{"id":"https://openalex.org/W2014999369","doi":"https://doi.org/10.1109/tim.2012.2183429","title":"Uncertainty Analysis in Photovoltaic Cell Parameter Estimation","display_name":"Uncertainty Analysis in Photovoltaic Cell Parameter Estimation","publication_year":2012,"publication_date":"2012-02-10","ids":{"openalex":"https://openalex.org/W2014999369","doi":"https://doi.org/10.1109/tim.2012.2183429","mag":"2014999369"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2012.2183429","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2183429","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081914151","display_name":"Filippo Attivissimo","orcid":"https://orcid.org/0000-0002-2667-8982"},"institutions":[{"id":"https://openalex.org/I68618741","display_name":"Polytechnic University of Bari","ror":"https://ror.org/03c44v465","country_code":"IT","type":"education","lineage":["https://openalex.org/I68618741"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Filippo Attivissimo","raw_affiliation_strings":["Electrical and ElectronicMeasurements Laboratory, Dipartimento di Elettrotecnica ed Elettronica (DEE), Politecnico di Bari, Bari, Italy","Dipt. di Elettrotec. ed Elettron. (DEE), Politec. di Bari, Bari, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and ElectronicMeasurements Laboratory, Dipartimento di Elettrotecnica ed Elettronica (DEE), Politecnico di Bari, Bari, Italy","institution_ids":["https://openalex.org/I68618741"]},{"raw_affiliation_string":"Dipt. di Elettrotec. ed Elettron. (DEE), Politec. di Bari, Bari, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040509788","display_name":"Attilio Di Nisio","orcid":"https://orcid.org/0000-0002-4166-7755"},"institutions":[{"id":"https://openalex.org/I68618741","display_name":"Polytechnic University of Bari","ror":"https://ror.org/03c44v465","country_code":"IT","type":"education","lineage":["https://openalex.org/I68618741"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Attilio Di Nisio","raw_affiliation_strings":["Electrical and ElectronicMeasurements Laboratory, Dipartimento di Elettrotecnica ed Elettronica (DEE), Politecnico di Bari, Bari, Italy","Dipt. di Elettrotec. ed Elettron. (DEE), Politec. di Bari, Bari, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and ElectronicMeasurements Laboratory, Dipartimento di Elettrotecnica ed Elettronica (DEE), Politecnico di Bari, Bari, Italy","institution_ids":["https://openalex.org/I68618741"]},{"raw_affiliation_string":"Dipt. di Elettrotec. ed Elettron. (DEE), Politec. di Bari, Bari, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103681182","display_name":"Mario Savino","orcid":null},"institutions":[{"id":"https://openalex.org/I68618741","display_name":"Polytechnic University of Bari","ror":"https://ror.org/03c44v465","country_code":"IT","type":"education","lineage":["https://openalex.org/I68618741"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Mario Savino","raw_affiliation_strings":["Electrical and ElectronicMeasurements Laboratory, Dipartimento di Elettrotecnica ed Elettronica (DEE), Politecnico di Bari, Bari, Italy","Dipt. di Elettrotec. ed Elettron. (DEE), Politec. di Bari, Bari, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and ElectronicMeasurements Laboratory, Dipartimento di Elettrotecnica ed Elettronica (DEE), Politecnico di Bari, Bari, Italy","institution_ids":["https://openalex.org/I68618741"]},{"raw_affiliation_string":"Dipt. di Elettrotec. ed Elettron. (DEE), Politec. di Bari, Bari, Italy","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019230358","display_name":"Maurizio Spadavecchia","orcid":"https://orcid.org/0000-0002-7827-1156"},"institutions":[{"id":"https://openalex.org/I68618741","display_name":"Polytechnic University of Bari","ror":"https://ror.org/03c44v465","country_code":"IT","type":"education","lineage":["https://openalex.org/I68618741"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Maurizio Spadavecchia","raw_affiliation_strings":["Electrical and ElectronicMeasurements Laboratory, Dipartimento di Elettrotecnica ed Elettronica (DEE), Politecnico di Bari, Bari, Italy","Dipt. di Elettrotec. ed Elettron. (DEE), Politec. di Bari, Bari, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and ElectronicMeasurements Laboratory, Dipartimento di Elettrotecnica ed Elettronica (DEE), Politecnico di Bari, Bari, Italy","institution_ids":["https://openalex.org/I68618741"]},{"raw_affiliation_string":"Dipt. di Elettrotec. ed Elettron. (DEE), Politec. di Bari, Bari, Italy","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I68618741"],"apc_list":null,"apc_paid":null,"fwci":3.6199,"has_fulltext":false,"cited_by_count":94,"citation_normalized_percentile":{"value":0.9316048,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"61","issue":"5","first_page":"1334","last_page":"1342"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10468","display_name":"Photovoltaic System Optimization Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10468","display_name":"Photovoltaic System Optimization Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11276","display_name":"Solar Radiation and Photovoltaics","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10905","display_name":"Solar Thermal and Photovoltaic Systems","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/notation","display_name":"Notation","score":0.7044655680656433},{"id":"https://openalex.org/keywords/photovoltaic-system","display_name":"Photovoltaic