{"id":"https://openalex.org/W1987855049","doi":"https://doi.org/10.1109/tim.2011.2172116","title":"On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations","display_name":"On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations","publication_year":2011,"publication_date":"2011-11-28","ids":{"openalex":"https://openalex.org/W1987855049","doi":"https://doi.org/10.1109/tim.2011.2172116","mag":"1987855049"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2011.2172116","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2172116","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/hal-00668627","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5114089479","display_name":"Sonia Ben Dhia","orcid":null},"institutions":[{"id":"https://openalex.org/I196454796","display_name":"Institut National des Sciences Appliqu\u00e9es de Toulouse","ror":"https://ror.org/01h8pf755","country_code":"FR","type":"education","lineage":["https://openalex.org/I196454796","https://openalex.org/I4405258862"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Sonia Dhia","raw_affiliation_strings":["INSA Toulouse, Toulouse, Occitanie, FR"],"affiliations":[{"raw_affiliation_string":"INSA Toulouse, Toulouse, Occitanie, FR","institution_ids":["https://openalex.org/I196454796"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013092794","display_name":"Alexandre Boyer","orcid":"https://orcid.org/0000-0003-4955-5915"},"institutions":[{"id":"https://openalex.org/I196454796","display_name":"Institut National des Sciences Appliqu\u00e9es de Toulouse","ror":"https://ror.org/01h8pf755","country_code":"FR","type":"education","lineage":["https://openalex.org/I196454796","https://openalex.org/I4405258862"]},{"id":"https://openalex.org/I190497903","display_name":"Laboratoire d'Analyse et d'Architecture des Syst\u00e8mes","ror":"https://ror.org/03vcm6439","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I134560555","https://openalex.org/I190497903","https://openalex.org/I196454796","https://openalex.org/I205747304","https://openalex.org/I205747304","https://openalex.org/I4210095849","https://openalex.org/I4210159245","https://openalex.org/I4387153255","https://openalex.org/I4405258862","https://openalex.org/I4405258862","https://openalex.org/I4405258862","https://openalex.org/I4405258862"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Alexandre Boyer","raw_affiliation_strings":["Laboratoire d'Analyse et d'Architecture des Syst\u00e8mes\u2013Centre National de la Recherche Scientifique, Institut National des Sciences Appliqu\u00e9es de Toulouse, Toulouse Cedex 7, France","Laboratoire dAnalyse et dArchitecture des Syst\u00e8mes-Centre National de la Recherche Scientifique, Institut National des Sciences Appliqu\u00e9es de Toulouse, France"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Analyse et d'Architecture des Syst\u00e8mes\u2013Centre National de la Recherche Scientifique, Institut National des Sciences Appliqu\u00e9es de Toulouse, Toulouse Cedex 7, France","institution_ids":["https://openalex.org/I190497903","https://openalex.org/I196454796"]},{"raw_affiliation_string":"Laboratoire dAnalyse et dArchitecture des Syst\u00e8mes-Centre National de la Recherche Scientifique, Institut National des Sciences Appliqu\u00e9es de Toulouse, France","institution_ids":["https://openalex.org/I196454796","https://openalex.org/I190497903"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110195842","display_name":"B. Vrignon","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bertrand Vrignon","raw_affiliation_strings":["Freescale Semiconductor, Toulouse, France"],"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Toulouse, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070198841","display_name":"M. Deobarro","orcid":null},"institutions":[{"id":"https://openalex.org/I196454796","display_name":"Institut National des Sciences Appliqu\u00e9es de Toulouse","ror":"https://ror.org/01h8pf755","country_code":"FR","type":"education","lineage":["https://openalex.org/I196454796","https://openalex.org/I4405258862"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Mika\u00ebl Deobarro","raw_affiliation_strings":["Freescale Semiconductor, Toulouse, France","Institut National des Sciences Appliqu\u00e9es de Toulouse, Toulouse Cedex 7, France"],"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Toulouse, France","institution_ids":[]},{"raw_affiliation_string":"Institut National des Sciences Appliqu\u00e9es de Toulouse, Toulouse Cedex 7, France","institution_ids":["https://openalex.org/I196454796"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103464907","display_name":"Thanh Vinh Dinh","orcid":null},"institutions":[{"id":"https://openalex.org/I190497903","display_name":"Laboratoire d'Analyse et d'Architecture des Syst\u00e8mes","ror":"https://ror.org/03vcm6439","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I134560555","https://openalex.org/I190497903","https://openalex.org/I196454796","https://openalex.org/I205747304","https://openalex.org/I205747304","https://openalex.org/I4210095849","https://openalex.org/I4210159245","https://openalex.org/I4387153255","https://openalex.org/I4405258862","https://openalex.org/I4405258862","https://openalex.org/I4405258862","https://openalex.org/I4405258862"]},{"id":"https://openalex.org/I4210108471","display_name":"Le Mans Universit\u00e9","ror":"https://ror.org/01mtcc283","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210108471"]},{"id":"https://openalex.org/I196454796","display_name":"Institut National des Sciences Appliqu\u00e9es de Toulouse","ror":"https://ror.org/01h8pf755","country_code":"FR","type":"education","lineage":["https://openalex.org/I196454796","https://openalex.org/I4405258862"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Thanh Vinh Dinh","raw_affiliation_strings":["Laboratoire d'Analyse et d'Architecture des Syst\u00e8mes\u2013Centre National de la Recherche