{"id":"https://openalex.org/W2105469715","doi":"https://doi.org/10.1109/tim.2010.2050373","title":"Postprocessing of Near-Field Measurement Based on Neural Networks","display_name":"Postprocessing of Near-Field Measurement Based on Neural Networks","publication_year":2010,"publication_date":"2010-07-08","ids":{"openalex":"https://openalex.org/W2105469715","doi":"https://doi.org/10.1109/tim.2010.2050373","mag":"2105469715"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2010.2050373","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2050373","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040403385","display_name":"Ryadh Brahimi","orcid":null},"institutions":[{"id":"https://openalex.org/I192268740","display_name":"University of Algiers Benyoucef Benkhedda","ror":"https://ror.org/011r6gp69","country_code":"DZ","type":"education","lineage":["https://openalex.org/I192268740"]}],"countries":["DZ"],"is_corresponding":true,"raw_author_name":"Ryadh Brahimi","raw_affiliation_strings":["Europe Africa Manufacturing, Algiers, Algeria","Eur. Africa Manuf., Algiers, Algeria"],"affiliations":[{"raw_affiliation_string":"Europe Africa Manufacturing, Algiers, Algeria","institution_ids":["https://openalex.org/I192268740"]},{"raw_affiliation_string":"Eur. Africa Manuf., Algiers, Algeria","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025941827","display_name":"Adam Kornaga","orcid":null},"institutions":[{"id":"https://openalex.org/I4210129685","display_name":"Huisman (Netherlands)","ror":"https://ror.org/0372zyg05","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210129685"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Adam Kornaga","raw_affiliation_strings":["Huisman, Schiedam, Netherlands","Huisman, Schiedam, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Huisman, Schiedam, Netherlands","institution_ids":["https://openalex.org/I4210129685"]},{"raw_affiliation_string":"Huisman, Schiedam, The Netherlands","institution_ids":["https://openalex.org/I4210129685"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071883369","display_name":"Mohamed Bensetti","orcid":"https://orcid.org/0000-0002-4755-5113"},"institutions":[{"id":"https://openalex.org/I2802505300","display_name":"\u00c9cole Sup\u00e9rieure d'Ing\u00e9nieurs en G\u00e9nie \u00c9lectrique","ror":"https://ror.org/01apwkd48","country_code":"FR","type":"education","lineage":["https://openalex.org/I2802505300"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Mohamed Bensetti","raw_affiliation_strings":["Research Institute of Electronic Embedded Systems (IRSEEM), Ecole Sup\u00e9rieure dIng\u00e9nieur en G\u00e9nie Electrique (ESIGELEC), Saint Etienne du Rouvray, France","Res. Inst. for Electron. Embedded Syst. (IRSEEM), Ecole Super. d'Ingenieur en Genie Electr. (ESIGELEC), St. Etienne du Rouvray, France"],"affiliations":[{"raw_affiliation_string":"Research Institute of Electronic Embedded Systems (IRSEEM), Ecole Sup\u00e9rieure dIng\u00e9nieur en G\u00e9nie Electrique (ESIGELEC), Saint Etienne du Rouvray, France","institution_ids":["https://openalex.org/I2802505300"]},{"raw_affiliation_string":"Res. Inst. for Electron. Embedded Syst. (IRSEEM), Ecole Super. d'Ingenieur en Genie Electr. (ESIGELEC), St. Etienne du Rouvray, France","institution_ids":["https://openalex.org/I2802505300"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050205966","display_name":"David Baudry","orcid":"https://orcid.org/0000-0002-4386-4496"},"institutions":[{"id":"https://openalex.org/I2802505300","display_name":"\u00c9cole Sup\u00e9rieure d'Ing\u00e9nieurs en G\u00e9nie \u00c9lectrique","ror":"https://ror.org/01apwkd48","country_code":"FR","type":"education","lineage":["https://openalex.org/I2802505300"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"David Baudry","raw_affiliation_strings":["Research Institute of Electronic Embedded Systems (IRSEEM), Ecole Sup\u00e9rieure dIng\u00e9nieur en G\u00e9nie Electrique (ESIGELEC), Saint Etienne du Rouvray, France","Res. Inst. for Electron. Embedded Syst. (IRSEEM), Ecole