{"id":"https://openalex.org/W1986704908","doi":"https://doi.org/10.1109/tim.2012.2187246","title":"A Matched-Pulse Approach for Soft-Fault Detection in Complex Wire Networks","display_name":"A Matched-Pulse Approach for Soft-Fault Detection in Complex Wire Networks","publication_year":2012,"publication_date":"2012-04-13","ids":{"openalex":"https://openalex.org/W1986704908","doi":"https://doi.org/10.1109/tim.2012.2187246","mag":"1986704908"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2012.2187246","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2187246","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://centralesupelec.hal.science/hal-00658278","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066160862","display_name":"Layane Abboud","orcid":null},"institutions":[{"id":"https://openalex.org/I102197404","display_name":"Universit\u00e9 Paris-Sud","ror":"https://ror.org/028rypz17","country_code":"FR","type":"education","lineage":["https://openalex.org/I102197404"]},{"id":"https://openalex.org/I102475099","display_name":"Sup\u00e9lec","ror":"https://ror.org/00n7gwn90","country_code":"FR","type":"education","lineage":["https://openalex.org/I102475099"]},{"id":"https://openalex.org/I4210097418","display_name":"Laboratoire des signaux et syst\u00e8mes","ror":"https://ror.org/00skw9v43","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I277688954","https://openalex.org/I277688954","https://openalex.org/I4210097418","https://openalex.org/I4210107720"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Layane Abboud","raw_affiliation_strings":["D\u00e9partement de Recherche en \u00c9lectromagn\u00e9tisme, Laboratoire des Signaux et Syst\u00e8mes, UMR 8506, SUPELEC, Centre National de la Recherche Scientifique, Universit\u00e9 Paris-Sud, Gif-sur-Yvette, France","Dept. de Rech. en Electromagn., Univ. Paris-Sud, Gif-sur-Yvette, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"D\u00e9partement de Recherche en \u00c9lectromagn\u00e9tisme, Laboratoire des Signaux et Syst\u00e8mes, UMR 8506, SUPELEC, Centre National de la Recherche Scientifique, Universit\u00e9 Paris-Sud, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I102197404","https://openalex.org/I102475099","https://openalex.org/I4210097418"]},{"raw_affiliation_string":"Dept. de Rech. en Electromagn., Univ. Paris-Sud, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I102197404"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038494700","display_name":"Andr\u00e9a Cozza","orcid":"https://orcid.org/0000-0002-1317-6684"},"institutions":[{"id":"https://openalex.org/I102197404","display_name":"Universit\u00e9 Paris-Sud","ror":"https://ror.org/028rypz17","country_code":"FR","type":"education","lineage":["https://openalex.org/I102197404"]},{"id":"https://openalex.org/I102475099","display_name":"Sup\u00e9lec","ror":"https://ror.org/00n7gwn90","country_code":"FR","type":"education","lineage":["https://openalex.org/I102475099"]},{"id":"https://openalex.org/I4210097418","display_name":"Laboratoire des signaux et syst\u00e8mes","ror":"https://ror.org/00skw9v43","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I277688954","https://openalex.org/I277688954","https://openalex.org/I4210097418","https://openalex.org/I4210107720"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Andrea Cozza","raw_affiliation_strings":["D\u00e9partement de Recherche en \u00c9lectromagn\u00e9tisme, Laboratoire des Signaux et Syst\u00e8mes, UMR 8506, SUPELEC, Centre National de la Recherche Scientifique, Universit\u00e9 Paris-Sud, Gif-sur-Yvette, France","Dept. de Rech. en Electromagn., Univ. Paris-Sud, Gif-sur-Yvette, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"D\u00e9partement de Recherche en \u00c9lectromagn\u00e9tisme, Laboratoire des Signaux et Syst\u00e8mes, UMR 8506, SUPELEC, Centre National de la Recherche Scientifique, Universit\u00e9 Paris-Sud, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I102197404","https://openalex.org/I102475099","https://openalex.org/I4210097418"]},{"raw_affiliation_string":"Dept. de Rech. en Electromagn., Univ. Paris-Sud, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I102197404"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033665690","display_name":"Lionel Pichon","orcid":"https://orcid.org/0000-0002-3402-5498"},"institutions":[{"id":"https://openalex.org/I102197404","display_name":"Universit\u00e9 