Scientifique, Institut National des Sciences Appliqu\u00e9es de Toulouse, Toulouse Cedex 7, France","Universit\u00e9 du Maine, France"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Analyse et d'Architecture des Syst\u00e8mes\u2013Centre National de la Recherche Scientifique, Institut National des Sciences Appliqu\u00e9es de Toulouse, Toulouse Cedex 7, France","institution_ids":["https://openalex.org/I190497903","https://openalex.org/I196454796"]},{"raw_affiliation_string":"Universit\u00e9 du Maine, France","institution_ids":["https://openalex.org/I4210108471"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5114089479"],"corresponding_institution_ids":["https://openalex.org/I196454796"],"apc_list":null,"apc_paid":null,"fwci":2.1197,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.8764474,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"61","issue":"3","first_page":"696","last_page":"707"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"Electromagnetic compatibility","score":0.7409349679946899},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6596603989601135},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6492826342582703},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.510062038898468},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.485696405172348},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.4496038556098938},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.427750825881958},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4219646751880646},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3856889307498932},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3814378082752228}],"concepts":[{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.7409349679946899},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6596603989601135},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6492826342582703},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.510062038898468},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.485696405172348},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.4496038556098938},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.427750825881958},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4219646751880646},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3856889307498932},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3814378082752228},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2011.2172116","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2172116","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-00668627v1","is_oa":true,"landing_page_url":"https://hal.science/hal-00668627","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement, 2012, 61 (3), pp.696. ⟨10.1109/TIM.2011.2172116⟩","raw_type":"Journal articles"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-00668627v1","is_oa":true,"landing_page_url":"https://hal.science/hal-00668627","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement, 2012, 61 (3), pp.696. ⟨10.1109/TIM.2011.2172116⟩","raw_type":"Journal articles"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.550000011920929}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1584724654","https://openalex.org/W1651840573","https://openalex.org/W1995460436","https://openalex.org/W1996720205","https://openalex.org/W2037702742","https://openalex.org/W2070464882","https://openalex.org/W2103059310","https://openalex.org/W2103921738","https://openalex.org/W2111944961","https://openalex.org/W2116403123","https://openalex.org/W2121893773","https://openalex.org/W2122488218","https://openalex.org/W2130738940","https://openalex.org/W2134131335","https://openalex.org/W2141592563","https://openalex.org/W2160423692","https://openalex.org/W2169686654","https://openalex.org/W2288998059","https://openalex.org/W2788602650","https://openalex.org/W4243410014","https://openalex.org/W4250936563","https://openalex.org/W6681436805","https://openalex.org/W6683961774","https://openalex.org/W6684930544","https://openalex.org/W6748979656"],"related_works":["https://openalex.org/W4230660276","https://openalex.org/W1921091955","https://openalex.org/W1589192924","https://openalex.org/W2041511579","https://openalex.org/W3045840497","https://openalex.org/W101509408","https://openalex.org/W2124450871","https://openalex.org/W4312812552","https://openalex.org/W2077896430","https://openalex.org/W4232043668"],"abstract_inverted_index":{"With":[0],"the":[1,10,64,76,87,99,120],"growing":[2],"concerns":[3],"about":[4],"electromagnetic":[5,82],"compatibility":[6],"of":[7,21,32,78,86,98,101,114,117,125],"integrated":[8],"circuits,":[9],"need":[11],"for":[12,25,37,51],"accurate":[13],"prediction":[14],"tools":[15],"and":[16,40,91,122],"models":[17],"to":[18,62,75,81,105],"reduce":[19],"risks":[20],"noncompliance":[22],"becomes":[23],"critical":[24],"circuit":[26,79,121],"designers.":[27],"However,":[28],"an":[29,70],"on-chip":[30,45,56,71],"characterization":[31,113],"noise":[33,72],"is":[34,93],"still":[35],"necessary":[36],"model":[38],"validation":[39],"design":[41],"optimization.":[42],"Although":[43],"different":[44],"measurement":[46,57,89],"solutions":[47],"have":[48,59],"been":[49,60],"proposed":[50,61,94],"emission":[52],"issue":[53],"characterization,":[54],"no":[55],"methods":[58],"address":[63],"susceptibility":[65,80,100],"issues.":[66],"This":[67],"paper":[68],"presents":[69],"sensor":[73,88],"dedicated":[74],"study":[77,97],"interferences.":[83,107],"A":[84],"demonstration":[85],"performances":[90],"benefits":[92],"through":[95],"a":[96,102,111,123],"digital":[103],"core":[104],"conducted":[106],"Sensor":[108],"measurements":[109],"ensure":[110],"better":[112],"actual":[115],"coupling":[116],"interferences":[118],"within":[119],"diagnosis":[124],"failure":[126],"origins.":[127]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":9},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}