{"id":"https://openalex.org/W2145929647","doi":"https://doi.org/10.1109/tim.2011.2139290","title":"Temperature Dependence of Pd Thin-Film Cryoresistors","display_name":"Temperature Dependence of Pd Thin-Film Cryoresistors","publication_year":2011,"publication_date":"2011-05-27","ids":{"openalex":"https://openalex.org/W2145929647","doi":"https://doi.org/10.1109/tim.2011.2139290","mag":"2145929647"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2011.2139290","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2139290","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027605513","display_name":"A. Satrapinski","orcid":null},"institutions":[{"id":"https://openalex.org/I133698016","display_name":"National metrology institute VTT MIKES","ror":"https://ror.org/0398a1r53","country_code":"FI","type":"facility","lineage":["https://openalex.org/I133698016","https://openalex.org/I4210089493","https://openalex.org/I87653560"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Alexandre Satrapinski","raw_affiliation_strings":["MIKES, Espoo, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MIKES, Espoo, Finland","institution_ids":["https://openalex.org/I133698016"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022081395","display_name":"O. Hahtela","orcid":null},"institutions":[{"id":"https://openalex.org/I133698016","display_name":"National metrology institute VTT MIKES","ror":"https://ror.org/0398a1r53","country_code":"FI","type":"facility","lineage":["https://openalex.org/I133698016","https://openalex.org/I4210089493","https://openalex.org/I87653560"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Ossi M. Hahtela","raw_affiliation_strings":["MIKES, Espoo, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MIKES, Espoo, Finland","institution_ids":["https://openalex.org/I133698016"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028248489","display_name":"Alexander Savin","orcid":"https://orcid.org/0000-0001-9894-1180"},"institutions":[{"id":"https://openalex.org/I9927081","display_name":"Aalto University","ror":"https://ror.org/020hwjq30","country_code":"FI","type":"education","lineage":["https://openalex.org/I9927081"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Alexander M. Savin","raw_affiliation_strings":["Low Temperature Laboratory, School of Science and Technology, Aalto University, Aalto, Finland","Low Temp. Lab., Aalto Univ., Aalto, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Low Temperature Laboratory, School of Science and Technology, Aalto University, Aalto, Finland","institution_ids":["https://openalex.org/I9927081"]},{"raw_affiliation_string":"Low Temp. Lab., Aalto Univ., Aalto, Finland","institution_ids":["https://openalex.org/I9927081"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048781925","display_name":"\u0421. \u0412. \u041d\u043e\u0432\u0438\u043a\u043e\u0432","orcid":"https://orcid.org/0000-0002-3725-2565"},"institutions":[{"id":"https://openalex.org/I9927081","display_name":"Aalto University","ror":"https://ror.org/020hwjq30","country_code":"FI","type":"education","lineage":["https://openalex.org/I9927081"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Sergey Novikov","raw_affiliation_strings":["Department of Micro and Nanosciences, Aalto University of Science and Technology, Aalto, Finland","Dept. of Micro-& Nanosci., Aalto Univ., Aalto, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Micro and Nanosciences, Aalto University of Science and Technology, Aalto, Finland","institution_ids":["https://openalex.org/I9927081"]},{"raw_affiliation_string":"Dept. of Micro-& Nanosci., Aalto Univ., Aalto, Finland","institution_ids":["https://openalex.org/I9927081"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091899030","display_name":"\u041d. \u0410. \u041b\u0435\u0431\u0435\u0434\u0435\u0432\u0430","orcid":"https://orcid.org/0000-0002-5971-0168"},"institutions":[{"id":"https://openalex.org/I9927081","display_name":"Aalto University","ror":"https://ror.org/020hwjq30","country_code":"FI","type":"education","lineage":["https://openalex.org/I9927081"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Natalia Lebedeva","raw_affiliation_strings":["Department of Micro and Nanosciences, Aalto University of Science and Technology, Aalto, Finland","Dept. of Micro-& Nanosci., Aalto Univ., Aalto, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Micro and Nanosciences, Aalto University of Science and Technology, Aalto, Finland","institution_ids":["https://openalex.org/I9927081"]},{"raw_affiliation_string":"Dept. of Micro-& Nanosci., Aalto Univ., Aalto, Finland","institution_ids":["https://openalex.org/I9927081"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2703,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.64697734,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"60","issue":"7","first_page":"2469","last_page":"2474"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.74976646900177},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.7473376393318176},{"id":"https://openalex.org/keywords/atmospheric-temperature-range","display_name":"Atmospheric