{"id":"https://openalex.org/W2145397549","doi":"https://doi.org/10.1109/tim.2010.2063972","title":"An Innovative Ultrasonic Time-of-Flight Measurement Method Using Peak Time Sequences of Different Frequencies\u2014Part II: Implementation","display_name":"An Innovative Ultrasonic Time-of-Flight Measurement Method Using Peak Time Sequences of Different Frequencies\u2014Part II: Implementation","publication_year":2010,"publication_date":"2010-12-14","ids":{"openalex":"https://openalex.org/W2145397549","doi":"https://doi.org/10.1109/tim.2010.2063972","mag":"2145397549"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2010.2063972","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2063972","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108431810","display_name":"Chi-Ming Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chi-Ming Yang","raw_affiliation_strings":["Institute of Mechanical Engineering, National Central University, Zhongli, Taiwan","Inst. of Mech. Eng., Nat. Central Univ., Zhongli, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Mechanical Engineering, National Central University, Zhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"Inst. of Mech. Eng., Nat. Central Univ., Zhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077150199","display_name":"Shyh-Biau Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shyh-Biau Jiang","raw_affiliation_strings":["Institute of Mechanical Engineering, Institute of Opto-Mechatronics Engineering, National Central University, Zhongli, Taiwan","Inst. of Mech. Eng., Nat. Central Univ., Zhongli, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Mechanical Engineering, Institute of Opto-Mechatronics Engineering, National Central University, Zhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"Inst. of Mech. Eng., Nat. Central Univ., Zhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111956876","display_name":"Da-Yuan Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Da-Yuan Lin","raw_affiliation_strings":["Institute of Opto-Mechatronics Engineering, National Central University, Zhongli, Taiwan","Inst. of Opto-Mechatron. Eng., Nat. Central Univ., Zhongli, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Opto-Mechatronics Engineering, National Central University, Zhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"Inst. of Opto-Mechatron. Eng., Nat. Central Univ., Zhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016184518","display_name":"Lu Fumin","orcid":null},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Fu-Min Lu","raw_affiliation_strings":["Institute of Opto-Mechatronics Engineering, National Central University, Zhongli, Taiwan","Inst. of Opto-Mechatron. Eng., Nat. Central Univ., Zhongli, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Opto-Mechatronics Engineering, National Central University, Zhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"Inst. of Opto-Mechatron. Eng., Nat. Central Univ., Zhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002538303","display_name":"Yingming Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ying-Ming Wu","raw_affiliation_strings":["Institute of Opto-Mechatronics Engineering, National Central University, Zhongli, Taiwan","Inst. of Opto-Mechatron. Eng., Nat. Central Univ., Zhongli, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Opto-Mechatronics Engineering, National Central University, Zhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"Inst. of Opto-Mechatron. Eng., Nat. Central Univ., Zhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030647175","display_name":"Tse-Liang Yeh","orcid":null},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tse-Liang Yeh","raw_affiliation_strings":["Institute of Mechanical Engineering, Institute of Opto-Mechatronics Engineering, National Central University, Zhongli, Taiwan","Inst. of Mech. Eng., Nat. Central Univ., Zhongli, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Mechanical Engineering, Institute of Opto-Mechatronics Engineering, National Central University, Zhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"Inst. of Mech. Eng., Nat. Central Univ., Zhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I22265921"],"apc_list":null,"apc_paid":null,"fwci":2.5753,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.89004544,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"60","issue":"3","first_page":"745","last_page":"757"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ultrasonic-sensor","display_name":"Ultrasonic sensor","score":0.627852737903595},{"id":"https://openalex.org/keywords/time-of-flight","display_name":"Time of flight","score":0.5996186137199402},{"id":"https://openalex.org/keywords/ranging","display_name":"Ranging","score":0.5464594960212708},{"id":"https://openalex.org/keywords/test-bench","display_name":"Test bench","score":0.5086973309516907},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.46609488129615784},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4399813711643219},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4391508996486664},{"id":"https://openalex.org/keywords/wavefront","display_name":"Wavefront","score":0.423819899559021},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.4220495820045471},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.41572582721710205},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4087415635585785},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.36370736360549927},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35410887002944946},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33570826053619385},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.26462477445602417},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.23791778087615967},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2035621702671051},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.1874367892742157},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18643760681152344},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.16844740509986877},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.09612992405891418}],"concepts":[{"id":"https://openalex.org/C81288441","wikidata":"https://www.wikidata.org/wiki/Q20736125","display_name":"Ultrasonic