{"id":"https://openalex.org/W1973883464","doi":"https://doi.org/10.1109/tim.2012.2210332","title":"Uncertainties of Multiport VNA S-Parameter Measurements Applying the GSOLT Calibration Method","display_name":"Uncertainties of Multiport VNA S-Parameter Measurements Applying the GSOLT Calibration Method","publication_year":2012,"publication_date":"2012-08-22","ids":{"openalex":"https://openalex.org/W1973883464","doi":"https://doi.org/10.1109/tim.2012.2210332","mag":"1973883464"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2012.2210332","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2210332","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054305484","display_name":"Wei Zhao","orcid":"https://orcid.org/0000-0001-8165-4628"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Zhao","raw_affiliation_strings":["School of Electro-Mechanical Engineering, Xidian University, Xi'an, China","Sch. of Electro-Mech. Eng., Xidian Univ., Xian, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electro-Mechanical Engineering, Xidian University, Xi'an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Sch. of Electro-Mech. Eng., Xidian Univ., Xian, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100755418","display_name":"Xiaodong Yang","orcid":"https://orcid.org/0000-0002-4701-1204"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]},{"id":"https://openalex.org/I166337079","display_name":"Queen Mary University of London","ror":"https://ror.org/026zzn846","country_code":"GB","type":"education","lineage":["https://openalex.org/I124357947","https://openalex.org/I166337079"]}],"countries":["CN","GB"],"is_corresponding":false,"raw_author_name":"Xiaodong Yang","raw_affiliation_strings":["School of Electronic Engineering and Computer Science, Queen Mary University of London, London, UK","School of Electronic Engineering, Xidian University, Xi'an, China","Sch. of Electron. Eng., Xidian Univ., Xian, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Engineering and Computer Science, Queen Mary University of London, London, UK","institution_ids":["https://openalex.org/I166337079"]},{"raw_affiliation_string":"School of Electronic Engineering, Xidian University, Xi'an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Sch. of Electron. Eng., Xidian Univ., Xian, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032950722","display_name":"Jian\u2010Kang Xiao","orcid":"https://orcid.org/0000-0003-4196-6330"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiankang Xiao","raw_affiliation_strings":["School of Electro-Mechanical Engineering, Xidian University, Xi'an, China","Sch. of Electro-Mech. Eng., Xidian Univ., Xian, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electro-Mechanical Engineering, Xidian University, Xi'an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Sch. of Electro-Mech. Eng., Xidian Univ., Xian, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047892843","display_name":"Qammer H. Abbasi","orcid":"https://orcid.org/0000-0002-7097-9969"},"institutions":[{"id":"https://openalex.org/I142732210","display_name":"University of Engineering and Technology Lahore","ror":"https://ror.org/0051w2v06","country_code":"PK","type":"education","lineage":["https://openalex.org/I142732210"]},{"id":"https://openalex.org/I166337079","display_name":"Queen Mary University of London","ror":"https://ror.org/026zzn846","country_code":"GB","type":"education","lineage":["https://openalex.org/I124357947","https://openalex.org/I166337079"]}],"countries":["GB","PK"],"is_corresponding":false,"raw_author_name":"Qammer H. Abbasi","raw_affiliation_strings":["School of Electronic Engineering and Computer Science, Queen Mary University of London, London, UK","University of Engineering and Technology (UET), Lahore, Pakistan","[Sch. of Electron. Eng. & Comput. Sci, Queen Mary, Univ. of London, London, UK]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Engineering and Computer Science, Queen Mary University of London, London, UK","institution_ids":["https://openalex.org/I166337079"]},{"raw_affiliation_string":"University of Engineering and Technology (UET), Lahore, Pakistan","institution_ids":["https://openalex.org/I142732210"]},{"raw_affiliation_string":"[Sch. of Electron. Eng. & Comput. Sci, Queen Mary, Univ. of London, London, UK]","institution_ids":["https://openalex.org/I166337079"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101467229","display_name":"H. Qin","orcid":"https://orcid.org/0000-0002-6339-0427"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongbo Qin","raw_affiliation_strings":["School of Electro-Mechanical Engineering, Xidian University, Xi'an, China","Sch. of Electro-Mech. Eng., Xidian Univ., Xian, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electro-Mechanical Engineering, Xidian University, Xi'an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Sch. of Electro-Mech. Eng., Xidian Univ., Xian, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100764060","display_name":"Huorong Ren","orcid":"https://orcid.org/0000-0002-2625-9382"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huorong Ren","raw_affiliation_strings":["School of Electro-Mechanical Engineering, Xidian University, Xi'an, China","Sch. of Electro-Mech. Eng., Xidian Univ., Xian, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electro-Mechanical Engineering, Xidian University, Xi'an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Sch. of Electro-Mech. Eng., Xidian Univ., Xian, China","institution_ids":["https://openalex.org/I149594827"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2455,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.56550871,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"61","issue":"12","first_page":"3251","last_page":"3258"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7702491283416748},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.7176790237426758},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6317070126533508},{"id":"https://openalex.org/keywords/matrix","display_name":"Matrix (chemical analysis)","score":0.5248011350631714},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.4645063579082489},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.444273978471756},{"id":"https://openalex.org/keywords/ideal","display_name":"Ideal (ethics)","score":0.44333305954933167},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.43829020857810974},{"id":"https://openalex.org/keywords/device-under-test","display_name":"Device under test","score":0.4182659387588501},{"id":"https://openalex.org/keywords/port","display_name":"Port (circuit theory)","score":0.41329193115234375},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.39406275749206543},{"id":"https://openalex.org/keywords/applied-mathematics","display_name":"Applied mathematics","score":0.36013513803482056},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3363851308822632},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.3311782479286194},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.30727601051330566},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2385852038860321},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21688365936279297},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1651725172996521},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.07531529664993286}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7702491283416748},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.7176790237426758},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6317070126533508},{"id":"https://openalex.org/C106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","level":2,"score":0.5248011350631714},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.4645063579082489},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.444273978471756},{"id":"https://openalex.org/C2776639384","wikidata":"https://www.wikidata.org/wiki/Q840396","display_name":"Ideal (ethics)","level":2,"score":0.44333305954933167},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.43829020857810974},{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.4182659387588501},{"id":"https://openalex.org/C32802771","wikidata":"https://www.wikidata.org/wiki/Q2443617","display_name":"Port (circuit theory)","level":2,"score":0.41329193115234375},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.39406275749206543},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.36013513803482056},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3363851308822632},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.3311782479286194},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.30727601051330566},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2385852038860321},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21688365936279297},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1651725172996521},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.07531529664993286},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2012.2210332","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2210332","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:eprints.gla.ac.uk:140879","is_oa":false,"landing_page_url":"http://eprints.gla.ac.uk/140879/","pdf_url":null,"source":{"id":"https://openalex.org/S4210235606","display_name":"ENLIGHTEN (Jurnal Bimbingan dan Konseling Islam)","issn_l":"2622-8912","issn":["2622-8912","2622-8920"],"is_oa":false,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Articles"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2074946458","https://openalex.org/W2096906715","https://openalex.org/W2115526104","https://openalex.org/W2120699605","https://openalex.org/W2123116213","https://openalex.org/W2132203038","https://openalex.org/W2153729653","https://openalex.org/W2171676995","https://openalex.org/W2296545289","https://openalex.org/W6678145099"],"related_works":["https://openalex.org/W2012785660","https://openalex.org/W3005633134","https://openalex.org/W2168382331","https://openalex.org/W2116974997","https://openalex.org/W3022544149","https://openalex.org/W2158451083","https://openalex.org/W2101641736","https://openalex.org/W2002794989","https://openalex.org/W4386472848","https://openalex.org/W299526084"],"abstract_inverted_index":{"For":[0],"the":[1,7,20,24,27,37,40,44,49,59,65,75,83,107],"general":[2,52],"short-open-load-thru":[3],"(SOLT)":[4],"calibration":[5,46,85],"of":[6,26,36,39,51,77,92,98],"n-port":[8,28],"vector":[9],"network":[10],"analyzer":[11],"with":[12,62,80],"<i":[13],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[14],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">n</i>":[15],"+":[16],"1":[17],"measurement":[18],"channels,":[19],"sensitivity":[21,99],"coefficients":[22],"for":[23,43,58,105,111],"S-parameters":[25],"device":[29],"under":[30],"test":[31],"are":[32,87],"developed":[33],"as":[34],"functions":[35],"deviations":[38,61,76],"scattering":[41],"parameters":[42],"SOLT":[45],"standards.":[47],"Using":[48],"concept":[50],"node":[53],"equation,":[54],"a":[55,90],"generalized":[56],"formula":[57],"S-parameter":[60,112],"respect":[63,81],"to":[64,82],"error":[66,78],"terms":[67,79],"has":[68],"been":[69],"deduced.":[70],"In":[71],"addition,":[72],"expressions":[73],"representing":[74],"non-ideal":[84],"standards":[86],"given":[88],"by":[89],"series":[91],"matrix":[93],"operations.":[94],"Finally,":[95],"after":[96],"calculation":[97],"coefficients,":[100],"they":[101],"can":[102],"be":[103],"used":[104],"establishing":[106],"type-B":[108],"uncertainty":[109],"budget":[110],"measurements.":[113]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}