{"id":"https://openalex.org/W2108600657","doi":"https://doi.org/10.1109/tim.2011.2135570","title":"Computer-Controlled System for Calibrating High-Voltage Revenue Metering Equipment Under Actual Operating Conditions","display_name":"Computer-Controlled System for Calibrating High-Voltage Revenue Metering Equipment Under Actual Operating Conditions","publication_year":2011,"publication_date":"2011-05-09","ids":{"openalex":"https://openalex.org/W2108600657","doi":"https://doi.org/10.1109/tim.2011.2135570","mag":"2108600657"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2011.2135570","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2135570","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029874260","display_name":"E. So","orcid":"https://orcid.org/0000-0001-9666-6226"},"institutions":[{"id":"https://openalex.org/I197604219","display_name":"National Academies of Sciences, Engineering, and Medicine","ror":"https://ror.org/02eq2w707","country_code":"US","type":"government","lineage":["https://openalex.org/I197604219"]},{"id":"https://openalex.org/I4210159778","display_name":"National Research Council Canada","ror":"https://ror.org/04mte1k06","country_code":"CA","type":"government","lineage":["https://openalex.org/I4210159778"]}],"countries":["CA","US"],"is_corresponding":true,"raw_author_name":"Eddy So","raw_affiliation_strings":["Institute for National Measurement Standards, National Research Council Canada, Ottawa, ONT, Canada","Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, ON, Canada"],"affiliations":[{"raw_affiliation_string":"Institute for National Measurement Standards, National Research Council Canada, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I4210159778"]},{"raw_affiliation_string":"Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, ON, Canada","institution_ids":["https://openalex.org/I197604219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035923861","display_name":"R. Arseneau","orcid":null},"institutions":[{"id":"https://openalex.org/I197604219","display_name":"National Academies of Sciences, Engineering, and Medicine","ror":"https://ror.org/02eq2w707","country_code":"US","type":"government","lineage":["https://openalex.org/I197604219"]},{"id":"https://openalex.org/I4210159778","display_name":"National Research Council Canada","ror":"https://ror.org/04mte1k06","country_code":"CA","type":"government","lineage":["https://openalex.org/I4210159778"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Rejean Arseneau","raw_affiliation_strings":["Institute for National Measurement Standards, National Research Council Canada, Ottawa, ONT, Canada","Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, ON, Canada"],"affiliations":[{"raw_affiliation_string":"Institute for National Measurement Standards, National Research Council Canada, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I4210159778"]},{"raw_affiliation_string":"Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, ON, Canada","institution_ids":["https://openalex.org/I197604219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044481124","display_name":"David Bennett","orcid":"https://orcid.org/0000-0001-5354-152X"},"institutions":[{"id":"https://openalex.org/I197604219","display_name":"National Academies of Sciences, Engineering, and Medicine","ror":"https://ror.org/02eq2w707","country_code":"US","type":"government","lineage":["https://openalex.org/I197604219"]},{"id":"https://openalex.org/I4210159778","display_name":"National Research Council Canada","ror":"https://ror.org/04mte1k06","country_code":"CA","type":"government","lineage":["https://openalex.org/I4210159778"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"David Bennett","raw_affiliation_strings":["Institute for National Measurement Standards, National Research Council Canada, Ottawa, ONT, Canada","Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, ON, Canada"],"affiliations":[{"raw_affiliation_string":"Institute for National Measurement Standards, National Research Council Canada, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I4210159778"]},{"raw_affiliation_string":"Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, ON, Canada","institution_ids":["https://openalex.org/I197604219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055860979","display_name":"M. Frigault","orcid":null},"institutions":[{"id":"https://openalex.org/I4210159778","display_name":"National Research Council Canada","ror":"https://ror.org/04mte1k06","country_code":"CA","type":"government","lineage":["https://openalex.org/I4210159778"]},{"id":"https://openalex.org/I197604219","display_name":"National Academies of Sciences, Engineering, and Medicine","ror":"https://ror.org/02eq2w707","country_code":"US","type":"government","lineage":["https://openalex.org/I197604219"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Michelle E. Frigault","raw_affiliation_strings":["Institute for National Measurement Standards, National Research Council Canada, Ottawa, ONT, Canada","Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, ON, Canada"],"affiliations":[{"raw_affiliation_string":"Institute for National Measurement Standards, National Research Council