{"id":"https://openalex.org/W2180056344","doi":"https://doi.org/10.1109/tim.2011.2130970","title":"Determining Noise Temperature of a Noise Source Using Calibrated Noise Sources and an RF Attenuator","display_name":"Determining Noise Temperature of a Noise Source Using Calibrated Noise Sources and an RF Attenuator","publication_year":2011,"publication_date":"2011-04-26","ids":{"openalex":"https://openalex.org/W2180056344","doi":"https://doi.org/10.1109/tim.2011.2130970","mag":"2180056344"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2011.2130970","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2130970","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033332663","display_name":"Tae\u2010Weon Kang","orcid":"https://orcid.org/0000-0002-7457-6585"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Tae-Weon Kang","raw_affiliation_strings":["Center for ElectromagneticWave, Division of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Center for ElectromagneticWave, Division of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100344125","display_name":"Jeong-Hwan Kim","orcid":"https://orcid.org/0000-0002-0220-7019"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jeong-Hwan Kim","raw_affiliation_strings":["Center for ElectromagneticWave, Division of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Center for ElectromagneticWave, Division of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012398384","display_name":"Joo\u2010Gwang Lee","orcid":"https://orcid.org/0000-0002-1461-8608"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Joo-Gwang Lee","raw_affiliation_strings":["Center for ElectromagneticWave, Division of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Center for ElectromagneticWave, Division of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102879355","display_name":"Jeong\u2010Il Park","orcid":"https://orcid.org/0000-0003-0911-1594"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jeong-Il Park","raw_affiliation_strings":["Center for ElectromagneticWave, Division of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Center for ElectromagneticWave, Division of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089782797","display_name":"Dae-Chan Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dae-Chan Kim","raw_affiliation_strings":["Center for ElectromagneticWave, Division of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Center for ElectromagneticWave, Division of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5033332663"],"corresponding_institution_ids":["https://openalex.org/I2799611809"],"apc_list":null,"apc_paid":null,"fwci":0.7949,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.77530082,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"60","issue":"7","first_page":"2558","last_page":"2563"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9800000190734863,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9800000190734863,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.979200005531311,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9634000062942505,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise-temperature","display_name":"Noise temperature","score":0.8289170265197754},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.7361105680465698},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.7162550687789917},{"id":"https://openalex.org/keywords/noise-generator","display_name":"Noise generator","score":0.7106869220733643},{"id":"https://openalex.org/keywords/noise-floor","display_name":"Noise floor","score":0.6611945629119873},{"id":"https://openalex.org/keywords/effective-input-noise-temperature","display_name":"Effective input noise temperature","score":0.6405998468399048},{"id":"https://openalex.org/keywords/attenuator","display_name":"Attenuator (electronics)","score":0.6330924034118652},{"id":"https://openalex.org/keywords/y-factor","display_name":"Y-factor","score":0.6235517263412476},{"id":"https://openalex.org/keywords/noise-spectral-density","display_name":"Noise spectral density","score":0.615302562713623},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5929941534996033},{"id":"https://openalex.org/keywords/noise-figure-meter","display_name":"Noise-figure meter","score":0.488395631313324},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.48740771412849426},{"id":"https://openalex.org/keywords/noise-power","display_name":"Noise power","score":0.43640977144241333},{"id":"https://openalex.org/keywords/flicker-noise","display_name":"Flicker noise","score":0.4247283935546875},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41448473930358887},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.37716156244277954},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3596158027648926},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.3143582046031952},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.25057074427604675},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2419722080230713},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.23523873090744019},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.22158518433570862},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.22010138630867004},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.17350363731384277},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.1636437475681305},{"id":"https://openalex.org/keywords/attenuation","display_name":"Attenuation","score":0.10257697105407715},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.06947687268257141}],"concepts":[{"id":"https://openalex.org/C52660251","wikidata":"https://www.wikidata.org/wiki/Q17083145","display_name":"Noise