{"id":"https://openalex.org/W2137029949","doi":"https://doi.org/10.1109/tim.2010.2091298","title":"Auxiliary-Transmission-Line Method for Calibrating Noise Temperature of a Microwave Thermal Noise Source","display_name":"Auxiliary-Transmission-Line Method for Calibrating Noise Temperature of a Microwave Thermal Noise Source","publication_year":2011,"publication_date":"2011-03-29","ids":{"openalex":"https://openalex.org/W2137029949","doi":"https://doi.org/10.1109/tim.2010.2091298","mag":"2137029949"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2010.2091298","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2091298","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082512165","display_name":"Hitoshi Iida","orcid":"https://orcid.org/0000-0003-0055-9253"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"H Iida","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007549738","display_name":"Yozo Shimada","orcid":"https://orcid.org/0000-0002-8474-6699"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y Shimada","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065723905","display_name":"K. Komiyama","orcid":"https://orcid.org/0000-0001-6599-4091"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K Komiyama","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute for Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5082512165"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.15572389,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"60","issue":"7","first_page":"2308","last_page":"2313"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11312","display_name":"Soil Moisture and Remote Sensing","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise-temperature","display_name":"Noise temperature","score":0.6667189002037048},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6244100332260132},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.547590970993042},{"id":"https://openalex.org/keywords/transmission-line","display_name":"Transmission line","score":0.5418544411659241},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5235138535499573},{"id":"https://openalex.org/keywords/microwave-radiometer","display_name":"Microwave radiometer","score":0.514295756816864},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.5139117240905762},{"id":"https://openalex.org/keywords/radiometer","display_name":"Radiometer","score":0.5089101791381836},{"id":"https://openalex.org/keywords/noise-generator","display_name":"Noise generator","score":0.45699000358581543},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.45535731315612793},{"id":"https://openalex.org/keywords/noise-floor","display_name":"Noise floor","score":0.4418392777442932},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.436831533908844},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4261331558227539},{"id":"https://openalex.org/keywords/electric-power-transmission","display_name":"Electric power transmission","score":0.41534480452537537},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3932810425758362},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3831227719783783},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3547663688659668},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.34022656083106995},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.3078174889087677},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.21266263723373413},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18722003698349},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.1809537708759308},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.1638830006122589},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1387605369091034},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.08217278122901917}],"concepts":[{"id":"https://openalex.org/C52660251","wikidata":"https://www.wikidata.org/wiki/Q17083145","display_name":"Noise temperature","level":3,"score":0.6667189002037048},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6244100332260132},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.547590970993042},{"id":"https://openalex.org/C33441834","wikidata":"https://www.wikidata.org/wiki/Q693004","display_name":"Transmission line","level":2,"score":0.5418544411659241},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5235138535499573},{"id":"https://openalex.org/C96960616","wikidata":"https://www.wikidata.org/wiki/Q3814470","display_name":"Microwave radiometer","level":3,"score":0.514295756816864},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.5139117240905762},{"id":"https://openalex.org/C120189094","wikidata":"https://www.wikidata.org/wiki/Q850281","display_name":"Radiometer","level":2,"score":0.5089101791381836},{"id":"https://openalex.org/C74342258","wikidata":"https://www.wikidata.org/wiki/Q2133526","display_name":"Noise generator","level":5,"score":0.45699000358581543},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.45535731315612793},{"id":"https://openalex.org/C187612029","wikidata":"https://www.wikidata.org/wiki/Q17083130","display_name":"Noise floor","level":4,"score":0.4418392777442932},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.436831533908844},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4261331558227539},{"id":"https://openalex.org/C140311924","wikidata":"https://www.wikidata.org/wiki/Q200928","display_name":"Electric power transmission","level":2,"score":0.41534480452537537},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3932810425758362},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3831227719783783},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3547663688659668},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.34022656083106995},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.3078174889087677},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.21266263723373413},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18722003698349},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.1809537708759308},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.1638830006122589},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1387605369091034},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.08217278122901917},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2010.2091298","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2091298","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8700000047683716,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320311508","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1494697680","https://openalex.org/W1639446174","https://openalex.org/W2033077331","https://openalex.org/W2072693502","https://openalex.org/W2073998567","https://openalex.org/W2085136973","https://openalex.org/W2107913900","https://openalex.org/W2115748297","https://openalex.org/W2117707601","https://openalex.org/W2152987100","https://openalex.org/W2154209275","https://openalex.org/W2510162011"],"related_works":["https://openalex.org/W2118931924","https://openalex.org/W1988257008","https://openalex.org/W2165129972","https://openalex.org/W3165817081","https://openalex.org/W2070810745","https://openalex.org/W2180056344","https://openalex.org/W2069034821","https://openalex.org/W2541054142","https://openalex.org/W2025552042","https://openalex.org/W2742666096"],"abstract_inverted_index":{"We":[0,92],"have":[1],"proposed":[2],"and":[3,49,113,120],"discussed":[4],"a":[5,15,47,60,95,114],"method":[6,69,117,136],"to":[7],"calibrate":[8],"the":[9,35,43,50,55,86,98,124,131,134,139],"effective":[10],"noise":[11,16,29,111],"temperature":[12,119],"(ENT)":[13],"of":[14,54,78,89,97,133],"source":[17,30],"by":[18,46,59,67],"using":[19,100,108],"an":[20,75,104],"auxiliary":[21],"transmission":[22,56,125],"line":[23,57],"(ATL).":[24],"A":[25],"cryogenic":[26],"7-mm":[27],"coaxial":[28],"was":[31,70],"developed":[32],"for":[33,137],"verifying":[34],"ATL":[36,135],"method.":[37],"The":[38,64,127],"ENT":[39,66,99],"is":[40],"determined":[41],"from":[42],"parameters":[44],"evaluated":[45],"radiometer":[48,106],"available":[51],"power":[52],"ratio":[53],"measured":[58],"vector":[61],"network":[62],"analyzer.":[63],"calibrated":[65],"this":[68],"139.8":[71],"K-143.6":[72],"K":[73,81],"with":[74],"expanded":[76],"uncertainty":[77],"4.0":[79],"K-4.6":[80],"(k":[82],"=":[83],"2)":[84],"in":[85],"frequency":[87],"range":[88],"8-12":[90],"GHz.":[91],"also":[93],"performed":[94],"comparison":[96],"two":[101,109],"different":[102],"methods:":[103],"ordinary":[105],"measurement":[107],"reference":[110],"sources":[112],"theoretical":[115],"calculation":[116],"analyzing":[118],"loss":[121],"distribution":[122],"along":[123],"line.":[126],"experimental":[128],"results":[129],"show":[130],"validity":[132],"determining":[138],"ENT.":[140]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}