system","score":0.5707199573516846},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5438355803489685},{"id":"https://openalex.org/keywords/estimation-theory","display_name":"Estimation theory","score":0.5142337679862976},{"id":"https://openalex.org/keywords/expression","display_name":"Expression (computer science)","score":0.4592137336730957},{"id":"https://openalex.org/keywords/applied-mathematics","display_name":"Applied mathematics","score":0.4158015847206116},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3992357850074768},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3855639696121216},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.37890201807022095},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.34406453371047974},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2711893320083618},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2535616457462311},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20469099283218384},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14755314588546753}],"concepts":[{"id":"https://openalex.org/C45357846","wikidata":"https://www.wikidata.org/wiki/Q2001982","display_name":"Notation","level":2,"score":0.7044655680656433},{"id":"https://openalex.org/C41291067","wikidata":"https://www.wikidata.org/wiki/Q1897785","display_name":"Photovoltaic system","level":2,"score":0.5707199573516846},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5438355803489685},{"id":"https://openalex.org/C167928553","wikidata":"https://www.wikidata.org/wiki/Q1376021","display_name":"Estimation theory","level":2,"score":0.5142337679862976},{"id":"https://openalex.org/C90559484","wikidata":"https://www.wikidata.org/wiki/Q778379","display_name":"Expression (computer science)","level":2,"score":0.4592137336730957},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.4158015847206116},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3992357850074768},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3855639696121216},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.37890201807022095},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.34406453371047974},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2711893320083618},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2535616457462311},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20469099283218384},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14755314588546753},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2012.2183429","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2012.2183429","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1537929396","https://openalex.org/W1975940858","https://openalex.org/W1976162430","https://openalex.org/W1980583028","https://openalex.org/W1984172592","https://openalex.org/W1984819411","https://openalex.org/W1987042884","https://openalex.org/W1993386311","https://openalex.org/W1997648498","https://openalex.org/W2001617431","https://openalex.org/W2032423175","https://openalex.org/W2040332113","https://openalex.org/W2043378395","https://openalex.org/W2045613030","https://openalex.org/W2064658032","https://openalex.org/W2087070363","https://openalex.org/W2088664953","https://openalex.org/W2107848903","https://openalex.org/W2124372128","https://openalex.org/W2131556150","https://openalex.org/W2146246970","https://openalex.org/W2148005350","https://openalex.org/W2149879522","https://openalex.org/W2167818858","https://openalex.org/W2171465843","https://openalex.org/W2171930605"],"related_works":["https://openalex.org/W2504004674","https://openalex.org/W2963177394","https://openalex.org/W1595229445","https://openalex.org/W2498744856","https://openalex.org/W4390482104","https://openalex.org/W322408318","https://openalex.org/W149041114","https://openalex.org/W1965815883","https://openalex.org/W763418848","https://openalex.org/W2024638892"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"a":[3,24,42,90,103],"theoretical":[4,72,112],"approach":[5],"to":[6,64],"evaluate":[7],"the":[8,11,18,46,49,52,55,58,62,66,75,79,82,111,115],"uncertainty":[9],"on":[10,45],"series":[12,83],"and":[13,38,51,84],"shunt":[14,85],"resistances":[15,86],"estimated":[16],"by":[17,32,61,100],"seven-parameter":[19],"(double":[20],"diode)":[21],"model":[22],"of":[23,48,54,74,81,89,102,114],"photovoltaic":[25],"(PV)":[26],"cell":[27],"using":[28],"data":[29],"commonly":[30],"provided":[31],"panel":[33],"manufacturers,":[34],"measured":[35],"environmental":[36],"parameters,":[37,68],"semiempirical":[39],"equations.":[40],"After":[41],"brief":[43],"survey":[44],"state":[47],"art":[50],"treatment":[53],"double-diode":[56],"model,":[57],"procedure":[59],"proposed":[60],"authors,":[63],"estimate":[65],"unknown":[67],"is":[69,93,107],"illustrated.":[70],"The":[71],"expression":[73,113],"uncertainty,":[76],"which":[77],"affects":[78],"estimation":[80],"(namely,$R_{s}$and$R_{\\rm":[87],"sh}$)":[88],"PV":[91],"cell,":[92],"then":[94],"derived.":[95],"A":[96],"statistical":[97],"analysis":[98],"performed":[99],"means":[101],"Monte":[104],"Carlo":[105],"simulation":[106],"in":[108],"agreement":[109],"with":[110],"uncertainty.":[116]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":8},{"year":2017,"cited_by_count":14},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":13},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":6}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}