{"id":"https://openalex.org/W2093576830","doi":"https://doi.org/10.1109/tim.2012.2196389","title":"Compact Ka-Band One-Port Vector Reflectometer Using a Wideband Electronically Controlled Phase Shifter","display_name":"Compact Ka-Band One-Port Vector Reflectometer Using a Wideband Electronically Controlled Phase Shifter","publication_year":2012,"publication_date":"2012-06-12","ids":{"openalex":"https://openalex.org/W2093576830","doi":"https://doi.org/10.1109/tim.2012.2196389","mag":"2093576830"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2012.2196389","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2196389","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103538000","display_name":"Mojtaba Fallahpour","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mojtaba Fallahpour","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021915029","display_name":"Mark A. Baumgartner","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mark A. Baumgartner","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024629622","display_name":"Arpit Kothari","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arpit Kothari","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110664538","display_name":"Mohammad Tayeb Ghasr","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammad Tayeb Ghasr","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058942455","display_name":"David Pommerenke","orcid":"https://orcid.org/0000-0002-0649-8159"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Pommerenke","raw_affiliation_strings":["Electromagnetic Compatibility Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electromagnetic Compatibility Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088505165","display_name":"Reza Zoughi","orcid":"https://orcid.org/0000-0001-9421-1551"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Reza Zoughi","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I20382870"],"apc_list":null,"apc_paid":null,"fwci":1.2491,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.82290371,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"61","issue":"10","first_page":"2807","last_page":"2816"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wideband","display_name":"Wideband","score":0.8750834465026855},{"id":"https://openalex.org/keywords/phase-shift-module","display_name":"Phase shift module","score":0.7906785607337952},{"id":"https://openalex.org/keywords/ka-band","display_name":"Ka band","score":0.7015935182571411},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.5902947187423706},{"id":"https://openalex.org/keywords/port","display_name":"Port (circuit theory)","score":0.5640384554862976},{"id":"https://openalex.org/keywords/broadband","display_name":"Broadband","score":0.5361781716346741},{"id":"https://openalex.org/keywords/frequency-band","display_name":"Frequency band","score":0.5096397399902344},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.507815420627594},{"id":"https://openalex.org/keywords/pin-diode","display_name":"PIN diode","score":0.4973304569721222},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45990607142448425},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4166816771030426},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3956685960292816},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3686376214027405},{"id":"https://openalex.org/keywords/insertion-loss","display_name":"Insertion loss","score":0.24142268300056458},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2002951204776764}],"concepts":[{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.8750834465026855},{"id":"https://openalex.org/C103864889","wikidata":"https://www.wikidata.org/wiki/Q4480524","display_name":"Phase shift module","level":3,"score":0.7906785607337952},{"id":"https://openalex.org/C2777720951","wikidata":"https://www.wikidata.org/wiki/Q967772","display_name":"Ka band","level":2,"score":0.7015935182571411},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.5902947187423706},{"id":"https://openalex.org/C32802771","wikidata":"https://www.wikidata.org/wiki/Q2443617","display_name":"Port (circuit theory)","level":2,"score":0.5640384554862976},{"id":"https://openalex.org/C509933004","wikidata":"https://www.wikidata.org/wiki/Q194163","display_name":"Broadband","level":2,"score":0.5361781716346741},{"id":"https://openalex.org/C2778116611","wikidata":"https://www.wikidata.org/wiki/Q25110567","display_name":"Frequency band","level":3,"score":0.5096397399902344},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.507815420627594},{"id":"https://openalex.org/C52236655","wikidata":"https://www.wikidata.org/wiki/Q2628074","display_name":"PIN diode","level":3,"score":0.4973304569721222},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45990607142448425},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4166816771030426},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3956685960292816},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3686376214027405},{"id":"https://openalex.org/C90327742","wikidata":"https://www.wikidata.org/wiki/Q947396","display_name":"Insertion loss","level":2,"score":0.24142268300056458},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2002951204776764}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2012.2196389","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2196389","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6800000071525574,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W2042625099","https://openalex.org/W2078940259","https://openalex.org/W2112228250","https://openalex.org/W2117800123","https://openalex.org/W2126107927","https://openalex.org/W2147955957","https://openalex.org/W2150358678","https://openalex.org/W2158742004","https://openalex.org/W2164726995","https://openalex.org/W2166474737","https://openalex.org/W2168450572","https://openalex.org/W2169555806","https://openalex.org/W2170555881","https://openalex.org/W2554664592","https://openalex.org/W3215366651","https://openalex.org/W6676649110"],"related_works":["https://openalex.org/W2100422776","https://openalex.org/W1882667846","https://openalex.org/W3107591631","https://openalex.org/W3158361031","https://openalex.org/W2150127311","https://openalex.org/W248565965","https://openalex.org/W1109909915","https://openalex.org/W2162424963","https://openalex.org/W4297002520","https://openalex.org/W2124546438"],"abstract_inverted_index":{"In":[0],"this":[1,51],"paper,":[2],"the":[3,39,69,79,89,93,97,112],"design":[4,29,52,95,118],"and":[5,120],"implementation":[6],"of":[7,32,41,50,72,78,99,111],"a":[8,33,43,54,73,101],"compact":[9],"one-port":[10],"Ka-band":[11,23],"(26.5-40":[12],"GHz)":[13],"vector":[14],"reflectometer":[15],"or":[16],"network":[17],"analyzer":[18],"(VNA),":[19],"operating":[20,90],"in":[21,68],"full":[22],"frequency":[24],"range,":[25],"are":[26,123],"presented.":[27,124],"The":[28,46,117],"follows":[30],"that":[31],"recently":[34],"developed":[35],"VNA":[36],"but":[37],"with":[38],"goal":[40],"producing":[42],"wideband":[44,55],"version.":[45],"most":[47],"critical":[48],"component":[49],"is":[53,81],"electronically":[56],"controlled":[57],"phase":[58],"shifter,":[59],"designed":[60],"using":[61,100],"nonuniformly":[62],"spaced":[63],"p-i-n":[64],"diode-loaded":[65],"slots":[66,80],"incorporated":[67],"broad":[70],"wall":[71],"rectangular":[74],"waveguide.":[75],"Nonuniform":[76],"placement":[77],"shown":[82],"to":[83],"significantly":[84],"reduce":[85],"unwanted":[86],"resonances":[87],"within":[88],"bandwidth.":[91],"Also,":[92],"new":[94],"provides":[96],"possibility":[98],"more":[102],"accurate":[103],"three-port":[104],"<i":[105],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[106],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">S</i>":[107],"-parameter":[108],"characterization":[109],"instead":[110],"previously":[113],"used":[114],"two-port":[115],"approach.":[116],"foundation":[119],"measurement":[121],"results":[122]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}