{"id":"https://openalex.org/W1871892944","doi":"https://doi.org/10.1109/tim.2012.2186475","title":"$\\ell_{1}$-Norm-Based Reconstruction Algorithm for Particle Sizing","display_name":"$\\ell_{1}$-Norm-Based Reconstruction Algorithm for Particle Sizing","publication_year":2012,"publication_date":"2012-02-23","ids":{"openalex":"https://openalex.org/W1871892944","doi":"https://doi.org/10.1109/tim.2012.2186475","mag":"1871892944"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2012.2186475","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2186475","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043551995","display_name":"Lijun Xu","orcid":"https://orcid.org/0000-0003-0488-9604"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijun Xu","raw_affiliation_strings":["Key Laboratory of Precision Opto-mechatronics Technology of Ministry of Education, School of Instrument Science and Opto-Electronic Engineering, Beihang University, Beijing, China","School of Instrument Science and Opto-Electronics Engineering,Beihang University,Beijing 100191,China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Precision Opto-mechatronics Technology of Ministry of Education, School of Instrument Science and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Instrument Science and Opto-Electronics Engineering,Beihang University,Beijing 100191,China)","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049457213","display_name":"Xin Lei","orcid":"https://orcid.org/0000-0002-4400-4068"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Xin","raw_affiliation_strings":["Key Laboratory of Precision Opto-mechatronics Technology of Ministry of Education, School of Instrument Science and Opto-Electronic Engineering, Beihang University, Beijing, China","School of Instrument Science and Opto-Electronics Engineering,Beihang University,Beijing 100191,China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Precision Opto-mechatronics Technology of Ministry of Education, School of Instrument Science and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Instrument Science and Opto-Electronics Engineering,Beihang University,Beijing 100191,China)","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100635854","display_name":"Zhang Cao","orcid":"https://orcid.org/0000-0003-3649-9512"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhang Cao","raw_affiliation_strings":["Key Laboratory of Precision Opto-mechatronics Technology of Ministry of Education, School of Instrument Science and Opto-Electronic Engineering, Beihang University, Beijing, China","School of Instrument Science and Opto-Electronics Engineering,Beihang University,Beijing 100191,China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Precision Opto-mechatronics Technology of Ministry of Education, School of Instrument Science and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Instrument Science and Opto-Electronics Engineering,Beihang University,Beijing 100191,China)","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":1.5394,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.80359557,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"61","issue":"5","first_page":"1395","last_page":"1404"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6641055941581726},{"id":"https://openalex.org/keywords/tikhonov-regularization","display_name":"Tikhonov regularization","score":0.6384665966033936},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.4739915430545807},{"id":"https://openalex.org/keywords/singular-value-decomposition","display_name":"Singular value decomposition","score":0.4466603994369507},{"id":"https://openalex.org/keywords/norm","display_name":"Norm (philosophy)","score":0.437738299369812},{"id":"https://openalex.org/keywords/sizing","display_name":"Sizing","score":0.41105133295059204},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3845001757144928},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3544817566871643},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.22413435578346252}],"concepts":[{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6641055941581726},{"id":"https://openalex.org/C152442038","wikidata":"https://www.wikidata.org/wiki/Q2778212","display_name":"Tikhonov