{"id":"https://openalex.org/W1964270989","doi":"https://doi.org/10.1109/tim.2012.2184190","title":"Quantitative Evaluation of Impacts of Random Errors on ALS Accuracy Using Multiple Linear Regression Method","display_name":"Quantitative Evaluation of Impacts of Random Errors on ALS Accuracy Using Multiple Linear Regression Method","publication_year":2012,"publication_date":"2012-03-19","ids":{"openalex":"https://openalex.org/W1964270989","doi":"https://doi.org/10.1109/tim.2012.2184190","mag":"1964270989"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2012.2184190","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2184190","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072353979","display_name":"Jianjun Wang","orcid":"https://orcid.org/0000-0001-7039-7136"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jianjun Wang","raw_affiliation_strings":["State Key Laboratory of Inertial Science and Technology, School of Instrument Science and Opto-Electronic Engineering, Beihang University, Beijing, China","State Key Lab. of Inertial Sci. & Technol., Beihang Univ., Beijing, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Inertial Science and Technology, School of Instrument Science and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"State Key Lab. of Inertial Sci. & Technol., Beihang Univ., Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043551995","display_name":"Lijun Xu","orcid":"https://orcid.org/0000-0003-0488-9604"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijun Xu","raw_affiliation_strings":["Laboratory of Precision Opto-Mechatronics Technology of Ministry of Education, School of Instrument Science and Opto-Electronic Engineering, Beihang University, Beijing, China","Key Lab. of Precision Opto-Mechatron. Technol. of Minist. of Educ., Beihang Univ., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Laboratory of Precision Opto-Mechatronics Technology of Ministry of Education, School of Instrument Science and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Key Lab. of Precision Opto-Mechatron. Technol. of Minist. of Educ., Beihang Univ., Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100382142","display_name":"Xiaolu Li","orcid":"https://orcid.org/0000-0002-2550-5676"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaolu Li","raw_affiliation_strings":["State Key Laboratory of Inertial Science and Technology, School of Instrument Science and Opto-Electronic Engineering, Beihang University, Beijing, China","State Key Lab. of Inertial Sci. & Technol., Beihang Univ., Beijing, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Inertial Science and Technology, School of Instrument Science and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"State Key Lab. of Inertial Sci. & Technol., Beihang Univ., Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087931041","display_name":"Zhongyi Quan","orcid":"https://orcid.org/0000-0001-5612-0296"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhongyi Quan","raw_affiliation_strings":["State Key Laboratory of Inertial Science and Technology, School of Instrument Science and Opto-Electronic Engineering, Beihang University, Beijing, China","State Key Lab. of Inertial Sci. & Technol., Beihang Univ., Beijing, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Inertial Science and Technology, School of Instrument Science and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"State Key Lab. of Inertial Sci. & Technol., Beihang Univ., Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5072353979"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":1.5088,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.8126961,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"61","issue":"8","first_page":"2242","last_page":"2252"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11164","display_name":"Remote Sensing and LiDAR Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11164","display_name":"Remote Sensing and LiDAR Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/random-error","display_name":"Random error","score":0.7119218707084656},{"id":"https://openalex.org/keywords/linear-regression","display_name":"Linear regression","score":0.569096028804779},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.5292769074440002},{"id":"https://openalex.org/keywords/tilt","display_name":"Tilt (camera)","score":0.5264628529548645},{"id":"https://openalex.org/keywords/regression","display_name":"Regression","score":0.4836341142654419},{"id":"https://openalex.org/keywords/sort","display_name":"sort","score":0.45351994037628174},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.45231691002845764},{"id":"https://openalex.org/keywords/regression-analysis","display_name":"Regression