{"id":"https://openalex.org/W2062518028","doi":"https://doi.org/10.1109/tim.2012.2203871","title":"A High-Resolution Ultrasonic Distance Measurement System Using Vernier Caliper Phase Meter","display_name":"A High-Resolution Ultrasonic Distance Measurement System Using Vernier Caliper Phase Meter","publication_year":2012,"publication_date":"2012-10-05","ids":{"openalex":"https://openalex.org/W2062518028","doi":"https://doi.org/10.1109/tim.2012.2203871","mag":"2062518028"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2012.2203871","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2203871","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023363123","display_name":"Ke-Yu Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]},{"id":"https://openalex.org/I91951123","display_name":"Cheng Shiu University","ror":"https://ror.org/011bdtx65","country_code":"TW","type":"education","lineage":["https://openalex.org/I91951123"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Ke-Yu Lee","raw_affiliation_strings":["Cheng Shiu University, Kaohsiung, Taiwan","Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"affiliations":[{"raw_affiliation_string":"Cheng Shiu University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I91951123"]},{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054935654","display_name":"Chih\u2010Feng Huang","orcid":"https://orcid.org/0000-0002-8062-8708"},"institutions":[{"id":"https://openalex.org/I91951123","display_name":"Cheng Shiu University","ror":"https://ror.org/011bdtx65","country_code":"TW","type":"education","lineage":["https://openalex.org/I91951123"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Feng Huang","raw_affiliation_strings":["Department of Computer Science and Information Engineering, Cheng Shiu University, Kaohsiung, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Engineering, Cheng Shiu University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I91951123"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Sin-San Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I91951123","display_name":"Cheng Shiu University","ror":"https://ror.org/011bdtx65","country_code":"TW","type":"education","lineage":["https://openalex.org/I91951123"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Sin-San Huang","raw_affiliation_strings":["Department of Electrical Engineering, Cheng Shiu University, Kaohsiung, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Cheng Shiu University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I91951123"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110110168","display_name":"Ke-Nung Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I98298690","display_name":"I-Shou University","ror":"https://ror.org/04d7e4m76","country_code":"TW","type":"education","lineage":["https://openalex.org/I98298690"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ke-Nung Huang","raw_affiliation_strings":["Department of Electronic Engineering, I-Shou University, Kaohsiung, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, I-Shou University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I98298690"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103417773","display_name":"Ming\u2010Shing Young","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ming-Shing Young","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5023363123"],"corresponding_institution_ids":["https://openalex.org/I91807558","https://openalex.org/I91951123"],"apc_list":null,"apc_paid":null,"fwci":3.6035,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.91559423,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"61","issue":"11","first_page":"2924","last_page":"2931"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calipers","display_name":"Calipers","score":0.9679560661315918},{"id":"https://openalex.org/keywords/vernier-scale","display_name":"Vernier scale","score":0.9117430448532104},{"id":"https://openalex.org/keywords/ultrasonic-sensor","display_name":"Ultrasonic sensor","score":0.6777044534683228},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.5678589344024658},{"id":"https://openalex.org/keywords/metre","display_name":"Metre","score":0.4969954788684845},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4748133420944214},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.4693794250488281},{"id":"https://openalex.org/keywords/accuracy-and-precision","display_name":"Accuracy and precision","score":0.4254966080188751},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.4249868392944336},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.4224034249782562},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4141378402709961},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3767673373222351},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34210628271102905},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3244208097457886},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2699544429779053},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2404637336730957},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22536253929138184},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1722082495689392},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10071837902069092}],"concepts":[{"id":"https://openalex.org/C186738849","wikidata":"https://www.wikidata.org/wiki/Q12408","display_name":"Calipers","level":2,"score":0.9679560661315918},{"id":"https://openalex.org/C69710193","wikidata":"https://www.wikidata.org/wiki/Q14946576","display_name":"Vernier