{"id":"https://openalex.org/W1968334032","doi":"https://doi.org/10.1109/tim.2012.2196394","title":"Fast Adaptive 3-D Nonstationary Electrical Impedance Tomography Based on Reduced-Order Modeling","display_name":"Fast Adaptive 3-D Nonstationary Electrical Impedance Tomography Based on Reduced-Order Modeling","publication_year":2012,"publication_date":"2012-09-12","ids":{"openalex":"https://openalex.org/W1968334032","doi":"https://doi.org/10.1109/tim.2012.2196394","mag":"1968334032"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2012.2196394","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2196394","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032158182","display_name":"Arto Voutilainen","orcid":null},"institutions":[{"id":"https://openalex.org/I175532246","display_name":"University of Eastern Finland","ror":"https://ror.org/00cyydd11","country_code":"FI","type":"education","lineage":["https://openalex.org/I175532246"]}],"countries":["FI"],"is_corresponding":true,"raw_author_name":"Arto Voutilainen","raw_affiliation_strings":["Department of Applied Physics, University of Eastern Finland, Kuopio, Finland"],"affiliations":[{"raw_affiliation_string":"Department of Applied Physics, University of Eastern Finland, Kuopio, Finland","institution_ids":["https://openalex.org/I175532246"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051527924","display_name":"Antti Lipponen","orcid":"https://orcid.org/0000-0002-6902-9974"},"institutions":[{"id":"https://openalex.org/I175532246","display_name":"University of Eastern Finland","ror":"https://ror.org/00cyydd11","country_code":"FI","type":"education","lineage":["https://openalex.org/I175532246"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Antti Lipponen","raw_affiliation_strings":["Department of Applied Physics, University of Eastern Finland, Kuopio, Finland"],"affiliations":[{"raw_affiliation_string":"Department of Applied Physics, University of Eastern Finland, Kuopio, Finland","institution_ids":["https://openalex.org/I175532246"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086475373","display_name":"Tuomo Savolainen","orcid":null},"institutions":[{"id":"https://openalex.org/I175532246","display_name":"University of Eastern Finland","ror":"https://ror.org/00cyydd11","country_code":"FI","type":"education","lineage":["https://openalex.org/I175532246"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Tuomo Savolainen","raw_affiliation_strings":["Department of Applied Physics, University of Eastern Finland, Kuopio, Finland"],"affiliations":[{"raw_affiliation_string":"Department of Applied Physics, University of Eastern Finland, Kuopio, Finland","institution_ids":["https://openalex.org/I175532246"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108799609","display_name":"Anssi Lehikoinen","orcid":null},"institutions":[{"id":"https://openalex.org/I175532246","display_name":"University of Eastern Finland","ror":"https://ror.org/00cyydd11","country_code":"FI","type":"education","lineage":["https://openalex.org/I175532246"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Anssi Lehikoinen","raw_affiliation_strings":["Department of Applied Physics, University of Eastern Finland, Kuopio, Finland"],"affiliations":[{"raw_affiliation_string":"Department of Applied Physics, University of Eastern Finland, Kuopio, Finland","institution_ids":["https://openalex.org/I175532246"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034132148","display_name":"Marko Vauhkonen","orcid":"https://orcid.org/0000-0001-6454-8524"},"institutions":[{"id":"https://openalex.org/I175532246","display_name":"University of Eastern Finland","ror":"https://ror.org/00cyydd11","country_code":"FI","type":"education","lineage":["https://openalex.org/I175532246"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Marko Vauhkonen","raw_affiliation_strings":["Department of Applied Physics, University of Eastern Finland, Kuopio, Finland"],"affiliations":[{"raw_affiliation_string":"Department of Applied Physics, University of Eastern Finland, Kuopio, Finland","institution_ids":["https://openalex.org/I175532246"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037873130","display_name":"Jari P. Kaipio","orcid":"https://orcid.org/0000-0002-7392-5149"},"institutions":[{"id":"https://openalex.org/I154130895","display_name":"University of Auckland","ror":"https://ror.org/03b94tp07","country_code":"NZ","type":"education","lineage":["https://openalex.org/I154130895"]},{"id":"https://openalex.org/I175532246","display_name":"University of Eastern Finland","ror":"https://ror.org/00cyydd11","country_code":"FI","type":"education","lineage":["https://openalex.org/I175532246"]}],"countries":["FI","NZ"],"is_corresponding":false,"raw_author_name":"Jari P. Kaipio","raw_affiliation_strings":["Department of Applied Physics, University of Eastern Finland, Kuopio, Finland","Department of Mathematics, University of Auckland, Auckland, New Zealand"],"affiliations":[{"raw_affiliation_string":"Department of Applied Physics, University of Eastern Finland, Kuopio, Finland","institution_ids":["https://openalex.org/I175532246"]},{"raw_affiliation_string":"Department of Mathematics, University of Auckland, Auckland, New Zealand","institution_ids":["https://openalex.org/I154130895"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5032158182"],"corresponding_institution_ids":["https://openalex.org/I175532246"],"apc_list":null,"apc_paid":null,"fwci":0.7365,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.7244842,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"61","issue":"10","first_page":"2665","last_page":"2681"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9879000186920166,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.8005408048629761},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.7450928688049316},{"id":"https://openalex.org/keywords/computational-complexity-theory","display_name":"Computational complexity