Canada, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I4210159778"]},{"raw_affiliation_string":"Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, ON, Canada","institution_ids":["https://openalex.org/I197604219"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5029874260"],"corresponding_institution_ids":["https://openalex.org/I197604219","https://openalex.org/I4210159778"],"apc_list":null,"apc_paid":null,"fwci":0.5305,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.71270895,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"60","issue":"7","first_page":"2500","last_page":"2505"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metering-mode","display_name":"Metering mode","score":0.7690365314483643},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.6555277109146118},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.652108371257782},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6512041091918945},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.6399551630020142},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5353923439979553},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.5328541398048401},{"id":"https://openalex.org/keywords/high-voltage","display_name":"High voltage","score":0.5155875086784363},{"id":"https://openalex.org/keywords/power-factor","display_name":"Power factor","score":0.4560224711894989},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4194675087928772},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.21902120113372803},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.10245522856712341}],"concepts":[{"id":"https://openalex.org/C30905978","wikidata":"https://www.wikidata.org/wiki/Q815598","display_name":"Metering mode","level":2,"score":0.7690365314483643},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6555277109146118},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.652108371257782},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6512041091918945},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.6399551630020142},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5353923439979553},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.5328541398048401},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.5155875086784363},{"id":"https://openalex.org/C64424096","wikidata":"https://www.wikidata.org/wiki/Q750454","display_name":"Power factor","level":3,"score":0.4560224711894989},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4194675087928772},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21902120113372803},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.10245522856712341},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2011.2135570","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2135570","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:cisti-icist.nrc-cnrc.ca:cistinparc:21271560","is_oa":false,"landing_page_url":"https://nrc-publications.canada.ca/eng/view/object/?id=dd2561c8-aae9-439c-8a4b-21343e3efa86","pdf_url":null,"source":{"id":"https://openalex.org/S7407055245","display_name":"NPARC","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.4000000059604645}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1766179879","https://openalex.org/W2002471841","https://openalex.org/W2061571979","https://openalex.org/W2099388225","https://openalex.org/W2131603746","https://openalex.org/W2140244233","https://openalex.org/W2169573781","https://openalex.org/W2505397494","https://openalex.org/W4210809922","https://openalex.org/W6996518606"],"related_works":["https://openalex.org/W2034349229","https://openalex.org/W4366783034","https://openalex.org/W2005410346","https://openalex.org/W1972415042","https://openalex.org/W4313221225","https://openalex.org/W2150642609","https://openalex.org/W4306816370","https://openalex.org/W2189390720","https://openalex.org/W2390229089","https://openalex.org/W2951548045"],"abstract_inverted_index":{"The":[0,60,100],"development":[1],"of":[2,18,71],"a":[3],"computer-controlled":[4],"current-comparator-based":[5],"test":[6],"system":[7,75,102],"for":[8,94],"calibrating":[9],"high-voltage":[10,112],"revenue":[11],"metering":[12],"equipment":[13],"under":[14],"actual":[15],"operating":[16],"conditions":[17],"high":[19],"voltage/high":[20],"current":[21,28],"with":[22],"sinusoidal":[23,95],"or":[24,43,109],"nonsinusoidal":[25,97],"voltage":[26],"and":[27,54,62,85,88,91,96],"waveforms":[29],"is":[30],"described.":[31],"Measurements":[32],"can":[33,103],"be":[34,79,104],"made":[35],"at":[36,47],"any":[37],"power":[38],"factor":[39],"from":[40],"zero":[41],"lead":[42],"lag":[44],"through":[45],"unity,":[46],"line-to-ground":[48],"voltages":[49],"up":[50,56],"to":[51,57,78],"100":[52,83,86],"kV":[53],"currents":[55],"2000":[58],"A.":[59],"magnitude":[61],"phase":[63],"uncertainties":[64],"(":[65],"<i":[66],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[67],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">k</i>":[68],"=":[69],"2)":[70],"the":[72,107],"new":[73],"calibration":[74,101],"are":[76],"estimated":[77],"not":[80],"more":[81],"than":[82],"\u03bcW/VA":[84,90],"\u03bcrad,":[87],"200":[89,92],"\u03bcrad":[93],"conditions,":[98],"respectively.":[99],"used":[105],"in":[106,111],"laboratory":[108],"on-site":[110],"substations.":[113]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-03-02T08:37:19.008085","created_date":"2025-10-10T00:00:00"}