{"id":"https://openalex.org/W2147026261","doi":"https://doi.org/10.1109/tim.2010.2088050","title":"Johnson\u2013Nyquist Noise of the Quantized Hall Resistance","display_name":"Johnson\u2013Nyquist Noise of the Quantized Hall Resistance","publication_year":2010,"publication_date":"2010-11-18","ids":{"openalex":"https://openalex.org/W2147026261","doi":"https://doi.org/10.1109/tim.2010.2088050","mag":"2147026261"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2010.2088050","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2088050","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052377826","display_name":"J. Schurr","orcid":"https://orcid.org/0000-0001-7985-5770"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"J\u00fcrgen Schurr","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]},{"raw_affiliation_string":"Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040744167","display_name":"Harald Moser","orcid":"https://orcid.org/0000-0002-1393-748X"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Harald Moser","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]},{"raw_affiliation_string":"Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078486757","display_name":"K. Pierz","orcid":"https://orcid.org/0000-0001-6400-1799"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Klaus Pierz","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]},{"raw_affiliation_string":"Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110251131","display_name":"G. Ramm","orcid":null},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"G\u00fcnther Ramm","raw_affiliation_strings":["Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany"],"affiliations":[{"raw_affiliation_string":"Physikalisch-Technisch Bundesanstalt, Brunswick, Germany","institution_ids":["https://openalex.org/I1285933455"]},{"raw_affiliation_string":"Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany","institution_ids":["https://openalex.org/I1285933455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111658130","display_name":"B P Kibble","orcid":null},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Bryan P. Kibble","raw_affiliation_strings":["National Physical Laboratory, Teddington, UK","Nat. Phys. Lab., Teddington, UK"],"affiliations":[{"raw_affiliation_string":"National Physical Laboratory, Teddington, UK","institution_ids":["https://openalex.org/I134421475"]},{"raw_affiliation_string":"Nat. Phys. Lab., Teddington, UK","institution_ids":["https://openalex.org/I134421475"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5052377826"],"corresponding_institution_ids":["https://openalex.org/I1285933455"],"apc_list":null,"apc_paid":null,"fwci":1.7272,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.85459956,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"60","issue":"7","first_page":"2280","last_page":"2285"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10382","display_name":"Quantum and electron transport phenomena","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10382","display_name":"Quantum and electron transport phenomena","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/quantum-hall-effect","display_name":"Quantum Hall effect","score":0.6962863206863403},{"id":"https://openalex.org/keywords/nyquist\u2013shannon-sampling-theorem","display_name":"Nyquist\u2013Shannon sampling theorem","score":0.6231312155723572},{"id":"https://openalex.org/keywords/johnson\u2013nyquist-noise","display_name":"Johnson\u2013Nyquist noise","score":0.6129589676856995},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5998684167861938},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.5367509126663208},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5349698066711426},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.4370805025100708},{"id":"https://openalex.org/keywords/nyquist-plot","display_name":"Nyquist plot","score":0.4323032796382904},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3956959545612335},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38355493545532227},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3423845171928406},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.260820209980011},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2234475314617157},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2212558388710022},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2041022777557373},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.1347745656967163},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.09776812791824341},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.07694083452224731}],"concepts":[{"id":"https://openalex.org/C200369452","wikidata":"https://www.wikidata.org/wiki/Q1047822","display_name":"Quantum Hall effect","level":3,"score":0.6962863206863403},{"id":"https://openalex.org/C288623","wikidata":"https://www.wikidata.org/wiki/Q679800","display_name":"Nyquist\u2013Shannon sampling theorem","level":2,"score":0.6231312155723572},{"id":"https://openalex.org/C104419016","wikidata":"https://www.wikidata.org/wiki/Q1337490","display_name":"Johnson\u2013Nyquist noise","level":3,"score":0.6129589676856995},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5998684167861938},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.5367509126663208},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5349698066711426},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4370805025100708},{"id":"https://openalex.org/C195762429","wikidata":"https://www.wikidata.org/wiki/Q1756793","display_name":"Nyquist plot","level":5,"score":0.4323032796382904},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3956959545612335},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38355493545532227},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3423845171928406},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.260820209980011},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2234475314617157},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2212558388710022},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2041022777557373},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.1347745656967163},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.09776812791824341},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.07694083452224731},{"id":"https://openalex.org/C7040849","wikidata":"https://www.wikidata.org/wiki/Q899580","display_name":"Dielectric spectroscopy","level":4,"score":0.0},{"id":"https://openalex.org/C52859227","wikidata":"https://www.wikidata.org/wiki/Q7877","display_name":"Electrochemistry","level":3,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2010.2088050","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2088050","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1973795823","https://openalex.org/W1978044311","https://openalex.org/W1995989011","https://openalex.org/W2003709203","https://openalex.org/W2004621497","https://openalex.org/W2005586885","https://openalex.org/W2008575768","https://openalex.org/W2013383242","https://openalex.org/W2023507296","https://openalex.org/W2038462420","https://openalex.org/W2039794774","https://openalex.org/W2068520389","https://openalex.org/W2086672464","https://openalex.org/W2145125723","https://openalex.org/W2147026261","https://openalex.org/W2158407403","https://openalex.org/W2171036925","https://openalex.org/W2171070655","https://openalex.org/W3152386954","https://openalex.org/W4251050444"],"related_works":["https://openalex.org/W2028352647","https://openalex.org/W2100446824","https://openalex.org/W2724644657","https://openalex.org/W2349405112","https://openalex.org/W1983231378","https://openalex.org/W1580703813","https://openalex.org/W2137960350","https://openalex.org/W2034217801","https://openalex.org/W2370888478","https://openalex.org/W2119695547"],"abstract_inverted_index":{"This":[0],"paper":[1],"reports":[2],"on":[3],"the":[4,9,42],"thermal":[5],"Johnson-Nyquist":[6],"noise":[7,60],"of":[8,71],"quantum":[10,43],"Hall":[11,44],"and":[12,23,37],"longitudinal":[13],"resistances,":[14],"which":[15],"were":[16],"measured":[17],"both":[18],"without":[19],"an":[20,25],"applied":[21,27],"current":[22],"with":[24,68],"externally":[26],"alternating":[28],"or":[29],"direct":[30],"current.":[31],"The":[32],"results":[33],"verify":[34],"expected":[35],"behavior":[36],"give":[38],"interesting":[39],"insights":[40],"into":[41],"effect.":[45],"They":[46],"also":[47],"demonstrate":[48],"that":[49],"ac":[50],"measuring":[51,65],"techniques":[52],"commonly":[53],"used":[54],"in":[55],"impedance":[56],"metrology":[57],"can":[58],"take":[59],"as":[61],"a":[62,69],"signal,":[63],"reliably":[64],"tiny":[66],"effects":[67],"resolution":[70],"10":[72],"pV.":[73]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":4},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}