{"id":"https://openalex.org/W2180521275","doi":"https://doi.org/10.1109/tim.2011.2135430","title":"Power Source Impedance Measurement System for Testing Compliance With IEC 61000-3-3","display_name":"Power Source Impedance Measurement System for Testing Compliance With IEC 61000-3-3","publication_year":2011,"publication_date":"2011-05-10","ids":{"openalex":"https://openalex.org/W2180521275","doi":"https://doi.org/10.1109/tim.2011.2135430","mag":"2180521275"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2011.2135430","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2135430","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110689984","display_name":"Paul Clarkson","orcid":null},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Paul Clarkson","raw_affiliation_strings":["National Physical Laboratory, Teddington, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Physical Laboratory, Teddington, UK","institution_ids":["https://openalex.org/I134421475"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Paul S. Wright","orcid":null},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Paul S. Wright","raw_affiliation_strings":["National Physical Laboratory, Teddington, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Physical Laboratory, Teddington, UK","institution_ids":["https://openalex.org/I134421475"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109887396","display_name":"A J Wheaton","orcid":null},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Adrian J. Wheaton","raw_affiliation_strings":["National Physical Laboratory, Teddington, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Physical Laboratory, Teddington, UK","institution_ids":["https://openalex.org/I134421475"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038314165","display_name":"J H Belliss","orcid":null},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Janet H. Belliss","raw_affiliation_strings":["National Physical Laboratory, Teddington, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Physical Laboratory, Teddington, UK","institution_ids":["https://openalex.org/I134421475"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I134421475"],"apc_list":null,"apc_paid":null,"fwci":0.5406,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.73176285,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"60","issue":"7","first_page":"2320","last_page":"2326"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10603","display_name":"Smart Grid Energy Management","score":0.9829999804496765,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10603","display_name":"Smart Grid Energy Management","score":0.9829999804496765,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9488000273704529,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10917","display_name":"Smart Grid Security and Resilience","score":0.9003000259399414,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/output-impedance","display_name":"Output impedance","score":0.7230117917060852},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6497976183891296},{"id":"https://openalex.org/keywords/mains-electricity","display_name":"Mains electricity","score":0.6288422346115112},{"id":"https://openalex.org/keywords/impedance-bridging","display_name":"Impedance bridging","score":0.5786430239677429},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5739971995353699},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5481997132301331},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5377467274665833},{"id":"https://openalex.org/keywords/input-impedance","display_name":"Input impedance","score":0.500554084777832},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4841492772102356},{"id":"https://openalex.org/keywords/flicker","display_name":"Flicker","score":0.47891557216644287},{"id":"https://openalex.org/keywords/image-impedance","display_name":"Image impedance","score":0.4762715995311737},{"id":"https://openalex.org/keywords/impedance-matching","display_name":"Impedance matching","score":0.47238802909851074},{"id":"https://openalex.org/keywords/focused-impedance-measurement","display_name":"Focused Impedance Measurement","score":0.46254488825798035},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.153143048286438},{"id":"https://openalex.org/keywords/damping-factor","display_name":"Damping factor","score":0.14672714471817017}],"concepts":[{"id":"https://openalex.org/C58112919","wikidata":"https://www.wikidata.org/wiki/Q631203","display_name":"Output impedance","level":3,"score":0.7230117917060852},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6497976183891296},{"id":"https://openalex.org/C184773241","wikidata":"https://www.wikidata.org/wiki/Q387400","display_name":"Mains electricity","level":3,"score":0.6288422346115112},{"id":"https://openalex.org/C92818259","wikidata":"https://www.wikidata.org/wiki/Q1427059","display_name":"Impedance bridging","level":5,"score":0.5786430239677429},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5739971995353699},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5481997132301331},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5377467274665833},{"id":"https://openalex.org/C26262908","wikidata":"https://www.wikidata.org/wiki/Q1307489","display_name":"Input impedance","level":3,"score":0.500554084777832},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4841492772102356},{"id":"https://openalex.org/C19743564","wikidata":"https://www.wikidata.org/wiki/Q25378119","display_name":"Flicker","level":2,"score":0.47891557216644287},{"id":"https://openalex.org/C155065438","wikidata":"https://www.wikidata.org/wiki/Q6002234","display_name":"Image impedance","level":5,"score":0.4762715995311737},{"id":"https://openalex.org/C612350","wikidata":"https://www.wikidata.org/wiki/Q1761108","display_name":"Impedance matching","level":3,"score":0.47238802909851074},{"id":"https://openalex.org/C172066009","wikidata":"https://www.wikidata.org/wiki/Q5463955","display_name":"Focused Impedance Measurement","level":3,"score":0.46254488825798035},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.153143048286438},{"id":"https://openalex.org/C48427663","wikidata":"https://www.wikidata.org/wiki/Q1269719","display_name":"Damping factor","level":4,"score":0.14672714471817017},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2011.2135430","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2135430","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2123002298","https://openalex.org/W2139759580"],"related_works":["https://openalex.org/W4210809443","https://openalex.org/W3091913842","https://openalex.org/W4387426556","https://openalex.org/W2795209467","https://openalex.org/W2510128982","https://openalex.org/W3090612254","https://openalex.org/W2383045972","https://openalex.org/W1964527951","https://openalex.org/W1581428243","https://openalex.org/W2139759580"],"abstract_inverted_index":{"Flicker":[0],"compliance":[1,88],"tests":[2],"for":[3,82],"mains-connected":[4],"appliances":[5],"rely":[6],"on":[7,31,42],"a":[8,80],"power":[9,33,48],"source":[10,34,49],"and":[11,50,60],"reference":[12,51],"impedance":[13,45,52,59,85],"network":[14],"that":[15,87],"simulates":[16],"the":[17,28,32,37,43,47,67],"mains":[18],"supply.":[19],"Assessment":[20],"of":[21,46,56,79],"an":[22],"appliance":[23],"is":[24,40,64,76],"achieved":[25],"by":[26,36],"measuring":[27,83],"flicker":[29],"induced":[30],"output":[35,44,58],"appliance,":[38],"which":[39],"dependent":[41],"network.":[53],"The":[54],"value":[55],"this":[57,84],"its":[61],"associated":[62],"accuracy":[63],"specified":[65],"in":[66],"International":[68],"Electrotechnical":[69],"Commission":[70],"(IEC)":[71],"standard":[72],"61000-3-3.":[73],"A":[74],"description":[75],"given":[77],"here":[78],"method":[81],"so":[86],"with":[89],"IEC":[90],"61000-3-3":[91],"can":[92],"be":[93],"verified.":[94]},"counts_by_year":[{"year":2014,"cited_by_count":2}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}