temperature","level":3,"score":0.8289170265197754},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.7361105680465698},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.7162550687789917},{"id":"https://openalex.org/C74342258","wikidata":"https://www.wikidata.org/wiki/Q2133526","display_name":"Noise generator","level":5,"score":0.7106869220733643},{"id":"https://openalex.org/C187612029","wikidata":"https://www.wikidata.org/wiki/Q17083130","display_name":"Noise floor","level":4,"score":0.6611945629119873},{"id":"https://openalex.org/C12252657","wikidata":"https://www.wikidata.org/wiki/Q5347266","display_name":"Effective input noise temperature","level":5,"score":0.6405998468399048},{"id":"https://openalex.org/C174847166","wikidata":"https://www.wikidata.org/wiki/Q1269728","display_name":"Attenuator (electronics)","level":3,"score":0.6330924034118652},{"id":"https://openalex.org/C166576357","wikidata":"https://www.wikidata.org/wiki/Q8045715","display_name":"Y-factor","level":5,"score":0.6235517263412476},{"id":"https://openalex.org/C133976006","wikidata":"https://www.wikidata.org/wiki/Q3023291","display_name":"Noise spectral density","level":5,"score":0.615302562713623},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5929941534996033},{"id":"https://openalex.org/C90166738","wikidata":"https://www.wikidata.org/wiki/Q7047656","display_name":"Noise-figure meter","level":5,"score":0.488395631313324},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.48740771412849426},{"id":"https://openalex.org/C203234222","wikidata":"https://www.wikidata.org/wiki/Q2133519","display_name":"Noise power","level":3,"score":0.43640977144241333},{"id":"https://openalex.org/C113873419","wikidata":"https://www.wikidata.org/wiki/Q1410810","display_name":"Flicker noise","level":5,"score":0.4247283935546875},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41448473930358887},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.37716156244277954},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3596158027648926},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.3143582046031952},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.25057074427604675},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2419722080230713},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.23523873090744019},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.22158518433570862},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.22010138630867004},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.17350363731384277},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.1636437475681305},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.10257697105407715},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.06947687268257141},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2011.2130970","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2130970","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8299999833106995,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1639446174","https://openalex.org/W1988088932","https://openalex.org/W2016468578","https://openalex.org/W2026634541","https://openalex.org/W2109407772","https://openalex.org/W2124841974","https://openalex.org/W2133821027","https://openalex.org/W2150870475","https://openalex.org/W2152987100","https://openalex.org/W2744362479","https://openalex.org/W2916892466"],"related_works":["https://openalex.org/W2165129972","https://openalex.org/W4243333603","https://openalex.org/W2118931924","https://openalex.org/W1993664839","https://openalex.org/W2152566186","https://openalex.org/W2128564505","https://openalex.org/W2180056344","https://openalex.org/W2160178596","https://openalex.org/W2025552042","https://openalex.org/W1973248898"],"abstract_inverted_index":{"A":[0],"system":[1],"to":[2,38,93],"measure":[3],"the":[4,14,21,44,62,71],"noise":[5,9,24,41,48,52,64,67,72,79],"temperature":[6],"(NT)":[7],"of":[8,17,70],"sources":[10,25,73],"is":[11],"implemented":[12],"in":[13],"frequency":[15],"range":[16],"18-26.5":[18],"GHz":[19],"for":[20],"case":[22],"where":[23],"commercially":[26],"available":[27],"have":[28],"only":[29],"one":[30],"nominal":[31],"NT,":[32],"e.g.,":[33],"9500":[34],"K":[35],"being":[36],"equivalent":[37],"15-dB":[39],"excess":[40],"ratio.":[42],"For":[43],"Y-factor":[45],"method,":[46],"two":[47],"sources,":[49],"i.e.,":[50],"a":[51,57,77],"source":[53],"and":[54,87],"another":[55],"with":[56],"radio-frequency":[58],"attenuator,":[59],"serve":[60],"as":[61],"standard":[63],"sources.":[65],"The":[66],"power":[68],"output":[69],"are":[74,85],"measured":[75],"using":[76],"commercial":[78],"figure":[80],"measurement":[81],"instrument.":[82],"Measurement":[83],"results":[84],"presented,":[86],"its":[88],"uncertainty":[89],"has":[90],"been":[91],"evaluated":[92],"be":[94],"0.23-0.25":[95],"dB":[96],"(k":[97],"=":[98],"2)":[99],".":[100]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}