scale","level":2,"score":0.9117430448532104},{"id":"https://openalex.org/C81288441","wikidata":"https://www.wikidata.org/wiki/Q20736125","display_name":"Ultrasonic sensor","level":2,"score":0.6777044534683228},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.5678589344024658},{"id":"https://openalex.org/C151011524","wikidata":"https://www.wikidata.org/wiki/Q11573","display_name":"Metre","level":2,"score":0.4969954788684845},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4748133420944214},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.4693794250488281},{"id":"https://openalex.org/C202799725","wikidata":"https://www.wikidata.org/wiki/Q272035","display_name":"Accuracy and precision","level":2,"score":0.4254966080188751},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.4249868392944336},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.4224034249782562},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4141378402709961},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3767673373222351},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34210628271102905},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3244208097457886},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2699544429779053},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2404637336730957},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22536253929138184},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1722082495689392},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10071837902069092},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2012.2203871","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2203871","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.47999998927116394}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1965314428","https://openalex.org/W1973055448","https://openalex.org/W1977012352","https://openalex.org/W2000040184","https://openalex.org/W2002990550","https://openalex.org/W2016768786","https://openalex.org/W2059286513","https://openalex.org/W2082762531","https://openalex.org/W2113356819","https://openalex.org/W2116249510","https://openalex.org/W2120062182","https://openalex.org/W2143441110","https://openalex.org/W2148482808","https://openalex.org/W2152697780","https://openalex.org/W2153693539","https://openalex.org/W2159316732","https://openalex.org/W2166044948","https://openalex.org/W2166606349","https://openalex.org/W4232842671"],"related_works":["https://openalex.org/W2336125833","https://openalex.org/W2356653617","https://openalex.org/W4388412102","https://openalex.org/W2388782852","https://openalex.org/W2384583011","https://openalex.org/W2373027660","https://openalex.org/W1964504450","https://openalex.org/W2353448705","https://openalex.org/W2037733550","https://openalex.org/W1949949382"],"abstract_inverted_index":{"An":[0],"ultrasonic":[1,124],"distance":[2,89,113],"measurement":[3,12,79],"system":[4,102,138],"for":[5,88],"use":[6],"in":[7],"air":[8],"is":[9,13,52,72,103,115],"presented.":[10],"The":[11,37,93],"based":[14],"upon":[15],"the":[16,23,34,44,49,56,66,76,82,98,101,112,118,122,133],"two-frequency":[17],"continuous-wave":[18],"(TFCW)":[19],"phase-shift":[20,35,78],"method.":[21],"In":[22],"system,":[24],"two":[25],"vernier":[26,45],"caliper":[27,46],"phase":[28,38,50],"meters":[29],"are":[30,139],"used":[31,73],"to":[32,42,47,54,74,84,121],"measure":[33,48],"data.":[36],"meter":[39],"circuit":[40],"developed":[41],"emulate":[43],"shift":[51],"able":[53],"eliminate":[55],"measuring":[57],"error":[58],"and":[59,80,91,111,146],"produce":[60],"higher":[61],"resolution":[62,114],"results":[63,95],"without":[64],"increasing":[65],"clock":[67],"frequency.":[68],"A":[69],"single-chip":[70],"microprocessor":[71],"control":[75],"TFCW":[77],"send":[81],"data":[83],"a":[85,127],"personal":[86],"computer":[87],"calibration":[90],"examination.":[92],"experimental":[94],"show":[96],"that":[97],"accuracy":[99],"of":[100,117,129,136,148],"<formula":[104],"formulatype=\"inline\"":[105],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[106],"xmlns:xlink=\"http://www.w3.org/1999/xlink\"><tex":[107],"Notation=\"TeX\">$\\pm$</tex></formula>":[108],"0.1362":[109],"mm":[110],"0.04%":[116],"wavelength":[119],"corresponding":[120],"40-kHz":[123],"wave":[125],"at":[126],"range":[128],"50\u2013200":[130],"mm.":[131],"Therefore,":[132],"main":[134],"advantages":[135],"this":[137],"high":[140,142],"resolution,":[141],"accuracy,":[143],"low":[144],"cost,":[145],"ease":[147],"implementation.":[149]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":2}],"updated_date":"2026-04-17T18:11:37.981687","created_date":"2025-10-10T00:00:00"}