{"id":"https://openalex.org/W2160530641","doi":"https://doi.org/10.1109/tim.2010.2101193","title":"Attenuation-Measurement Technique With a Small Mismatch Uncertainty Using Phase Characteristics of Multiple Reflected Signals","display_name":"Attenuation-Measurement Technique With a Small Mismatch Uncertainty Using Phase Characteristics of Multiple Reflected Signals","publication_year":2011,"publication_date":"2011-01-17","ids":{"openalex":"https://openalex.org/W2160530641","doi":"https://doi.org/10.1109/tim.2010.2101193","mag":"2160530641"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2010.2101193","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2101193","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001237524","display_name":"Anton Widarta","orcid":"https://orcid.org/0000-0002-7550-3337"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Anton Widarta","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020327247","display_name":"M. Endo","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Michiyuki Endo","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103560359","display_name":"Tomoteru Kawakami","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tomoteru Kawakami","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5001237524"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.16744737,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"60","issue":"7","first_page":"2715","last_page":"2719"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9758999943733215,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/attenuator","display_name":"Attenuator (electronics)","score":0.8408005237579346},{"id":"https://openalex.org/keywords/attenuation","display_name":"Attenuation","score":0.8388715982437134},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.5690010786056519},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5421361327171326},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.5340954661369324},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.5115826725959778},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.4764952063560486},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.46573320031166077},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.45928287506103516},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.45830631256103516},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.43106651306152344},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.42264822125434875},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4113445580005646},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33188462257385254},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.21878653764724731},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.21689629554748535},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.18868285417556763},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.18294212222099304},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1828363835811615},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15237867832183838},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1152929961681366}],"concepts":[{"id":"https://openalex.org/C174847166","wikidata":"https://www.wikidata.org/wiki/Q1269728","display_name":"Attenuator (electronics)","level":3,"score":0.8408005237579346},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.8388715982437134},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5690010786056519},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5421361327171326},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.5340954661369324},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.5115826725959778},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.4764952063560486},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.46573320031166077},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.45928287506103516},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.45830631256103516},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.43106651306152344},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.42264822125434875},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4113445580005646},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33188462257385254},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21878653764724731},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.21689629554748535},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18868285417556763},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.18294212222099304},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1828363835811615},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15237867832183838},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1152929961681366},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2010.2101193","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2101193","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7900000214576721}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W435853682","https://openalex.org/W624148300","https://openalex.org/W1497164245","https://openalex.org/W1977802053","https://openalex.org/W2071642993","https://openalex.org/W2079265843","https://openalex.org/W2121239013","https://openalex.org/W2163506443","https://openalex.org/W4231218976"],"related_works":["https://openalex.org/W2470882745","https://openalex.org/W2220451197","https://openalex.org/W2370122455","https://openalex.org/W2357424760","https://openalex.org/W2045761252","https://openalex.org/W4284698423","https://openalex.org/W2134837269","https://openalex.org/W1600397729","https://openalex.org/W4293868501","https://openalex.org/W3128781877"],"abstract_inverted_index":{"An":[0],"accurate":[1],"radio-frequency":[2],"and":[3,77,83,111],"microwave":[4],"attenuation-measurement":[5],"technique":[6],"with":[7,94,116],"a":[8,89,95,113],"small":[9],"mismatch":[10],"uncertainty":[11],"for":[12,38,59],"continuous-frequency":[13],"application":[14],"has":[15],"been":[16],"developed":[17],"by":[18,41],"shifting":[19],"the":[20,24,48,66,75,119],"phase":[21,34],"characteristics":[22],"of":[23,81,98],"multiple":[25],"reflected":[26],"signals.":[27],"A":[28],"loss-measurement":[29],"system":[30],"in":[31],"four":[32],"different":[33],"networks":[35],"is":[36,68,72],"set":[37],"this":[39],"purpose":[40],"introducing":[42],"two":[43],"low-reflective":[44],"lines":[45],"(airlines)":[46],"where":[47,118],"phase-shift":[49],"values":[50],"are":[51,109,122],"already":[52],"known.":[53],"From":[54],"substitution-loss":[55],"measurements":[56,87,117],"carried":[57],"out":[58],"variable":[60],"attenuators":[61],"as":[62],"devices":[63],"under":[64],"test,":[65],"attenuation":[67],"simply":[69],"obtained,":[70],"which":[71],"unrelated":[73],"to":[74,106],"source":[76],"load":[78],"reflection":[79],"coefficients":[80],"\u0393G":[82],"\u0393L,":[84],"respectively.":[85],"Experimental":[86],"on":[88],"10-dB":[90],"step":[91],"attenuator":[92],"performed":[93],"40-mm":[96],"length":[97],"airlines":[99],"at":[100],"almost":[101],"continuous":[102],"frequencies":[103],"from":[104],"12.3":[105],"14.1":[107],"GHz":[108],"demonstrated":[110],"show":[112],"good":[114],"agreement":[115],"test":[120],"ports":[121],"impedance-matched.":[123]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}