{"id":"https://openalex.org/W2096225086","doi":"https://doi.org/10.1109/tim.2010.2098110","title":"Development of a Four-Channel Johnson Noise Thermometry System","display_name":"Development of a Four-Channel Johnson Noise Thermometry System","publication_year":2011,"publication_date":"2011-01-03","ids":{"openalex":"https://openalex.org/W2096225086","doi":"https://doi.org/10.1109/tim.2010.2098110","mag":"2096225086"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2010.2098110","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2098110","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015821500","display_name":"Alessio Pollarolo","orcid":"https://orcid.org/0000-0002-7501-9289"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alessio Pollarolo","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011542345","display_name":"Chiharu Urano","orcid":"https://orcid.org/0000-0002-7581-2009"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP","US"],"is_corresponding":false,"raw_author_name":"Chiharu Urano","raw_affiliation_strings":["National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","National Institute for Standards and Technology, Boulder, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Institute for Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020282923","display_name":"Paul D. Dresselhaus","orcid":"https://orcid.org/0000-0003-2493-0504"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Paul D. Dresselhaus","raw_affiliation_strings":["National Institute for Standards and Technology, Boulder, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute for Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103077484","display_name":"Jifeng Qu","orcid":"https://orcid.org/0000-0002-2026-9184"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jifeng Qu","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069441015","display_name":"Horst Rogalla","orcid":"https://orcid.org/0000-0003-3946-0891"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Horst Rogalla","raw_affiliation_strings":["Department of Applied Physics, University of Twente, Enschede, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Applied Physics, University of Twente, Enschede, Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081723705","display_name":"Samuel P. Benz","orcid":"https://orcid.org/0000-0002-8679-0765"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Samuel P. Benz","raw_affiliation_strings":["National Institute for Standards and Technology, Boulder, CO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute for Standards and Technology, Boulder, CO, USA","institution_ids":["https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":5,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":16.2665,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.98633019,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"60","issue":"7","first_page":"2655","last_page":"2659"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.588666558265686},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5149115324020386},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.5063599348068237},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.5040601491928101},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.49680736660957336},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.49148476123809814},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.4631613492965698},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.45850616693496704},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.4375160336494446},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.42996761202812195},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4181557297706604},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41680869460105896},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32432088255882263},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2574103772640228},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16450044512748718},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15683570504188538},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.1499028503894806},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.11735472083091736},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11619046330451965},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08367487788200378}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.588666558265686},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5149115324020386},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.5063599348068237},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5040601491928101},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.49680736660957336},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.49148476123809814},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.4631613492965698},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.45850616693496704},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.4375160336494446},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.42996761202812195},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4181557297706604},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41680869460105896},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32432088255882263},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2574103772640228},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16450044512748718},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15683570504188538},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.1499028503894806},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.11735472083091736},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11619046330451965},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08367487788200378},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2010.2098110","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2098110","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:ris.utwente.nl:openaire_cris_publications/cd58f4f1-862e-48cd-b1e4-2cf832fdfacb","is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/cd58f4f1-862e-48cd-b1e4-2cf832fdfacb","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pollarolo, A, Urano, C, Dresselhaus, P D, Qu, J, Rogalla, H & Benz, S P 2011, 'Development of a four-channel Johnson noise thermometry system', IEEE transactions on instrumentation and measurement, vol. 60, no. 7, pp. 2655-2659. https://doi.org/10.1109/TIM.2010.2098110","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6000000238418579}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1966942955","https://openalex.org/W1999170076","https://openalex.org/W2024940833","https://openalex.org/W2039857817","https://openalex.org/W2044835563","https://openalex.org/W2050119997","https://openalex.org/W2112105574","https://openalex.org/W2121611756","https://openalex.org/W2139126750","https://openalex.org/W2157187356","https://openalex.org/W2168347882","https://openalex.org/W2172315254","https://openalex.org/W2729453689","https://openalex.org/W3097297264","https://openalex.org/W6740936141","https://openalex.org/W6986739196"],"related_works":["https://openalex.org/W3049121420","https://openalex.org/W4309995555","https://openalex.org/W2326770010","https://openalex.org/W2144375094","https://openalex.org/W2374263760","https://openalex.org/W2360316265","https://openalex.org/W151755354","https://openalex.org/W4255647936","https://openalex.org/W2057590747","https://openalex.org/W4293868501"],"abstract_inverted_index":{"Long":[0],"integration":[1],"periods":[2],"are":[3,116],"necessary":[4],"to":[5,31],"reach":[6],"low":[7],"uncertainty":[8,36],"when":[9],"measuring":[10],"temperature":[11],"through":[12],"Johnson":[13],"noise":[14],"thermometry":[15],"(JNT).":[16],"The":[17],"main":[18],"goal":[19],"of":[20,24,37,47,58,101],"the":[21,45,48,62,75,109,126],"National":[22],"Institute":[23],"Standards":[25],"and":[26,91],"Technology":[27],"JNT":[28,70],"program":[29],"is":[30,79,112],"achieve":[32],"a":[33,68,86,92,119],"combined":[34],"relative":[35],"6":[38],"\u00d7":[39],"10":[40],"<sup":[41],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[42],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-6</sup>":[43],"in":[44,54],"measurement":[46,76,130],"water":[49],"triple":[50],"point":[51],"temperature,":[52],"which,":[53],"turn,":[55],"allows":[56],"determination":[57],"Boltzmann's":[59],"constant":[60],"at":[61],"same":[63],"uncertainty.":[64],"To":[65],"this":[66],"end,":[67],"four-channel":[69],"system,":[71],"which":[72,124],"will":[73],"reduce":[74],"period":[77],"twofold,":[78],"being":[80],"developed":[81],"with":[82],"new":[83,110],"components,":[84],"including":[85],"switchboard,":[87],"analog-to-digital":[88],"converters":[89],"(ADCs),":[90],"programmable":[93],"recharging":[94],"power":[95],"supply":[96],"system.":[97],"A":[98],"significant":[99],"source":[100],"systematic":[102],"error":[103],"that":[104],"was":[105],"discovered":[106],"while":[107],"implementing":[108],"ADCs":[111],"described.":[113],"New":[114],"measurements":[115],"presented":[117],"using":[118],"doubled":[120],"ADC":[121],"sampling":[122],"rate,":[123],"show":[125],"potential":[127],"for":[128],"higher":[129],"bandwidth.":[131]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}