{"id":"https://openalex.org/W2104074527","doi":"https://doi.org/10.1109/tim.2011.2113950","title":"Characterization of Metrological Grade Analog-to-Digital Converters Using a Programmable Josephson Voltage Standard","display_name":"Characterization of Metrological Grade Analog-to-Digital Converters Using a Programmable Josephson Voltage Standard","publication_year":2011,"publication_date":"2011-03-04","ids":{"openalex":"https://openalex.org/W2104074527","doi":"https://doi.org/10.1109/tim.2011.2113950","mag":"2104074527"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2011.2113950","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2113950","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054781013","display_name":"F. Overney","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103407","display_name":"Swiss Federal Institute of Metrology","ror":"https://ror.org/0115xv923","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"countries":["CH"],"is_corresponding":true,"raw_author_name":"Fr\u00e9d\u00e9ric Overney","raw_affiliation_strings":["Federal Office of Metrology, METAS, Bern-Wabern, Switzerland","Fed. Office of Metrol. (METAS), Bern-Wabern, Switzerland"],"affiliations":[{"raw_affiliation_string":"Federal Office of Metrology, METAS, Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]},{"raw_affiliation_string":"Fed. Office of Metrol. (METAS), Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015731532","display_name":"Alain R\u00fcfenacht","orcid":"https://orcid.org/0000-0002-1579-9738"},"institutions":[{"id":"https://openalex.org/I4210103407","display_name":"Swiss Federal Institute of Metrology","ror":"https://ror.org/0115xv923","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Alain Rufenacht","raw_affiliation_strings":["Federal Office of Metrology, METAS, Bern-Wabern, Switzerland","Fed. Office of Metrol. (METAS), Bern-Wabern, Switzerland"],"affiliations":[{"raw_affiliation_string":"Federal Office of Metrology, METAS, Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]},{"raw_affiliation_string":"Fed. Office of Metrol. (METAS), Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113593115","display_name":"Jean\u2010Pierre Braun","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103407","display_name":"Swiss Federal Institute of Metrology","ror":"https://ror.org/0115xv923","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Jean-Pierre Braun","raw_affiliation_strings":["Federal Office of Metrology, METAS, Bern-Wabern, Switzerland","Fed. Office of Metrol. (METAS), Bern-Wabern, Switzerland"],"affiliations":[{"raw_affiliation_string":"Federal Office of Metrology, METAS, Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]},{"raw_affiliation_string":"Fed. Office of Metrol. (METAS), Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014516061","display_name":"B. Jeanneret","orcid":"https://orcid.org/0000-0003-1113-5253"},"institutions":[{"id":"https://openalex.org/I4210103407","display_name":"Swiss Federal Institute of Metrology","ror":"https://ror.org/0115xv923","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Blaise Jeanneret","raw_affiliation_strings":["Federal Office of Metrology, METAS, Bern-Wabern, Switzerland","Fed. Office of Metrol. (METAS), Bern-Wabern, Switzerland"],"affiliations":[{"raw_affiliation_string":"Federal Office of Metrology, METAS, Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]},{"raw_affiliation_string":"Fed. Office of Metrol. (METAS), Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079541661","display_name":"Paul Wright","orcid":"https://orcid.org/0000-0003-3831-3216"},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Paul S. Wright","raw_affiliation_strings":["National Physical Laboratory, Teddington, UK","Nat. Phys. Lab., Teddington, UK"],"affiliations":[{"raw_affiliation_string":"National Physical Laboratory, Teddington, UK","institution_ids":["https://openalex.org/I134421475"]},{"raw_affiliation_string":"Nat. Phys. Lab., Teddington, UK","institution_ids":["https://openalex.org/I134421475"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5054781013"],"corresponding_institution_ids":["https://openalex.org/I4210103407"],"apc_list":null,"apc_paid":null,"fwci":3.5092,"has_fulltext":false,"cited_by_count":70,"citation_normalized_percentile":{"value":0.93087465,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"60","issue":"7","first_page":"2172","last_page":"2177"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9853000044822693,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9743000268936157,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.7003713250160217},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6497023105621338},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.6330640912055969},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.6073821187019348},{"id":"https://openalex.org/keywords/integral-nonlinearity","display_name":"Integral