theory","score":0.6056578159332275},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5750089883804321},{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.4805453419685364},{"id":"https://openalex.org/keywords/computational-model","display_name":"Computational model","score":0.471381276845932},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.45673394203186035},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.4519875943660736},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.4403933584690094},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.31225940585136414},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14952287077903748},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.10434237122535706}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.8005408048629761},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.7450928688049316},{"id":"https://openalex.org/C179799912","wikidata":"https://www.wikidata.org/wiki/Q205084","display_name":"Computational complexity theory","level":2,"score":0.6056578159332275},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5750089883804321},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.4805453419685364},{"id":"https://openalex.org/C66024118","wikidata":"https://www.wikidata.org/wiki/Q1122506","display_name":"Computational model","level":2,"score":0.471381276845932},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.45673394203186035},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.4519875943660736},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4403933584690094},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.31225940585136414},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14952287077903748},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10434237122535706},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2012.2196394","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2196394","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":55,"referenced_works":["https://openalex.org/W201848369","https://openalex.org/W373739789","https://openalex.org/W1492326914","https://openalex.org/W1522399516","https://openalex.org/W1531455566","https://openalex.org/W1969696351","https://openalex.org/W1970881541","https://openalex.org/W1971508657","https://openalex.org/W1983546683","https://openalex.org/W1983834579","https://openalex.org/W1991147865","https://openalex.org/W1992676433","https://openalex.org/W2000144389","https://openalex.org/W2005681075","https://openalex.org/W2006297613","https://openalex.org/W2007755353","https://openalex.org/W2009814556","https://openalex.org/W2011262375","https://openalex.org/W2013863723","https://openalex.org/W2018891925","https://openalex.org/W2026123674","https://openalex.org/W2029769078","https://openalex.org/W2033722422","https://openalex.org/W2035386256","https://openalex.org/W2036250930","https://openalex.org/W2052625285","https://openalex.org/W2053510218","https://openalex.org/W2053722533","https://openalex.org/W2058187269","https://openalex.org/W2063037831","https://openalex.org/W2070314539","https://openalex.org/W2080615127","https://openalex.org/W2080836989","https://openalex.org/W2095273336","https://openalex.org/W2095287488","https://openalex.org/W2100203145","https://openalex.org/W2103520741","https://openalex.org/W2110930262","https://openalex.org/W2111805630","https://openalex.org/W2112890043","https://openalex.org/W2125166708","https://openalex.org/W2141002303","https://openalex.org/W2144594303","https://openalex.org/W2159280435","https://openalex.org/W2166981273","https://openalex.org/W2170164530","https://openalex.org/W2261002446","https://openalex.org/W2293807537","https://openalex.org/W2334039696","https://openalex.org/W2503900448","https://openalex.org/W2790374560","https://openalex.org/W3099514962","https://openalex.org/W4250857377","https://openalex.org/W4292166829","https://openalex.org/W4300851040"],"related_works":["https://openalex.org/W3211685995","https://openalex.org/W2532315310","https://openalex.org/W2000128178","https://openalex.org/W2902419700","https://openalex.org/W3160616384","https://openalex.org/W2905540725","https://openalex.org/W4376629886","https://openalex.org/W2101428392","https://openalex.org/W2537891456","https://openalex.org/W2215273690"],"abstract_inverted_index":{"Computational":[0],"cost":[1,48,75,118],"of":[2,16,29,49,59,76,97,101,138],"image":[3,50,83,121],"reconstruction":[4,84,122],"in":[5,23,32,94,108,119,131],"electrical":[6],"impedance":[7],"tomography":[8],"(EIT)":[9],"is":[10,86,106],"generally":[11],"very":[12,148],"high.":[13],"Time":[14],"consumption":[15],"data":[17],"processing":[18],"can":[19,123],"be":[20,124],"prohibitive":[21],"particularly":[22],"systems":[24],"intended":[25],"for":[26],"continuous":[27],"monitoring":[28],"time-varying":[30],"targets":[31],"various":[33],"applications.":[34],"Recently,":[35],"two":[36],"promising":[37],"approximate":[38],"computational":[39,47,62,74,117],"approaches":[40,53],"have":[41],"been":[42],"proposed":[43,103],"to":[44,71,89],"reduce":[45,72],"the":[46,60,73,95,102,139,142,145],"reconstruction.":[51],"These":[52],"are":[54,147],"based":[55],"on":[56,144],"reduced-order":[57,104,128,136],"approximation":[58],"associated":[61],"models.":[63],"In":[64],"this":[65],"paper,":[66],"we":[67],"utilize":[68],"these":[69],"techniques":[70],"3-D":[77],"nonstationary":[78,120],"EIT":[79],"imaging":[80],"when":[81],"high":[82],"rate":[85],"required":[87],"due":[88],"rapid":[90],"changes":[91],"or":[92],"instabilities":[93],"target":[96],"interest.":[98],"The":[99,113],"feasibility":[100],"approach":[105],"evaluated":[107],"simulation":[109],"and":[110,130],"experimental":[111],"studies.":[112],"results":[114],"show":[115],"that":[116],"decreased":[125],"significantly":[126],"with":[127,133],"modeling,":[129],"addition,":[132],"an":[134],"appropriate":[135],"representation":[137],"system":[140],"state,":[141],"effects":[143],"accuracy":[146],"small.":[149]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}