univ. Hamburg-Harburg, Hamburg, Germany","institution_ids":["https://openalex.org/I884043246"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5067038280"],"corresponding_institution_ids":["https://openalex.org/I159176309","https://openalex.org/I884043246"],"apc_list":null,"apc_paid":null,"fwci":0.982,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.78494538,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"61","issue":"12","first_page":"3198","last_page":"3206"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6715073585510254},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.6531245708465576},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.6424771547317505},{"id":"https://openalex.org/keywords/microprobe","display_name":"Microprobe","score":0.5312079191207886},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4807462692260742},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39380770921707153},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3675074577331543},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35047632455825806},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.3462083339691162},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22444000840187073},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1256687343120575}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6715073585510254},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.6531245708465576},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.6424771547317505},{"id":"https://openalex.org/C125206250","wikidata":"https://www.wikidata.org/wiki/Q2365355","display_name":"Microprobe","level":2,"score":0.5312079191207886},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4807462692260742},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39380770921707153},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3675074577331543},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35047632455825806},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.3462083339691162},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22444000840187073},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1256687343120575},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2012.2211471","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2211471","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7599999904632568,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1479725918","https://openalex.org/W1505564719","https://openalex.org/W1686563111","https://openalex.org/W1991680123","https://openalex.org/W1995899042","https://openalex.org/W2055748677","https://openalex.org/W2058376276","https://openalex.org/W2069537154","https://openalex.org/W2093411327","https://openalex.org/W2111068907","https://openalex.org/W2111953905","https://openalex.org/W2113876397","https://openalex.org/W2122043681","https://openalex.org/W2146881075","https://openalex.org/W4234570251","https://openalex.org/W6637226193"],"related_works":["https://openalex.org/W4387817873","https://openalex.org/W1560350020","https://openalex.org/W2063665530","https://openalex.org/W2134777640","https://openalex.org/W4377089303","https://openalex.org/W2012251357","https://openalex.org/W4387868315","https://openalex.org/W2095810433","https://openalex.org/W2009675567","https://openalex.org/W282759477"],"abstract_inverted_index":{"This":[0],"paper":[1],"explores":[2],"the":[3,59,62,68,71,88,104,115,121,136],"electrical":[4],"performance":[5,106],"of":[6,15,61,67,73,114],"a":[7,39],"recessed":[8],"probe":[9,132],"launch":[10,105,129,137],"(RPL)":[11],"technique":[12,41,55],"for":[13,58,128],"measurement":[14,138],"embedded":[16],"(internal)":[17],"printed":[18],"circuit":[19],"board":[20,45],"(PCB)":[21],"structures":[22],"such":[23],"as":[24],"striplines":[25],"and":[26,47,86,112,131],"vias":[27],"(plated":[28],"through":[29],"holes).":[30],"The":[31],"RPL":[32],"uses":[33],"high-frequency":[34],"microprobes":[35],"in":[36],"combination":[37],"with":[38,70,107],"milling":[40],"that":[42,134],"removes":[43],"upper":[44],"layers":[46],"exposes":[48],"internal":[49],"probing":[50],"points.":[51],"A":[52],"two-tier":[53],"calibration":[54,75],"is":[56,97,118],"applied":[57],"extraction":[60],"<i":[63,90],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[64,91],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">S</i>":[65,92],"-parameters":[66],"RPLs":[69],"help":[72],"thru-reflect-line":[74],"standards":[76],"designed":[77],"on":[78],"PCB.":[79],"Full-wave":[80],"models":[81],"are":[82],"used":[83],"to":[84,100,109],"corroborate":[85],"validate":[87],"obtained":[89,98],"-parameters.":[93],"Good":[94],"model-to-hardware":[95],"correlation":[96],"up":[99],"40":[101],"GHz.":[102],"Furthermore,":[103],"respect":[108],"microprobe":[110],"positioning":[111],"variations":[113],"cavity":[116],"size":[117],"investigated":[119],"using":[120],"full-wave":[122],"models.":[123],"These":[124],"simulations":[125],"suggest":[126],"techniques":[127],"optimization":[130],"modifications":[133],"improve":[135],"bandwidth.":[139]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}