{"id":"https://openalex.org/W2103026272","doi":"https://doi.org/10.1109/tim.2011.2114070","title":"Density Comparison of Isotopically Purified Silicon Single Crystals by the Pressure-of-Flotation Method","display_name":"Density Comparison of Isotopically Purified Silicon Single Crystals by the Pressure-of-Flotation Method","publication_year":2011,"publication_date":"2011-06-10","ids":{"openalex":"https://openalex.org/W2103026272","doi":"https://doi.org/10.1109/tim.2011.2114070","mag":"2103026272"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2011.2114070","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2114070","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079402691","display_name":"Atsushi Waseda","orcid":"https://orcid.org/0000-0002-3594-5704"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Atsushi Waseda","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101954354","display_name":"Kenichi Fujii","orcid":"https://orcid.org/0000-0002-5578-0038"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kenichi Fujii","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5079402691"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":1.2399,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.83990654,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"60","issue":"7","first_page":"2539","last_page":"2543"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13414","display_name":"Radioactive Decay and Measurement Techniques","score":0.9783999919891357,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/avogadro-constant","display_name":"Avogadro constant","score":0.9160107970237732},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.5975133776664734},{"id":"https://openalex.org/keywords/relative-density","display_name":"Relative density","score":0.5264992117881775},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.5045799016952515},{"id":"https://openalex.org/keywords/compressibility","display_name":"Compressibility","score":0.4891550838947296},{"id":"https://openalex.org/keywords/crystal","display_name":"Crystal (programming language)","score":0.47776710987091064},{"id":"https://openalex.org/keywords/spheres","display_name":"SPHERES","score":0.46361714601516724},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.44118720293045044},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3552703559398651},{"id":"https://openalex.org/keywords/crystallography","display_name":"Crystallography","score":0.29330331087112427},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.2911677956581116},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.28159427642822266},{"id":"https://openalex.org/keywords/chromatography","display_name":"Chromatography","score":0.26821959018707275},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.1339423954486847},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.13204720616340637}],"concepts":[{"id":"https://openalex.org/C140848746","wikidata":"https://www.wikidata.org/wiki/Q6203","display_name":"Avogadro constant","level":2,"score":0.9160107970237732},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.5975133776664734},{"id":"https://openalex.org/C82455628","wikidata":"https://www.wikidata.org/wiki/Q11027905","display_name":"Relative density","level":3,"score":0.5264992117881775},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.5045799016952515},{"id":"https://openalex.org/C84655787","wikidata":"https://www.wikidata.org/wiki/Q8067817","display_name":"Compressibility","level":2,"score":0.4891550838947296},{"id":"https://openalex.org/C2781285689","wikidata":"https://www.wikidata.org/wiki/Q21921428","display_name":"Crystal (programming language)","level":2,"score":0.47776710987091064},{"id":"https://openalex.org/C72422203","wikidata":"https://www.wikidata.org/wiki/Q7392545","display_name":"SPHERES","level":2,"score":0.46361714601516724},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.44118720293045044},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3552703559398651},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.29330331087112427},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.2911677956581116},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.28159427642822266},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.26821959018707275},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.1339423954486847},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.13204720616340637},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C87976508","wikidata":"https://www.wikidata.org/wiki/Q1498213","display_name":"Microstructure","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2011.2114070","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2114070","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1982326692","https://openalex.org/W2015456902","https://openalex.org/W2023767313","https://openalex.org/W2034846858","https://openalex.org/W2101999681","https://openalex.org/W2156616555","https://openalex.org/W2168696626","https://openalex.org/W2395441264"],"related_works":["https://openalex.org/W1957288844","https://openalex.org/W2116178117","https://openalex.org/W2028333530","https://openalex.org/W2060866122","https://openalex.org/W2143979884","https://openalex.org/W2152922877","https://openalex.org/W1973671815","https://openalex.org/W2588334255","https://openalex.org/W2051177771","https://openalex.org/W2043969852"],"abstract_inverted_index":{"An":[0],"isotopically":[1],"purified":[2,43],"silicon":[3],"crystal":[4],"has":[5],"recently":[6],"been":[7],"synthesized":[8],"to":[9,14],"enable":[10],"the":[11,26,29,50],"Avogadro":[12],"constant":[13],"be":[15],"determined":[16],"more":[17],"accurately.":[18],"To":[19],"perform":[20],"new":[21],"density":[22,52],"comparison":[23,38],"measurement":[24,39],"by":[25],"pressure-of-flotation":[27],"method,":[28],"effective":[30],"compressibility":[31],"of":[32,54],"a":[33],"liquid":[34],"is":[35,40,63],"reevaluated.":[36],"Density":[37],"performed":[41],"for":[42],"<sup":[44,58],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[45,59],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">28</sup>":[46,60],"Si":[47,61],"crystals,":[48],"and":[49,56],"relative":[51],"difference":[53],"Avo28-S5":[55],"Avo28-S8":[57],"spheres":[62],"evaluated.":[64]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}