nonlinearity","score":0.6049602031707764},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5320526361465454},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5178380608558655},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.4851975739002228},{"id":"https://openalex.org/keywords/digital-to-analog-converter","display_name":"Digital-to-analog converter","score":0.4640604257583618},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.4511985182762146},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4360891282558441},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43016746640205383},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3620431423187256},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3221466541290283},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2591119408607483},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.14558225870132446}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.7003713250160217},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6497023105621338},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.6330640912055969},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.6073821187019348},{"id":"https://openalex.org/C130829357","wikidata":"https://www.wikidata.org/wiki/Q1665386","display_name":"Integral nonlinearity","level":4,"score":0.6049602031707764},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5320526361465454},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5178380608558655},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.4851975739002228},{"id":"https://openalex.org/C2779879419","wikidata":"https://www.wikidata.org/wiki/Q210863","display_name":"Digital-to-analog converter","level":3,"score":0.4640604257583618},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.4511985182762146},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4360891282558441},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43016746640205383},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3620431423187256},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3221466541290283},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2591119408607483},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.14558225870132446},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2011.2113950","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2113950","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6399999856948853,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1977377847","https://openalex.org/W2009059176","https://openalex.org/W2031839987","https://openalex.org/W2111747763","https://openalex.org/W2119568377","https://openalex.org/W2123002298","https://openalex.org/W2131729362","https://openalex.org/W2134202816","https://openalex.org/W2138243688","https://openalex.org/W2140969587","https://openalex.org/W2154544822","https://openalex.org/W2158928027","https://openalex.org/W2165751916","https://openalex.org/W2170375577","https://openalex.org/W2187548090","https://openalex.org/W3102130313"],"related_works":["https://openalex.org/W3144720315","https://openalex.org/W2584698272","https://openalex.org/W2159028615","https://openalex.org/W2025217054","https://openalex.org/W2117274934","https://openalex.org/W2052997717","https://openalex.org/W2078936369","https://openalex.org/W1486013383","https://openalex.org/W2048428008","https://openalex.org/W4382536836"],"abstract_inverted_index":{"A":[0],"test":[1],"bench":[2],"has":[3,32,45],"been":[4,28,33,46],"developed":[5],"for":[6,68,87],"systematic":[7,75],"characterization":[8,76],"of":[9,62],"high-resolution":[10],"analog-to-digital":[11],"converters.":[12],"The":[13],"reference":[14],"signal":[15],"is":[16],"generated":[17],"by":[18],"a":[19,74,88],"programable":[20],"Josephson":[21],"voltage":[22],"standard.":[23],"Three":[24],"24-bit":[25],"digitizers":[26,64],"have":[27],"characterized.":[29],"Noise":[30],"performance":[31],"measured":[34,47],"at":[35,53],"direct":[36],"current":[37],"using":[38],"the":[39,63,78,83],"Allan":[40],"deviation,":[41],"whereas":[42],"integral":[43],"nonlinearity":[44],"with":[48],"quasi-dynamic":[49],"stepwise":[50],"triangular":[51],"waveforms":[52],"frequencies":[54],"between":[55],"0.5":[56],"Hz":[57],"and":[58],"1":[59],"kHz.":[60],"None":[61],"outperforms":[65],"all":[66],"others":[67],"each":[69],"tested":[70],"characteristics.":[71],"Therefore,":[72],"such":[73],"provides":[77],"overview":[79],"needed":[80],"to":[81],"identify":[82],"most":[84],"suitable":[85],"digitizer":[86],"given":[89],"application.":[90]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":8},{"year":2017,"cited_by_count":8},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":5}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}