temperature range","score":0.7084568738937378},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6968980431556702},{"id":"https://openalex.org/keywords/thin-film","display_name":"Thin film","score":0.676780104637146},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.5968510508537292},{"id":"https://openalex.org/keywords/electrical-resistivity-and-conductivity","display_name":"Electrical resistivity and conductivity","score":0.557819664478302},{"id":"https://openalex.org/keywords/evaporation","display_name":"Evaporation","score":0.4959891736507416},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4937659204006195},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.2566194534301758},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21492734551429749},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.16463947296142578},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.1395043134689331},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.11255025863647461},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10938787460327148},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.06214943528175354}],"concepts":[{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.74976646900177},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.7473376393318176},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.7084568738937378},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6968980431556702},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.676780104637146},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.5968510508537292},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.557819664478302},{"id":"https://openalex.org/C61441594","wikidata":"https://www.wikidata.org/wiki/Q132814","display_name":"Evaporation","level":2,"score":0.4959891736507416},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4937659204006195},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.2566194534301758},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21492734551429749},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.16463947296142578},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.1395043134689331},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.11255025863647461},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10938787460327148},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06214943528175354},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2011.2139290","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2139290","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W639605320","https://openalex.org/W1510685601","https://openalex.org/W1678035058","https://openalex.org/W1994728446","https://openalex.org/W2025533920","https://openalex.org/W2040274006","https://openalex.org/W2102003681","https://openalex.org/W2107969114","https://openalex.org/W2121636465","https://openalex.org/W2128132573","https://openalex.org/W2143506261","https://openalex.org/W2148016544","https://openalex.org/W2149308856","https://openalex.org/W2165280413","https://openalex.org/W2169011891","https://openalex.org/W3104002146"],"related_works":["https://openalex.org/W2137172615","https://openalex.org/W2588215263","https://openalex.org/W2974910612","https://openalex.org/W2117118455","https://openalex.org/W1553248637","https://openalex.org/W2021342890","https://openalex.org/W2024080132","https://openalex.org/W2111405033","https://openalex.org/W2999406021","https://openalex.org/W2041109056"],"abstract_inverted_index":{"Cryoresistors":[0],"based":[1],"on":[2,59,93],"Pd":[3,33],"thin":[4],"films":[5],"were":[6,25],"designed":[7],"and":[8],"investigated":[9],"in":[10,19,39,69,79,105],"the":[11,20,60,63,70],"temperature":[12,67,109],"range":[13,21,45,71],"50":[14],"mK-300":[15],"K.":[16],"The":[17,65],"resistors":[18],"100":[22],"k\u03a9-1.3":[23],"M\u03a9":[24],"fabricated":[26],"by":[27],"thermal":[28],"evaporation":[29],"technique.":[30],"Resistivity":[31],"of":[32,53,62,75],"film":[34,95],"at":[35,55],"293":[36],"K":[37,74,108],"varies":[38],"(21-53)":[40],"\u00b7":[41,102],"10":[42,80,103],"8":[43],"\u03a9m":[44],"for":[46,87],"15-40":[47],"nm":[48],"films.":[49],"Temperature":[50],"co":[51],"efficient":[52],"resistance":[54],"low":[56],"temperatures":[57],"depends":[58],"thickness":[61],"film.":[64,89],"lowest":[66],"coefficient":[68,91],"3":[72],"K-4":[73],"about":[76],"few":[77],"parts":[78],"<sup":[81],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[82],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">6</sup>":[83],"/K":[84],"was":[85],"obtained":[86],"20-nm-thick":[88],"Current":[90],"measured":[92],"20-nm-thin":[94],"1.002-M\u03a9":[96],"resistor":[97],"does":[98],"not":[99],"exceed":[100],"2":[101],"5/\u03bcA":[104],"0.7":[106],"K-1":[107],"range.":[110]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}