{"id":"https://openalex.org/W2010250147","doi":"https://doi.org/10.1109/tim.2011.2164836","title":"Fuel-Type Identification Using Joint Probability Density Arbiter and Soft-Computing Techniques","display_name":"Fuel-Type Identification Using Joint Probability Density Arbiter and Soft-Computing Techniques","publication_year":2011,"publication_date":"2011-09-22","ids":{"openalex":"https://openalex.org/W2010250147","doi":"https://doi.org/10.1109/tim.2011.2164836","mag":"2010250147"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2011.2164836","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2164836","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043551995","display_name":"Lijun Xu","orcid":"https://orcid.org/0000-0003-0488-9604"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Lijun Xu","raw_affiliation_strings":["School of Instrumentation Science and Opto-Electronic Engineering, Beihang University, Beijing, China","[Sch. of Instrum. Sci. & Opto-Electron. Eng., Beihang Univ., Beijing, China]"],"affiliations":[{"raw_affiliation_string":"School of Instrumentation Science and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"[Sch. of Instrum. Sci. & Opto-Electron. Eng., Beihang Univ., Beijing, China]","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006542157","display_name":"Cheng Tan","orcid":"https://orcid.org/0000-0002-8639-923X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Cheng Tan","raw_affiliation_strings":["School of Instrumentation Science and Opto-Electronic Engineering, Beihang University, Beijing, China","[Sch. of Instrum. Sci. & Opto-Electron. Eng., Beihang Univ., Beijing, China]"],"affiliations":[{"raw_affiliation_string":"School of Instrumentation Science and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"[Sch. of Instrum. Sci. & Opto-Electron. Eng., Beihang Univ., Beijing, China]","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100422241","display_name":"Xiaomin Li","orcid":"https://orcid.org/0000-0003-2326-6410"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaomin Li","raw_affiliation_strings":["School of Chemistry and Environment, Beihang University, Beijing, China","School of Instrumentation Science and Opto-Electronic Engineering, Beihang University, Beijing, China","Sch. of Chem. & Environ., Beihang Univ., Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Chemistry and Environment, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Instrumentation Science and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Sch. of Chem. & Environ., Beihang Univ., Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101690337","display_name":"Yanting Cheng","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanting Cheng","raw_affiliation_strings":["School of Instrumentation Science and Opto-Electronic Engineering, Beihang University, Beijing, China","[Sch. of Instrum. Sci. & Opto-Electron. Eng., Beihang Univ., Beijing, China]"],"affiliations":[{"raw_affiliation_string":"School of Instrumentation Science and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"[Sch. of Instrum. Sci. & Opto-Electron. Eng., Beihang Univ., Beijing, China]","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100382142","display_name":"Xiaolu Li","orcid":"https://orcid.org/0000-0002-2550-5676"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaolu Li","raw_affiliation_strings":["School of Chemistry and Environment, Beihang University, Beijing, China","School of Instrumentation Science and Opto-Electronic Engineering, Beihang University, Beijing, China","[Sch. of Instrum. Sci. & Opto-Electron. Eng., Beihang Univ., Beijing, China]"],"affiliations":[{"raw_affiliation_string":"School of Chemistry and Environment, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Instrumentation Science and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"[Sch. of Instrum. Sci. & Opto-Electron. Eng., Beihang Univ., Beijing, China]","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5043551995"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":0.8464,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.72318773,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"61","issue":"2","first_page":"286","last_page":"296"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11667","display_name":"Advanced Chemical Sensor Technologies","score":0.9891999959945679,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13717","display_name":"Advanced Algorithms and Applications","score":0.9781000018119812,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/principal-component-analysis","display_name":"Principal component analysis","score":0.5808792114257812},{"id":"https://openalex.org/keywords/soft-computing","display_name":"Soft