{"id":"https://openalex.org/W2148897207","doi":"https://doi.org/10.1109/tim.2011.2108610","title":"The BIPM Compact Josephson Voltage Standard","display_name":"The BIPM Compact Josephson Voltage Standard","publication_year":2011,"publication_date":"2011-03-29","ids":{"openalex":"https://openalex.org/W2148897207","doi":"https://doi.org/10.1109/tim.2011.2108610","mag":"2148897207"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2011.2108610","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2108610","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086628612","display_name":"S Solve","orcid":"https://orcid.org/0000-0001-9949-0254"},"institutions":[{"id":"https://openalex.org/I883101600","display_name":"Bureau international des poids et mesures","ror":"https://ror.org/055vkyj43","country_code":"FR","type":"government","lineage":["https://openalex.org/I883101600"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"S Solve","raw_affiliation_strings":["International Bureau for Weights and Measures, Sevres, France"],"affiliations":[{"raw_affiliation_string":"International Bureau for Weights and Measures, Sevres, France","institution_ids":["https://openalex.org/I883101600"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000215080","display_name":"R Chayramy","orcid":"https://orcid.org/0000-0003-0128-3957"},"institutions":[{"id":"https://openalex.org/I883101600","display_name":"Bureau international des poids et mesures","ror":"https://ror.org/055vkyj43","country_code":"FR","type":"government","lineage":["https://openalex.org/I883101600"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"R Chayramy","raw_affiliation_strings":["International Bureau for Weights and Measures, Sevres, France"],"affiliations":[{"raw_affiliation_string":"International Bureau for Weights and Measures, Sevres, France","institution_ids":["https://openalex.org/I883101600"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5086628612"],"corresponding_institution_ids":["https://openalex.org/I883101600"],"apc_list":null,"apc_paid":null,"fwci":1.3248,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.83315555,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"60","issue":"7","first_page":"2366","last_page":"2371"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9480000138282776,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.7355923056602478},{"id":"https://openalex.org/keywords/standard-uncertainty","display_name":"Standard uncertainty","score":0.6010823249816895},{"id":"https://openalex.org/keywords/primary-standard","display_name":"Primary standard","score":0.5171805620193481},{"id":"https://openalex.org/keywords/josephson-effect","display_name":"Josephson effect","score":0.49724844098091125},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4924103021621704},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.4683710038661957},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41455554962158203},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4014865756034851},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35819411277770996},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2744208574295044},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.24958959221839905},{"id":"https://openalex.org/keywords/superconductivity","display_name":"Superconductivity","score":0.16966944932937622},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.10990113019943237}],"concepts":[{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.7355923056602478},{"id":"https://openalex.org/C2994224358","wikidata":"https://www.wikidata.org/wiki/Q13649246","display_name":"Standard uncertainty","level":3,"score":0.6010823249816895},{"id":"https://openalex.org/C67462049","wikidata":"https://www.wikidata.org/wiki/Q911470","display_name":"Primary standard","level":3,"score":0.5171805620193481},{"id":"https://openalex.org/C12038964","wikidata":"https://www.wikidata.org/wiki/Q764228","display_name":"Josephson effect","level":3,"score":0.49724844098091125},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4924103021621704},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.4683710038661957},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41455554962158203},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4014865756034851},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35819411277770996},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2744208574295044},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.24958959221839905},{"id":"https://openalex.org/C54101563","wikidata":"https://www.wikidata.org/wiki/Q124131","display_name":"Superconductivity","level":2,"score":0.16966944932937622},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10990113019943237},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2011.2108610","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2011.2108610","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2075329070","https://openalex.org/W2086959184","https://openalex.org/W2105865263","https://openalex.org/W2144737329","https://openalex.org/W2426339411","https://openalex.org/W2734717280","https://openalex.org/W4253222568"],"related_works":["https://openalex.org/W3130844878","https://openalex.org/W3139964550","https://openalex.org/W2360378882","https://openalex.org/W2108853753","https://openalex.org/W3015838480","https://openalex.org/W2388252395","https://openalex.org/W2354141393","https://openalex.org/W2605144881","https://openalex.org/W1980429525","https://openalex.org/W3041580214"],"abstract_inverted_index":{"Fifteen":[0],"National":[1],"Metrology":[2],"Institutes":[3],"have":[4,107],"recently":[5],"confirmed":[6],"their":[7],"interest":[8],"in":[9,11,65],"participating":[10],"the":[12,29,42,67,70],"International":[13],"Bureau":[14],"of":[15,23,31,69,117],"Weights":[16],"and":[17,41,96,99],"Measures":[18],"(BIPM)":[19],"direct":[20],"on-site":[21],"comparison":[22,35],"Josephson":[24,73],"array":[25],"voltage":[26,74],"standards":[27,106],"at":[28],"level":[30],"10":[32,120],"V.":[33],"This":[34],"has":[36],"been":[37],"ongoing":[38],"since":[39],"1994,":[40],"BIPM":[43,72],"primary":[44,105],"standard":[45,54,86],"involved":[46],"needs":[47],"to":[48,83,94],"be":[49],"replaced":[50],"by":[51],"a":[52,85,112],"new":[53,71],"built":[55],"from":[56],"components":[57,68],"based":[58],"on":[59],"modern":[60],"technology.":[61],"We":[62],"present":[63],"here":[64],"detail":[66],"standard.":[75],"The":[76],"main":[77],"goal":[78],"during":[79],"its":[80,102],"development":[81],"was":[82],"realize":[84],"that":[87],"is":[88],"more":[89,92],"easily":[90],"transportable,":[91],"convenient":[93],"use,":[95],"as":[97,101],"efficient":[98],"reliable":[100],"predecessor.":[103],"Both":[104],"already":[108],"shown":[109],"agreement":[110],"within":[111],"total":[113],"combined":[114],"relative":[115],"uncertainty":[116],"1.4":[118],"\u00d7":[119],"<sup":[121],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[122],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-10</sup>":[123],"(k":[124],"=":[125],"1).":[126]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}