analysis","score":0.44562000036239624},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.43385428190231323},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4242035150527954},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.41774532198905945},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.39587295055389404},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38263267278671265},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09528765082359314}],"concepts":[{"id":"https://openalex.org/C73782692","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Random error","level":2,"score":0.7119218707084656},{"id":"https://openalex.org/C48921125","wikidata":"https://www.wikidata.org/wiki/Q10861030","display_name":"Linear regression","level":2,"score":0.569096028804779},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.5292769074440002},{"id":"https://openalex.org/C2779844322","wikidata":"https://www.wikidata.org/wiki/Q2919140","display_name":"Tilt (camera)","level":2,"score":0.5264628529548645},{"id":"https://openalex.org/C83546350","wikidata":"https://www.wikidata.org/wiki/Q1139051","display_name":"Regression","level":2,"score":0.4836341142654419},{"id":"https://openalex.org/C88548561","wikidata":"https://www.wikidata.org/wiki/Q347599","display_name":"sort","level":2,"score":0.45351994037628174},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.45231691002845764},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.44562000036239624},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.43385428190231323},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4242035150527954},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.41774532198905945},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.39587295055389404},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38263267278671265},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09528765082359314},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2012.2184190","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2184190","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W875708131","https://openalex.org/W1486094596","https://openalex.org/W1965393380","https://openalex.org/W1976767421","https://openalex.org/W1980980087","https://openalex.org/W1986553925","https://openalex.org/W2010221273","https://openalex.org/W2014567673","https://openalex.org/W2020617337","https://openalex.org/W2027304711","https://openalex.org/W2043871384","https://openalex.org/W2046682121","https://openalex.org/W2091050796","https://openalex.org/W2103707738","https://openalex.org/W2106683083","https://openalex.org/W2109766168","https://openalex.org/W2112606747","https://openalex.org/W2115548309","https://openalex.org/W2124160566","https://openalex.org/W2128133709","https://openalex.org/W2134945520","https://openalex.org/W2139303513","https://openalex.org/W2144242878","https://openalex.org/W2163668095","https://openalex.org/W2306792328","https://openalex.org/W2784677715","https://openalex.org/W4285719527","https://openalex.org/W4301779244","https://openalex.org/W6655654642","https://openalex.org/W6698394597","https://openalex.org/W6747906523"],"related_works":["https://openalex.org/W2220451197","https://openalex.org/W2370122455","https://openalex.org/W4284698423","https://openalex.org/W1600397729","https://openalex.org/W2360832559","https://openalex.org/W1989588780","https://openalex.org/W2386418312","https://openalex.org/W2388364071","https://openalex.org/W2379668504","https://openalex.org/W3128781877"],"abstract_inverted_index":{"The":[0,67,92,114],"formulas":[1],"for":[2,50,121],"error":[3,8,122],"propagation":[4],"from":[5],"the":[6,11,42,47,51,76,79,85,88,95,98,109,128,143,146],"random":[7,48,80,99],"sources":[9],"to":[10,40,61,73,83,133,141],"three-dimensional":[12],"(3-D)":[13],"coordinate":[14,53],"errors":[15,49,54,81,100,139],"of":[16,19,46,78,90,94,97,108,124,145],"laser":[17,22],"footprints":[18],"an":[20,118],"airborne":[21],"scanning":[23],"(ALS)":[24],"system":[25,130],"were":[26,37,71],"deduced.":[27],"Based":[28],"on":[29,87],"large-scale":[30],"sample":[31],"data,":[32],"multiple":[33],"linear":[34],"regression":[35,44,69],"experiments":[36],"carried":[38],"out":[39],"obtain":[41],"standardized":[43,68],"coefficients":[45,70],"3-D":[52],"under":[55],"different":[56],"flight":[57,103],"heights":[58],"(from":[59],"500":[60],"6000":[62],"m":[63],"above":[64],"ground":[65],"level).":[66],"used":[72],"quantitatively":[74],"evaluate":[75],"impacts":[77,86,96],"and":[82,105,140],"sort":[84],"order":[89],"importance.":[91],"variation":[93],"with":[101],"increasing":[102],"height":[104],"tilt":[106],"angle":[107],"mirror":[110],"was":[111],"also":[112],"analyzed.":[113],"experimental":[115],"results":[116],"provide":[117],"important":[119],"guide":[120],"budget":[123],"various":[125],"sensors":[126],"in":[127],"ALS":[129,147],"so":[131],"as":[132],"effectively":[134],"suppress":[135],"or":[136],"compensate":[137],"significant":[138],"improve":[142],"performance":[144],"system.":[148]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}