Paris-Sud","ror":"https://ror.org/028rypz17","country_code":"FR","type":"education","lineage":["https://openalex.org/I102197404"]},{"id":"https://openalex.org/I102475099","display_name":"Sup\u00e9lec","ror":"https://ror.org/00n7gwn90","country_code":"FR","type":"education","lineage":["https://openalex.org/I102475099"]},{"id":"https://openalex.org/I204730241","display_name":"Universit\u00e9 Paris Cit\u00e9","ror":"https://ror.org/05f82e368","country_code":"FR","type":"education","lineage":["https://openalex.org/I204730241"]},{"id":"https://openalex.org/I3019908861","display_name":"Laboratoire de G\u00e9nie \u00c9lectrique et \u00c9lectronique de Paris","ror":"https://ror.org/02xnnng09","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I277688954","https://openalex.org/I277688954","https://openalex.org/I3019908861","https://openalex.org/I39804081","https://openalex.org/I4210107720"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Lionel Pichon","raw_affiliation_strings":["Laboratoire de G\u00e9nie \u00c9lectrique de Paris, UMR 8507 SUPELEC, Centre National de la Recherche Scientifique, Universit\u00e9 Paris-Sud, Gif-sur-Yvette, France","Lab. de Genie Electr. de Paris, Univ. Paris Sud, Gif-sur-Yvette, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire de G\u00e9nie \u00c9lectrique de Paris, UMR 8507 SUPELEC, Centre National de la Recherche Scientifique, Universit\u00e9 Paris-Sud, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I102197404","https://openalex.org/I102475099","https://openalex.org/I3019908861"]},{"raw_affiliation_string":"Lab. de Genie Electr. de Paris, Univ. Paris Sud, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I204730241"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.336,"has_fulltext":false,"cited_by_count":45,"citation_normalized_percentile":{"value":0.88373094,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"61","issue":"6","first_page":"1719","last_page":"1732"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9850000143051147,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reflectometry","display_name":"Reflectometry","score":0.9189532995223999},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6590027809143066},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.631085991859436},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5504454970359802},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5451197028160095},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.5279589891433716},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4339011311531067},{"id":"https://openalex.org/keywords/coaxial-cable","display_name":"Coaxial cable","score":0.4324554204940796},{"id":"https://openalex.org/keywords/detection-theory","display_name":"Detection theory","score":0.4255572259426117},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.33955660462379456},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.296011745929718},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.20139062404632568},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.16366812586784363}],"concepts":[{"id":"https://openalex.org/C2778925768","wikidata":"https://www.wikidata.org/wiki/Q3454718","display_name":"Reflectometry","level":3,"score":0.9189532995223999},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6590027809143066},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.631085991859436},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5504454970359802},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5451197028160095},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.5279589891433716},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4339011311531067},{"id":"https://openalex.org/C2777663116","wikidata":"https://www.wikidata.org/wiki/Q183389","display_name":"Coaxial cable","level":3,"score":0.4324554204940796},{"id":"https://openalex.org/C137270730","wikidata":"https://www.wikidata.org/wiki/Q120811","display_name":"Detection theory","level":3,"score":0.4255572259426117},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.33955660462379456},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.296011745929718},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.20139062404632568},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.16366812586784363},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C110925319","wikidata":"https://www.wikidata.org/wiki/Q12855","display_name":"Cable