{"id":"https://openalex.org/W2012291524","doi":"https://doi.org/10.1109/tim.2010.2100650","title":"$RLC$ Bridge Based on an Automated Synchronous Sampling System","display_name":"$RLC$ Bridge Based on an Automated Synchronous Sampling System","publication_year":2011,"publication_date":"2011-03-29","ids":{"openalex":"https://openalex.org/W2012291524","doi":"https://doi.org/10.1109/tim.2010.2100650","mag":"2012291524"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2010.2100650","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2100650","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054781013","display_name":"F. Overney","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103407","display_name":"Swiss Federal Institute of Metrology","ror":"https://ror.org/0115xv923","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"F Overney","raw_affiliation_strings":["Federal Office of Metrology (METAS), Bern-Wabern, Switzerland","Fed. Office of Metrol., Bern-Wabern, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal Office of Metrology (METAS), Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]},{"raw_affiliation_string":"Fed. Office of Metrol., Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014516061","display_name":"B. Jeanneret","orcid":"https://orcid.org/0000-0003-1113-5253"},"institutions":[{"id":"https://openalex.org/I4210103407","display_name":"Swiss Federal Institute of Metrology","ror":"https://ror.org/0115xv923","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"B Jeanneret","raw_affiliation_strings":["Federal Office of Metrology (METAS), Bern-Wabern, Switzerland","Fed. Office of Metrol., Bern-Wabern, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal Office of Metrology (METAS), Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]},{"raw_affiliation_string":"Fed. Office of Metrol., Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210103407"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":3.7293,"has_fulltext":false,"cited_by_count":63,"citation_normalized_percentile":{"value":0.93079708,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"60","issue":"7","first_page":"2393","last_page":"2398"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.7581449747085571},{"id":"https://openalex.org/keywords/rlc-circuit","display_name":"RLC circuit","score":0.7070052027702332},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.634468138217926},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5739498734474182},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5376016497612},{"id":"https://openalex.org/keywords/lcr-meter","display_name":"LCR meter","score":0.5332365036010742},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5083779692649841},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.4840930700302124},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4697421193122864},{"id":"https://openalex.org/keywords/bridge","display_name":"Bridge (graph theory)","score":0.44762346148490906},{"id":"https://openalex.org/keywords/consistency","display_name":"Consistency (knowledge bases)","score":0.43930310010910034},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.43517518043518066},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4348503053188324},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3766103982925415},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3610841929912567},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2636494040489197},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23165294528007507},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.21797212958335876},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.11031651496887207}],"concepts":[{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.7581449747085571},{"id":"https://openalex.org/C89880566","wikidata":"https://www.wikidata.org/wiki/Q323477","display_name":"RLC circuit","level":4,"score":0.7070052027702332},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.634468138217926},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5739498734474182},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5376016497612},{"id":"https://openalex.org/C55592779","wikidata":"https://www.wikidata.org/wiki/Q4198687","display_name":"LCR meter","level":4,"score":0.5332365036010742},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5083779692649841},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4840930700302124},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4697421193122864},{"id":"https://openalex.org/C100776233","wikidata":"https://www.wikidata.org/wiki/Q2532492","display_name":"Bridge (graph theory)","level":2,"score":0.44762346148490906},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.43930310010910034},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.43517518043518066},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4348503053188324},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3766103982925415},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3610841929912567},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2636494040489197},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23165294528007507},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21797212958335876},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.11031651496887207},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2010.2100650","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2100650","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6000000238418579}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W577575701","https://openalex.org/W651355665","https://openalex.org/W1977377847","https://openalex.org/W1986365238","https://openalex.org/W1986403062","https://openalex.org/W2003654312","https://openalex.org/W2008065210","https://openalex.org/W2008823736","https://openalex.org/W2085820687","https://openalex.org/W2086851613","https://openalex.org/W2098514780","https://openalex.org/W2117206816","https://openalex.org/W2135551595","https://openalex.org/W2138243688","https://openalex.org/W2139483618","https://openalex.org/W2143961336","https://openalex.org/W2147051816","https://openalex.org/W2154544822","https://openalex.org/W2156646343","https://openalex.org/W2161620929","https://openalex.org/W2168519832","https://openalex.org/W2326864645","https://openalex.org/W2330830560","https://openalex.org/W2985128999","https://openalex.org/W3006837634","https://openalex.org/W3102130313","https://openalex.org/W6774116556"],"related_works":["https://openalex.org/W4312527407","https://openalex.org/W1911543349","https://openalex.org/W2105517597","https://openalex.org/W1549949180","https://openalex.org/W2004121165","https://openalex.org/W1989252551","https://openalex.org/W2997572064","https://openalex.org/W2120596090","https://openalex.org/W2333555081","https://openalex.org/W2109314689"],"abstract_inverted_index":{"AnRLCbridge":[0],"based":[1],"on":[2],"an":[3],"automated":[4],"synchronous":[5],"sampling":[6],"system":[7],"has":[8],"been":[9,68,118],"developed":[10],"using":[11,60,123],"commercially":[12],"available":[13],"high-resolution":[14],"analog-to-digital":[15],"and":[16,39,74,97],"digital-to-analog":[17],"converters.":[18],"This":[19],"bridge":[20,56,136],"allows":[21],"the":[22,31,55,83,93,107,110,134,139],"comparison":[23],"of":[24,27,54,82,109,112],"any":[25],"kind":[26],"impedance":[28],"standards":[29,76],"in":[30],"four-terminal-pair":[32],"configuration":[33],"at":[34,77],"frequencies":[35],"between":[36],"50":[37],"Hz":[38],"20":[40,90],"kHz":[41],"within":[42],"a":[43,61,113,124],"range":[44,96],"from":[45],"1":[46,104],"\u03a9":[47],"to":[48,120],"100":[49],"k\u03a9.":[50],"An":[51],"automatic":[52],"balance":[53],"is":[57,87,131],"carried":[58],"out":[59],"downhill":[62],"simplex":[63],"algorithm.":[64],"Consistency":[65],"checks":[66],"have":[67,117],"realized":[69],"by":[70],"comparing":[71],"resistance,":[72],"inductance,":[73],"capacitance":[75,115,127],"different":[78],"frequencies.":[79],"The":[80,129],"consistency":[81],"measured":[84],"voltage":[85],"ratio":[86],"better":[88],"than":[89,100,133],"\u03bcV/V":[91,102],"over":[92,138],"whole":[94,140],"frequency":[95,141],"even":[98],"smaller":[99,132],"5":[101],"around":[103],"kHz.":[105],"Finally,":[106],"results":[108],"calibration":[111],"10-nF":[114],"standard":[116],"compared":[119],"those":[121],"obtained":[122],"commercial":[125,135],"high-accuracy":[126],"bridge.":[128],"difference":[130],"specifications":[137],"range.":[142]},"counts_by_year":[{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":8},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":7},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":7}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}