{"id":"https://openalex.org/W2176440588","doi":"https://doi.org/10.1109/tim.2011.2108612","title":"New Reference Measurement System for Calibration of VLF High Voltage","display_name":"New Reference Measurement System for Calibration of VLF High Voltage","publication_year":2011,"publication_date":"2011-04-12","ids":{"openalex":"https://openalex.org/W2176440588","doi":"https://doi.org/10.1109/tim.2011.2108612","mag":"2176440588"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2011.2108612","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2108612","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060418765","display_name":"S. R. Bergman","orcid":null},"institutions":[{"id":"https://openalex.org/I992397","display_name":"University of Bor\u00e5s","ror":"https://ror.org/01fdxwh83","country_code":"SE","type":"education","lineage":["https://openalex.org/I992397"]}],"countries":["SE"],"is_corresponding":true,"raw_author_name":"Sixten Bergman","raw_affiliation_strings":["SP Technical Research Institute of Sweden, Boras, Sweden","SP Tech. Res. Inst. of Sweden, Bor\u00e5s, Sweden"],"affiliations":[{"raw_affiliation_string":"SP Technical Research Institute of Sweden, Boras, Sweden","institution_ids":["https://openalex.org/I992397"]},{"raw_affiliation_string":"SP Tech. Res. Inst. of Sweden, Bor\u00e5s, Sweden","institution_ids":["https://openalex.org/I992397"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033625568","display_name":"Anders Bergman","orcid":"https://orcid.org/0000-0002-5121-8152"},"institutions":[{"id":"https://openalex.org/I992397","display_name":"University of Bor\u00e5s","ror":"https://ror.org/01fdxwh83","country_code":"SE","type":"education","lineage":["https://openalex.org/I992397"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Anders Bergman","raw_affiliation_strings":["SP Technical Research Institute of Sweden, Boras, Sweden","SP Tech. Res. Inst. of Sweden, Bor\u00e5s, Sweden"],"affiliations":[{"raw_affiliation_string":"SP Technical Research Institute of Sweden, Boras, Sweden","institution_ids":["https://openalex.org/I992397"]},{"raw_affiliation_string":"SP Tech. Res. Inst. of Sweden, Bor\u00e5s, Sweden","institution_ids":["https://openalex.org/I992397"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5060418765"],"corresponding_institution_ids":["https://openalex.org/I992397"],"apc_list":null,"apc_paid":null,"fwci":0.265,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.64789879,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"60","issue":"7","first_page":"2422","last_page":"2426"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.7338003516197205},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6989097595214844},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6578638553619385},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.6274347901344299},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5859174728393555},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.537877082824707},{"id":"https://openalex.org/keywords/high-voltage","display_name":"High voltage","score":0.4875340163707733},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.41124409437179565},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4026600122451782},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35452383756637573},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34892088174819946},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.268162339925766}],"concepts":[{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.7338003516197205},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6989097595214844},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6578638553619385},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.6274347901344299},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5859174728393555},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.537877082824707},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.4875340163707733},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.41124409437179565},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4026600122451782},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35452383756637573},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34892088174819946},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.268162339925766},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2011.2108612","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2108612","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.49000000953674316}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1557207449","https://openalex.org/W1591954208","https://openalex.org/W2019514496","https://openalex.org/W2116502967","https://openalex.org/W2136568878","https://openalex.org/W2163631342","https://openalex.org/W2241963622","https://openalex.org/W3149754046"],"related_works":["https://openalex.org/W3130844878","https://openalex.org/W581140221","https://openalex.org/W2021938143","https://openalex.org/W2227715107","https://openalex.org/W2118361755","https://openalex.org/W1966448314","https://openalex.org/W2326770010","https://openalex.org/W3049121420","https://openalex.org/W2374263760","https://openalex.org/W2083688425"],"abstract_inverted_index":{"A":[0],"reference":[1],"measuring":[2,37,48,67,74],"system":[3,38,75],"for":[4,90,134,150],"200":[5,120],"kV":[6],"from":[7],"very":[8],"low":[9],"frequencies":[10],"(0.1":[11],"Hz,":[12],"VLF)":[13],"up":[14,115],"to":[15,77,116,128],"50":[16],"Hz":[17],"based":[18],"on":[19],"traditional":[20],"high-voltage":[21],"components,":[22],"such":[23],"as":[24],"compressed":[25],"gas":[26],"capacitors,":[27],"has":[28,39,125],"been":[29,40,126],"developed":[30],"and":[31,52,59,84,93,144],"verified.":[32],"The":[33,69],"verification":[34],"of":[35,62,65,72,80,95,102,111,119],"the":[36,49,57,63,66,73,81,151],"performed":[41],"by":[42],"two":[43],"experimental":[44],"methods,":[45],"one":[46,53,79],"directly":[47],"scale":[50],"factor":[51],"using":[54],"measurements":[55],"over":[56],"frequency":[58,70],"voltage":[60,104,118],"range":[61],"components":[64],"system.":[68],"dependence":[71],"proved":[76,98],"be":[78,106,129],"dominating":[82],"uncertainties":[83],"was":[85],"extensively":[86],"researched.":[87],"Proper":[88],"correction":[89],"known":[91],"errors":[92],"estimation":[94],"uncertainty":[96,110],"contributions":[97],"that":[99],"traceable":[100],"measurement":[101,123],"VLF":[103],"can":[105,145],"made":[107],"with":[108],"an":[109,147],"less":[112],"than":[113],"0.038%":[114],"a":[117],"kV.":[121],"This":[122],"service":[124],"notified":[127],"included":[130],"in":[131],"SP":[132],"entries":[133],"Bureau":[135],"International":[136],"des":[137],"Poids":[138],"et":[139],"Mesures":[140],"key":[141],"comparison":[142],"database":[143],"serve":[146],"important":[148],"need":[149],"cable":[152],"industry.":[153]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}