gland","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2012.2187246","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2187246","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-00658278v1","is_oa":true,"landing_page_url":"https://centralesupelec.hal.science/hal-00658278","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement, 2012, 61 (6), pp.1719-1732. ⟨10.1109/TIM.2012.2187246⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-00658278v1","is_oa":true,"landing_page_url":"https://centralesupelec.hal.science/hal-00658278","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement, 2012, 61 (6), pp.1719-1732. ⟨10.1109/TIM.2012.2187246⟩","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W7402440","https://openalex.org/W299550546","https://openalex.org/W365061972","https://openalex.org/W1549185806","https://openalex.org/W1598904332","https://openalex.org/W1830934084","https://openalex.org/W1846270960","https://openalex.org/W1988892855","https://openalex.org/W2016207904","https://openalex.org/W2029879547","https://openalex.org/W2058389918","https://openalex.org/W2088272523","https://openalex.org/W2098027777","https://openalex.org/W2108536434","https://openalex.org/W2110889802","https://openalex.org/W2119698513","https://openalex.org/W2131038988","https://openalex.org/W2134356156","https://openalex.org/W2137868327","https://openalex.org/W2138613835","https://openalex.org/W2140036717","https://openalex.org/W2154611593","https://openalex.org/W2157060392","https://openalex.org/W2166252671","https://openalex.org/W2294770856","https://openalex.org/W2544957086","https://openalex.org/W4285719527","https://openalex.org/W4296262041","https://openalex.org/W4299909646","https://openalex.org/W6638706956"],"related_works":["https://openalex.org/W2971284929","https://openalex.org/W3046000334","https://openalex.org/W3184095098","https://openalex.org/W4247269142","https://openalex.org/W2396133027","https://openalex.org/W2084522216","https://openalex.org/W1493885512","https://openalex.org/W2021460492","https://openalex.org/W2998346792","https://openalex.org/W2169212713"],"abstract_inverted_index":{"The":[0,52],"idea":[1],"of":[2,42,44,55,63,111,159],"matched-pulse":[3],"(MP)":[4],"reflectometry":[5,22,72,171],"is":[6,27,59,76,95,119,139,149],"here":[7],"introduced":[8],"as":[9,37,100,128,134,136],"an":[10,45,49,131],"improvement":[11,155],"for":[12,125,169],"fault-detection":[13],"techniques":[14,103],"in":[15,34,108,156,163],"wire":[16],"networks.":[17,114],"As":[18],"opposed":[19,96],"to":[20,38,48,69,97,121,151],"existing":[21],"methods,":[23],"the":[24,40,79,82,84,86,89,109,112,116,137,146,157],"testing":[25],"signal":[26],"network":[28],"dependent":[29],"and":[30,32],"self-adaptive":[31],"designed":[33],"a":[35,64,153],"way":[36],"maximize":[39],"probability":[41],"detection":[43,53,106],"echo":[46],"associated":[47],"eventual":[50],"fault.":[51],"performance":[54,87,133],"this":[56],"novel":[57],"technique":[58],"investigated":[60],"by":[61],"means":[62],"mathematical":[65],"analysis":[66],"comparing":[67],"it":[68,129],"standard":[70,101,170],"time-domain":[71],"(TDR)":[73],"methods.":[74],"It":[75],"proven":[77],"that":[78,88,145,165],"more":[80],"complex":[81,113,186],"network,":[83],"better":[85],"MP":[90,117,147],"approach":[91,118,148],"will":[92],"provide.":[93],"This":[94],"common":[98],"understanding,":[99],"TDR":[102],"yield":[104],"degrading":[105],"probabilities":[107],"case":[110],"Furthermore,":[115],"shown":[120],"be":[122],"particularly":[123,173],"interesting":[124],"soft-fault":[126],"detection,":[127],"provides":[130],"improved":[132],"soon":[135],"fault":[138],"weakly":[140],"reflective.":[141],"Our":[142],"findings":[143],"show":[144],"expected":[150],"bring":[152],"substantial":[154],"likelihood":[158],"properly":[160],"detecting":[161],"faults":[162],"configurations":[164],"are":[166],"deemed":[167],"critical":[168],"techniques,":[172],"when":[174],"dealing":[175],"with":[176],"noisy":[177],"networks":[178,187],"under":[179],"test.":[180],"Experimental":[181],"results":[182],"measured":[183],"on":[184],"coaxial":[185],"support":[188],"these":[189],"claims.":[190]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":9},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}