computing","score":0.5693876147270203},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.476016104221344},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.4399414360523224},{"id":"https://openalex.org/keywords/arbiter","display_name":"Arbiter","score":0.4323718547821045},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.42746463418006897},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.34288156032562256},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.29165542125701904},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.10129323601722717}],"concepts":[{"id":"https://openalex.org/C27438332","wikidata":"https://www.wikidata.org/wiki/Q2873","display_name":"Principal component analysis","level":2,"score":0.5808792114257812},{"id":"https://openalex.org/C140073362","wikidata":"https://www.wikidata.org/wiki/Q738759","display_name":"Soft computing","level":3,"score":0.5693876147270203},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.476016104221344},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.4399414360523224},{"id":"https://openalex.org/C2779971761","wikidata":"https://www.wikidata.org/wiki/Q629872","display_name":"Arbiter","level":2,"score":0.4323718547821045},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.42746463418006897},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.34288156032562256},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.29165542125701904},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.10129323601722717}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2011.2164836","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2164836","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W101663867","https://openalex.org/W403876870","https://openalex.org/W645476431","https://openalex.org/W1503196035","https://openalex.org/W1608292140","https://openalex.org/W1825077972","https://openalex.org/W1988837638","https://openalex.org/W2002011878","https://openalex.org/W2107763039","https://openalex.org/W2123261655","https://openalex.org/W2124776405","https://openalex.org/W2148603752","https://openalex.org/W2153635508","https://openalex.org/W2162808002","https://openalex.org/W2172000360","https://openalex.org/W2496323672","https://openalex.org/W2986168376","https://openalex.org/W2987325268","https://openalex.org/W3099514962"],"related_works":["https://openalex.org/W1579270119","https://openalex.org/W2358824780","https://openalex.org/W2029718921","https://openalex.org/W2008326590","https://openalex.org/W2366390874","https://openalex.org/W2050272725","https://openalex.org/W2783482627","https://openalex.org/W2147245425","https://openalex.org/W4220952680","https://openalex.org/W2364070259"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,111,116],"new":[4,101,194],"method":[5],"for":[6,74],"fuel-type":[7,157],"identification":[8,158],"by":[9,50,79],"combining":[10],"the":[11,26,52,61,64,81,85,96,107,125,129,134,152,171,174,182,190],"joint":[12,65,86,175],"probability":[13,66,87,176],"density":[14,67,88,177],"arbiter":[15,68,89,178],"and":[16,28,36,44,69,104,151,179],"soft-computing":[17,70,108,184],"techniques.":[18],"Extensive":[19],"flame":[20,33],"features":[21],"were":[22,48,72,138,149,159],"extracted":[23],"both":[24],"in":[25,163,188],"time":[27],"frequency":[29],"domains":[30],"from":[31],"each":[32,75],"oscillation":[34],"signal":[35],"formed":[37],"an":[38,142],"original":[39],"feature":[40,46],"data":[41,47],"vector.":[42],"Orthogonal":[43],"dimension-reduced":[45],"obtained":[49],"using":[51,80],"principal":[53],"component":[54],"analysis":[55],"technique.":[56],"In":[57],"order":[58],"to":[59,93,123],"identify":[60,124],"fuel":[62,77,99,126,130,191],"type,":[63],"models":[71,109],"established":[73],"known":[76,135],"type":[78,97,127],"orthogonal":[82],"features.":[83],"Then,":[84],"model":[90,114],"was":[91,121,131,186],"used":[92,122],"determine":[94],"whether":[95],"of":[98,106,133,147,156,173,181],"is":[100],"or":[102,115,195],"not,":[103],"one":[105,132,180],"(either":[110,193],"neural":[112],"network":[113],"support":[117],"vector":[118],"machine":[119],"model)":[120],"if":[128],"types.":[136],"Experiments":[137],"carried":[139],"out":[140],"on":[141],"industrial":[143],"boiler.":[144],"Four":[145],"types":[146,192],"coal":[148],"tested,":[150],"average":[153],"success":[154],"rates":[155],"higher":[160],"than":[161],"97%":[162],"20":[164],"trials.":[165],"The":[166],"experimental":[167],"results":[168],"demonstrated":[169],"that":[170],"combination":[172],"two":[183],"techniques":[185],"effective":[187],"identifying":[189],"not).":[196]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":4},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}