sensor","level":2,"score":0.627852737903595},{"id":"https://openalex.org/C98960154","wikidata":"https://www.wikidata.org/wiki/Q3983322","display_name":"Time of flight","level":2,"score":0.5996186137199402},{"id":"https://openalex.org/C115051666","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Ranging","level":2,"score":0.5464594960212708},{"id":"https://openalex.org/C2776266606","wikidata":"https://www.wikidata.org/wiki/Q476482","display_name":"Test bench","level":2,"score":0.5086973309516907},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.46609488129615784},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4399813711643219},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4391508996486664},{"id":"https://openalex.org/C165699331","wikidata":"https://www.wikidata.org/wiki/Q461533","display_name":"Wavefront","level":2,"score":0.423819899559021},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.4220495820045471},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.41572582721710205},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4087415635585785},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.36370736360549927},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35410887002944946},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33570826053619385},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.26462477445602417},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.23791778087615967},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2035621702671051},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.1874367892742157},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18643760681152344},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.16844740509986877},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09612992405891418},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2010.2063972","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2063972","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1973609478","https://openalex.org/W1977012352","https://openalex.org/W2070151367","https://openalex.org/W2082762531","https://openalex.org/W2100366426","https://openalex.org/W2109303229","https://openalex.org/W2135055020","https://openalex.org/W2137338883","https://openalex.org/W2143441110","https://openalex.org/W2144536224","https://openalex.org/W2159316732","https://openalex.org/W2166044948","https://openalex.org/W4232842671","https://openalex.org/W6676538684"],"related_works":["https://openalex.org/W4384112194","https://openalex.org/W2783354812","https://openalex.org/W2103009189","https://openalex.org/W4312958259","https://openalex.org/W4390813131","https://openalex.org/W2349383066","https://openalex.org/W4308259661","https://openalex.org/W4328132048","https://openalex.org/W1969901537","https://openalex.org/W2036316736"],"abstract_inverted_index":{"This":[0,179],"paper":[1],"researches":[2],"on":[3,68],"the":[4,14,17,37,41,54,57,65,69,78,82,96,101,104,114,154,172],"implementation":[5,30],"of":[6,16,22,36,40,81,103,116,123,125,136,146,157,176],"an":[7],"ultrasonic":[8],"time-of-flight":[9],"(TOF)":[10],"measuring":[11],"system":[12,185],"by":[13,59,130],"difference":[15,144],"peak":[18],"time":[19],"sequences":[20],"(PTSs)":[21],"dual":[23],"frequencies.":[24],"The":[25],"process":[26],"to":[27,73,94,99,150,168],"develop":[28],"appropriate":[29],"parameters":[31],"was":[32,71,92,128,160],"demonstrated.":[33],"Critical":[34],"characteristics":[35,97],"transient":[38],"behavior":[39],"PTS":[42,58,70],"were":[43,51],"studied,":[44],"and":[45,64,98,141,199],"their":[46],"counteracting":[47],"data":[48,63],"processing":[49],"measures":[50],"devised":[52],"in":[53,76,190,212],"process.":[55],"Obtaining":[56],"averaging":[60],"repeated":[61],"test":[62,90,95],"linear":[66],"regression":[67],"found":[72],"be":[74,187],"effective":[75],"uncovering":[77],"actual":[79],"TOF":[80,106,111,183],"first":[83],"wavefront":[84],"with":[85,162,194],"high":[86],"precision.":[87],"A":[88],"PC-based":[89],"bench":[91],"built":[93],"verify":[100],"performance":[102],"new":[105,180],"measurement":[107,112,184],"system.":[108],"In":[109],"our":[110],"over":[113],"distance":[115,152,165],"145":[117],"cm,":[118],"a":[119,126,131,142,151,163,191,195],"standard":[120],"deviation":[121],"(STD)":[122],"0.0113":[124],"period":[127,135],"achieved":[129,161],"nominal":[132,173],"driving":[133,174],"wave":[134],"25.6":[137],"\u03bcs":[138],"(39":[139],"kHz)":[140],"frequency":[143],"factor":[145],"0.0048.":[147],"When":[148],"applied":[149],"measurement,":[153],"worst":[155],"STD":[156],"0.097":[158],"mm":[159],"relative":[164],"ranging":[166],"up":[167],"1450":[169],"mm,":[170],"given":[171],"wavelength":[175],"8.6":[177],"mm.":[178],"dual-frequency":[181],"PTS-based":[182],"can":[186],"economically":[188],"embedded":[189],"microcontroller,":[192],"together":[193],"field-programmable":[196],"gate":[197],"array,":[198],"some":[200],"simple":[201],"transistors":[202],"that":[203],"are":[204],"suitable":[205],"for":[206],"positioning":[207],"mobile":[208],"units":[209],"indoors":[210],"or":[211],"small":[213],"open-field":[214],"environments.":[215]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}