{"id":"https://openalex.org/W2109366175","doi":"https://doi.org/10.1109/tim.2011.2122430","title":"Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction","display_name":"Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction","publication_year":2011,"publication_date":"2011-03-29","ids":{"openalex":"https://openalex.org/W2109366175","doi":"https://doi.org/10.1109/tim.2011.2122430","mag":"2109366175"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2011.2122430","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2122430","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":null,"any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085724017","display_name":"Melanie Po\u2010Leen Ooi","orcid":"https://orcid.org/0000-0002-1623-0105"},"institutions":[{"id":"https://openalex.org/I11662577","display_name":"Monash University Malaysia","ror":"https://ror.org/00yncr324","country_code":"MY","type":"education","lineage":["https://openalex.org/I11662577"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Melanie Po-Leen Ooi","raw_affiliation_strings":["Monash University Sunway Campus, Selangor, Malaysia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Monash University Sunway Campus, Selangor, Malaysia","institution_ids":["https://openalex.org/I11662577"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059325654","display_name":"Eric Kwang Joo Joo","orcid":null},"institutions":[{"id":"https://openalex.org/I11662577","display_name":"Monash University Malaysia","ror":"https://ror.org/00yncr324","country_code":"MY","type":"education","lineage":["https://openalex.org/I11662577"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Eric Kwang Joo Joo","raw_affiliation_strings":["Monash University - Malaysia Campus, Bandar Sunway, Selangor, MY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Monash University - Malaysia Campus, Bandar Sunway, Selangor, MY","institution_ids":["https://openalex.org/I11662577"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068939902","display_name":"Ye Chow Kuang","orcid":"https://orcid.org/0000-0002-5423-9653"},"institutions":[{"id":"https://openalex.org/I11662577","display_name":"Monash University Malaysia","ror":"https://ror.org/00yncr324","country_code":"MY","type":"education","lineage":["https://openalex.org/I11662577"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Ye Chow Kuang","raw_affiliation_strings":["Monash University Sunway Campus, Selangor, Malaysia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Monash University Sunway Campus, Selangor, Malaysia","institution_ids":["https://openalex.org/I11662577"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087503126","display_name":"Serge Demidenko","orcid":"https://orcid.org/0000-0001-9883-9311"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Demidenko","raw_affiliation_strings":["Royal Melbourne Institute of Technology International University, Hanoi, Vietnam","Royal Melbourne Institute of Technology International University, Ho Chi Minh, Vietnam"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Royal Melbourne Institute of Technology International University, Hanoi, Vietnam","institution_ids":[]},{"raw_affiliation_string":"Royal Melbourne Institute of Technology International University, Ho Chi Minh, Vietnam","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048939792","display_name":"Lindsay Kleeman","orcid":"https://orcid.org/0000-0002-3629-0666"},"institutions":[{"id":"https://openalex.org/I56590836","display_name":"Monash University","ror":"https://ror.org/02bfwt286","country_code":"AU","type":"education","lineage":["https://openalex.org/I56590836"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"L. Kleeman","raw_affiliation_strings":["Clayton Campus, Monash University, Clayton, Australia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Clayton Campus, Monash University, Clayton, Australia","institution_ids":["https://openalex.org/I56590836"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031184989","display_name":"Chris Chan","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chris Wei Keong Chan","raw_affiliation_strings":["Freescale Semiconductor Malaysia, Free Industrial Zone, Selangor, Malaysia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor Malaysia, Free Industrial Zone, Selangor, Malaysia","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.8616,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.96379985,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"60","issue":"10","first_page":"3300","last_page":"3317"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9850000143051147,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.7042465209960938},{"id":"https://openalex.org/keywords/cluster","display_name":"Cluster (spacecraft)","score":0.7024351358413696},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.6552653312683105},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5646600127220154},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5267281532287598},{"id":"https://openalex.org/keywords/extraction","display_name":"Extraction (chemistry)","score":0.5221760272979736},{"id":"https://openalex.org/keywords/semiconductor-industry","display_name":"Semiconductor industry","score":0.492861270904541},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.49054473638534546},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.45228999853134155},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4132990837097168},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4024462401866913},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3230828642845154},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.24038761854171753},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11317142844200134},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.10067874193191528}],"concepts":[{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.7042465209960938},{"id":"https://openalex.org/C164866538","wikidata":"https://www.wikidata.org/wiki/Q367351","display_name":"Cluster (spacecraft)","level":2,"score":0.7024351358413696},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.6552653312683105},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5646600127220154},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5267281532287598},{"id":"https://openalex.org/C4725764","wikidata":"https://www.wikidata.org/wiki/Q844704","display_name":"Extraction (chemistry)","level":2,"score":0.5221760272979736},{"id":"https://openalex.org/C2987888538","wikidata":"https://www.wikidata.org/wiki/Q2986369","display_name":"Semiconductor industry","level":2,"score":0.492861270904541},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.49054473638534546},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.45228999853134155},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4132990837097168},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4024462401866913},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3230828642845154},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.24038761854171753},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11317142844200134},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.10067874193191528},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/tim.2011.2122430","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2122430","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:researchbank.rmit.edu.au:rmit:19298","is_oa":false,"landing_page_url":"http://researchbank.rmit.edu.au/view/rmit:19298","pdf_url":null,"source":{"id":"https://openalex.org/S4306402074","display_name":"RMIT Research Repository (RMIT University Library)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I82951845","host_organization_name":"RMIT University","host_organization_lineage":["https://openalex.org/I82951845"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Journal Article"},{"id":"pmh:oai:alma.61RMIT_INST:11246610910001341","is_oa":false,"landing_page_url":"http://doi.org/10.1109/TIM.2011.2122430","pdf_url":null,"source":{"id":"https://openalex.org/S4306402074","display_name":"RMIT Research Repository (RMIT University Library)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I82951845","host_organization_name":"RMIT University","host_organization_lineage":["https://openalex.org/I82951845"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"text"},{"id":"pmh:oai:figshare.com:article/27447648","is_oa":true,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4377196282","display_name":"Figshare","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210132348","host_organization_name":"Figshare (United Kingdom)","host_organization_lineage":["https://openalex.org/I4210132348"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:figshare.com:article/27447648","is_oa":true,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4377196282","display_name":"Figshare","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210132348","host_organization_name":"Figshare (United Kingdom)","host_organization_lineage":["https://openalex.org/I4210132348"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320971","display_name":"Monash University","ror":"https://ror.org/02bfwt286"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W8722571","https://openalex.org/W56104271","https://openalex.org/W1497820905","https://openalex.org/W1508960934","https://openalex.org/W1669383326","https://openalex.org/W1979897231","https://openalex.org/W2002830978","https://openalex.org/W2015737971","https://openalex.org/W2035055162","https://openalex.org/W2041995828","https://openalex.org/W2063052894","https://openalex.org/W2081978919","https://openalex.org/W2082026549","https://openalex.org/W2094843249","https://openalex.org/W2095848267","https://openalex.org/W2102405884","https://openalex.org/W2104550562","https://openalex.org/W2107020932","https://openalex.org/W2108202086","https://openalex.org/W2116442452","https://openalex.org/W2122191042","https://openalex.org/W2122876874","https://openalex.org/W2134520339","https://openalex.org/W2137110568","https://openalex.org/W2147361048","https://openalex.org/W2149917222","https://openalex.org/W2160417909","https://openalex.org/W2170193684","https://openalex.org/W2171271652","https://openalex.org/W2611684114","https://openalex.org/W2798167046","https://openalex.org/W2914094842","https://openalex.org/W2983111428","https://openalex.org/W4205431832","https://openalex.org/W4205930639","https://openalex.org/W4237126600","https://openalex.org/W4250323044","https://openalex.org/W6675666612"],"related_works":["https://openalex.org/W2992897358","https://openalex.org/W2631724279","https://openalex.org/W2796831252","https://openalex.org/W1979703647","https://openalex.org/W2917828100","https://openalex.org/W2361830001","https://openalex.org/W2146075642","https://openalex.org/W1529487987","https://openalex.org/W1483525138","https://openalex.org/W2093118422"],"abstract_inverted_index":{"High-volume":[0],"production":[1],"data":[2,55],"shows":[3],"that":[4,53],"dies,":[5],"which":[6],"failed":[7],"probe":[8],"test":[9,78],"on":[10],"a":[11,15,47,58,62],"semiconductor":[12],"wafer,":[13],"have":[14],"tendency":[16],"to":[17],"form":[18],"certain":[19],"unique":[20],"patterns,":[21],"i.e.,":[22],"defect":[23],"clusters.":[24],"Identifying":[25],"such":[26],"clusters":[27],"is":[28],"one":[29],"of":[30,36],"the":[31,37],"crucial":[32],"steps":[33],"toward":[34],"improvement":[35],"fabrication":[38],"process":[39],"and":[40,65,80],"design":[41],"for":[42,50],"manufacturing.":[43],"This":[44],"paper":[45],"proposes":[46],"new":[48],"technique":[49],"defect-cluster":[51,59],"identification":[52],"combines":[54],"mining":[56],"with":[57],"extraction":[60],"using":[61],"Segmentation,":[63],"Detection,":[64],"Cluster-Extraction":[66],"algorithm.":[67],"It":[68],"offers":[69],"high":[70],"defect-extraction":[71],"accuracy,":[72],"without":[73],"any":[74],"significant":[75],"increase":[76],"in":[77],"time":[79],"cost.":[81]},"counts_by_year":[{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}