regularization","level":3,"score":0.6384665966033936},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.4739915430545807},{"id":"https://openalex.org/C22789450","wikidata":"https://www.wikidata.org/wiki/Q420904","display_name":"Singular value decomposition","level":2,"score":0.4466603994369507},{"id":"https://openalex.org/C191795146","wikidata":"https://www.wikidata.org/wiki/Q3878446","display_name":"Norm (philosophy)","level":2,"score":0.437738299369812},{"id":"https://openalex.org/C2777767291","wikidata":"https://www.wikidata.org/wiki/Q1080291","display_name":"Sizing","level":2,"score":0.41105133295059204},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3845001757144928},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3544817566871643},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.22413435578346252},{"id":"https://openalex.org/C135252773","wikidata":"https://www.wikidata.org/wiki/Q1567213","display_name":"Inverse problem","level":2,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2012.2186475","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2186475","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W2234675","https://openalex.org/W1600728856","https://openalex.org/W1602477091","https://openalex.org/W1965189471","https://openalex.org/W1970235890","https://openalex.org/W1975421281","https://openalex.org/W1978526328","https://openalex.org/W1978974669","https://openalex.org/W1981988315","https://openalex.org/W2003436792","https://openalex.org/W2007853356","https://openalex.org/W2011493304","https://openalex.org/W2043486888","https://openalex.org/W2044059769","https://openalex.org/W2072255080","https://openalex.org/W2080223112","https://openalex.org/W2081611005","https://openalex.org/W2094859992","https://openalex.org/W2096209294","https://openalex.org/W2101095383","https://openalex.org/W2159419754","https://openalex.org/W2296616510","https://openalex.org/W2488606808","https://openalex.org/W2488659368","https://openalex.org/W2886893488","https://openalex.org/W2994988665","https://openalex.org/W3022380717","https://openalex.org/W3148394042","https://openalex.org/W4241214195","https://openalex.org/W4250955649","https://openalex.org/W6670698163"],"related_works":["https://openalex.org/W2375311683","https://openalex.org/W3131586246","https://openalex.org/W2366062860","https://openalex.org/W2373777250","https://openalex.org/W2353956655","https://openalex.org/W2020653254","https://openalex.org/W2010454064","https://openalex.org/W2352072014","https://openalex.org/W217279133","https://openalex.org/W2373436489"],"abstract_inverted_index":{"An":[0],"l1-norm-based":[1,59,100,164],"reconstruction":[2],"algorithm":[3,101,108],"for":[4,119,135],"particle":[5,142],"sizing":[6],"by":[7,21,38,57,145],"using":[8,22,39],"l1-regularization":[9],"is":[10,123],"introduced":[11],"in":[12,76],"this":[13],"paper.":[14],"Both":[15],"simulation":[16],"and":[17,46,66,116,122,132],"experiment":[18],"were":[19,49,78,88],"conducted":[20],"a":[23,140],"photodiode":[24,85],"array":[25,86],"detector":[26,87],"to":[27,52,74,113,126],"evaluate":[28],"the":[29,32,58,84,99,114,127,130,160,163],"performance":[30],"of":[31,69,83,162],"algorithm.":[33,60,165],"Particle":[34],"size":[35,149],"distributions":[36,68],"retrieved":[37],"Chahine,":[40],"truncated":[41],"singular":[42],"value":[43],"decomposition":[44],"(TSVD),":[45],"Tikhonov":[47,117,133],"algorithms":[48,118,134],"also":[50,110],"obtained":[51,56],"compare":[53],"with":[54,147],"that":[55,98],"In":[61,138],"computer":[62],"simulation,":[63],"Rosin-Rammler,":[64],"normal,":[65],"lognormal":[67],"spherical":[70],"particles":[71,146],"from":[72],"7.6":[73],"98":[75],"diameter":[77],"created.":[79],"The":[80,156],"measurement":[81],"data":[82,121],"generated":[89],"based":[90],"on":[91],"Fraunhofer":[92],"diffraction":[93],"theory.":[94],"Simulation":[95],"results":[96,158],"show":[97],"not":[102],"only":[103],"performs":[104,111],"better":[105],"than":[106,129],"Chahine":[107],"but":[109],"similar":[112],"TSVD":[115,131],"noise-free":[120],"less":[124],"sensitive":[125],"noise":[128],"noise-contaminated":[136],"data.":[137],"experiment,":[139],"standard":[141],"plate":[143],"covered":[144],"known":[148],"distribution,":[150,153],"i.e.,":[151],"Rosin-Rammler":[152],"was":[154],"used.":[155],"experimental":[157],"validated":[159],"effectiveness":[161]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}