{"id":"https://openalex.org/W2121611756","doi":"https://doi.org/10.1109/tim.2010.2099310","title":"Reduced Nonlinearity Effect on the Electronic Measurement of the Boltzmann Constant","display_name":"Reduced Nonlinearity Effect on the Electronic Measurement of the Boltzmann Constant","publication_year":2011,"publication_date":"2011-01-10","ids":{"openalex":"https://openalex.org/W2121611756","doi":"https://doi.org/10.1109/tim.2010.2099310","mag":"2121611756"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2010.2099310","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2099310","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103077484","display_name":"Jifeng Qu","orcid":"https://orcid.org/0000-0002-2026-9184"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jifeng Qu","raw_affiliation_strings":["National Institute of Metrology, Beijing, China","Nat. Inst. of Metrol., Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]},{"raw_affiliation_string":"Nat. Inst. of Metrol., Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081723705","display_name":"Samuel P. Benz","orcid":"https://orcid.org/0000-0002-8679-0765"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Samuel P. Benz","raw_affiliation_strings":["National Institute for Standards and Technology, Boulder, CO, USA","Nat. Inst. of Stand. & Technol., Boulder, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute for Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Nat. Inst. of Stand. & Technol., Boulder, CO, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015821500","display_name":"Alessio Pollarolo","orcid":"https://orcid.org/0000-0002-7501-9289"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alessio Pollarolo","raw_affiliation_strings":["National Institute for Standards and Technology, Boulder, CO, USA","Nat. Inst. of Stand. & Technol., Boulder, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute for Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Nat. Inst. of Stand. & Technol., Boulder, CO, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069441015","display_name":"Horst Rogalla","orcid":"https://orcid.org/0000-0003-3946-0891"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Horst Rogalla","raw_affiliation_strings":["Department of Applied Physics, University of Twente, Enschede, Netherlands","Dept. of Appl. Phys., Univ. of Twente, Enschede, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Applied Physics, University of Twente, Enschede, Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Dept. of Appl. Phys., Univ. of Twente, Enschede, Netherlands","institution_ids":["https://openalex.org/I94624287"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":40.6663,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.99352955,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"60","issue":"7","first_page":"2427","last_page":"2433"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/preamplifier","display_name":"Preamplifier","score":0.7691279649734497},{"id":"https://openalex.org/keywords/boltzmann-constant","display_name":"Boltzmann constant","score":0.672002375125885},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5730310082435608},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.5510709881782532},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5098732709884644},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5044220685958862},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4723972976207733},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.46253159642219543},{"id":"https://openalex.org/keywords/constant","display_name":"Constant (computer programming)","score":0.45340389013290405},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.448402464389801},{"id":"https://openalex.org/keywords/integral-nonlinearity","display_name":"Integral nonlinearity","score":0.44304004311561584},{"id":"https://openalex.org/keywords/analog-to-digital-converter","display_name":"Analog-to-digital converter","score":0.4197501540184021},{"id":"https://openalex.org/keywords/distortion","display_name":"Distortion (music)","score":0.41460439562797546},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3383510112762451},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3170689344406128},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28269293904304504},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.19750750064849854},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.1476210653781891}],"concepts":[{"id":"https://openalex.org/C14245642","wikidata":"https://www.wikidata.org/wiki/Q399804","display_name":"Preamplifier","level":4,"score":0.7691279649734497},{"id":"https://openalex.org/C35304006","wikidata":"https://www.wikidata.org/wiki/Q5962","display_name":"Boltzmann constant","level":2,"score":0.672002375125885},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5730310082435608},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.5510709881782532},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5098732709884644},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5044220685958862},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4723972976207733},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.46253159642219543},{"id":"https://openalex.org/C2777027219","wikidata":"https://www.wikidata.org/wiki/Q1284190","display_name":"Constant (computer programming)","level":2,"score":0.45340389013290405},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.448402464389801},{"id":"https://openalex.org/C130829357","wikidata":"https://www.wikidata.org/wiki/Q1665386","display_name":"Integral nonlinearity","level":4,"score":0.44304004311561584},{"id":"https://openalex.org/C2777271169","wikidata":"https://www.wikidata.org/wiki/Q190169","display_name":"Analog-to-digital converter","level":3,"score":0.4197501540184021},{"id":"https://openalex.org/C126780896","wikidata":"https://www.wikidata.org/wiki/Q899871","display_name":"Distortion (music)","level":4,"score":0.41460439562797546},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3383510112762451},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3170689344406128},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28269293904304504},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.19750750064849854},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.1476210653781891},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2010.2099310","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2099310","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:ris.utwente.nl:openaire_cris_publications/3d47fc32-f7be-41b8-ad93-94c79ae761e7","is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/3d47fc32-f7be-41b8-ad93-94c79ae761e7","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Qu, J, Benz, S P, Pollarolo, A & Rogalla, H 2011, 'Reduced nonlinearity effect on the electronic measurement of the Boltzmann constant', IEEE transactions on instrumentation and measurement, vol. 60, no. 7, pp. 2427-2433. https://doi.org/10.1109/TIM.2010.2099310","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320332178","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1513028201","https://openalex.org/W1968778486","https://openalex.org/W2002005624","https://openalex.org/W2013139339","https://openalex.org/W2019628272","https://openalex.org/W2024940833","https://openalex.org/W2031839987","https://openalex.org/W2038462420","https://openalex.org/W2039857817","https://openalex.org/W2044835563","https://openalex.org/W2045940492","https://openalex.org/W2050119997","https://openalex.org/W2061000251","https://openalex.org/W2096225086","https://openalex.org/W2135637883","https://openalex.org/W2139126750","https://openalex.org/W2157187356","https://openalex.org/W2168347882","https://openalex.org/W2169061325","https://openalex.org/W2169977268","https://openalex.org/W2172315254","https://openalex.org/W2729453689","https://openalex.org/W3097297264","https://openalex.org/W3173107357","https://openalex.org/W4211178706","https://openalex.org/W4246277289","https://openalex.org/W4297835540","https://openalex.org/W6740936141"],"related_works":["https://openalex.org/W2355424643","https://openalex.org/W2025217054","https://openalex.org/W2032723334","https://openalex.org/W2337962489","https://openalex.org/W2363997903","https://openalex.org/W2010414704","https://openalex.org/W1979402805","https://openalex.org/W4293085241","https://openalex.org/W2557005923","https://openalex.org/W2131872006"],"abstract_inverted_index":{"The":[0,69,104],"National":[1],"Institute":[2],"of":[3,48,60,80,113,117,125],"Standards":[4],"and":[5,30,64,98],"Technology":[6],"has":[7],"developed":[8],"a":[9,17,122],"quantum-voltage-noise-source-calibrated":[10],"Johnson":[11],"noise":[12,32],"thermometer":[13],"(JNT)":[14],"to":[15,36,86,109],"provide":[16],"new":[18,99],"electronic":[19,115],"measurement":[20,116],"technique":[21],"for":[22],"determining":[23],"the":[24,40,49,52,57,62,65,76,81,84,87,111,118],"Boltzmann":[25,119],"constant.":[26],"Improvements":[27],"in":[28,39,51,56],"electronics":[29,54],"synthesized":[31],"waveforms":[33],"have":[34,44],"led":[35],"reduced":[37,73],"uncertainty":[38,124],"measurement.":[41],"Recent":[42],"investigations":[43],"shown":[45],"that":[46],"some":[47],"distortion":[50,70],"present":[53],"arises":[55],"differential":[58,88],"stage":[59],"both":[61],"preamplifier":[63],"analog-to-digital":[66],"converter":[67],"(ADC).":[68],"can":[71],"be":[72],"by":[74],"compensating":[75],"direct":[77],"current":[78],"offset":[79],"signal":[82],"at":[83,121],"inputs":[85],"stage.":[89],"A":[90],"four-channel":[91],"cross":[92],"correlation":[93],"JNT":[94],"with":[95],"optimized":[96],"preamplifiers":[97],"ADCs":[100],"is":[101],"being":[102],"assembled.":[103],"improvements":[105],"are":[106],"on":[107],"track":[108],"reach":[110],"goal":[112],"an":[114],"constant":[120],"relative":[123],"6":[126],"\u00d7":[127],"10":[128],"<sup":[129],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[130],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-6</sup>":[131],".":[132]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}