Super. d'Ingenieur en Genie Electr. (ESIGELEC), St. Etienne du Rouvray, France"],"affiliations":[{"raw_affiliation_string":"Research Institute of Electronic Embedded Systems (IRSEEM), Ecole Sup\u00e9rieure dIng\u00e9nieur en G\u00e9nie Electrique (ESIGELEC), Saint Etienne du Rouvray, France","institution_ids":["https://openalex.org/I2802505300"]},{"raw_affiliation_string":"Res. Inst. for Electron. Embedded Syst. (IRSEEM), Ecole Super. d'Ingenieur en Genie Electr. (ESIGELEC), St. Etienne du Rouvray, France","institution_ids":["https://openalex.org/I2802505300"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010815630","display_name":"Zouheir Riah","orcid":null},"institutions":[{"id":"https://openalex.org/I2802505300","display_name":"\u00c9cole Sup\u00e9rieure d'Ing\u00e9nieurs en G\u00e9nie \u00c9lectrique","ror":"https://ror.org/01apwkd48","country_code":"FR","type":"education","lineage":["https://openalex.org/I2802505300"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Zouheir Riah","raw_affiliation_strings":["Research Institute of Electronic Embedded Systems (IRSEEM), Ecole Sup\u00e9rieure dIng\u00e9nieur en G\u00e9nie Electrique (ESIGELEC), Saint Etienne du Rouvray, France","Res. Inst. for Electron. Embedded Syst. (IRSEEM), Ecole Super. d'Ingenieur en Genie Electr. (ESIGELEC), St. Etienne du Rouvray, France"],"affiliations":[{"raw_affiliation_string":"Research Institute of Electronic Embedded Systems (IRSEEM), Ecole Sup\u00e9rieure dIng\u00e9nieur en G\u00e9nie Electrique (ESIGELEC), Saint Etienne du Rouvray, France","institution_ids":["https://openalex.org/I2802505300"]},{"raw_affiliation_string":"Res. Inst. for Electron. Embedded Syst. (IRSEEM), Ecole Super. d'Ingenieur en Genie Electr. (ESIGELEC), St. Etienne du Rouvray, France","institution_ids":["https://openalex.org/I2802505300"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112643258","display_name":"Anne Louis","orcid":null},"institutions":[{"id":"https://openalex.org/I2802505300","display_name":"\u00c9cole Sup\u00e9rieure d'Ing\u00e9nieurs en G\u00e9nie \u00c9lectrique","ror":"https://ror.org/01apwkd48","country_code":"FR","type":"education","lineage":["https://openalex.org/I2802505300"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Anne Louis","raw_affiliation_strings":["Research Institute of Electronic Embedded Systems (IRSEEM), Ecole Sup\u00e9rieure dIng\u00e9nieur en G\u00e9nie Electrique (ESIGELEC), Saint Etienne du Rouvray, France","Res. Inst. for Electron. Embedded Syst. (IRSEEM), Ecole Super. d'Ingenieur en Genie Electr. (ESIGELEC), St. Etienne du Rouvray, France"],"affiliations":[{"raw_affiliation_string":"Research Institute of Electronic Embedded Systems (IRSEEM), Ecole Sup\u00e9rieure dIng\u00e9nieur en G\u00e9nie Electrique (ESIGELEC), Saint Etienne du Rouvray, France","institution_ids":["https://openalex.org/I2802505300"]},{"raw_affiliation_string":"Res. Inst. for Electron. Embedded Syst. (IRSEEM), Ecole Super. d'Ingenieur en Genie Electr. (ESIGELEC), St. Etienne du Rouvray, France","institution_ids":["https://openalex.org/I2802505300"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103003528","display_name":"B\u00e9lahc\u00e8ne Mazari","orcid":"https://orcid.org/0000-0003-1049-2654"},"institutions":[{"id":"https://openalex.org/I2802505300","display_name":"\u00c9cole Sup\u00e9rieure d'Ing\u00e9nieurs en G\u00e9nie \u00c9lectrique","ror":"https://ror.org/01apwkd48","country_code":"FR","type":"education","lineage":["https://openalex.org/I2802505300"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Belahcene Mazari","raw_affiliation_strings":["Research Institute of Electronic Embedded Systems (IRSEEM), Ecole Sup\u00e9rieure dIng\u00e9nieur en G\u00e9nie Electrique (ESIGELEC), Saint Etienne du Rouvray, France","Res. Inst. for Electron. Embedded Syst. (IRSEEM), Ecole Super. d'Ingenieur en Genie Electr. (ESIGELEC), St. Etienne du Rouvray, France"],"affiliations":[{"raw_affiliation_string":"Research Institute of Electronic Embedded Systems (IRSEEM), Ecole Sup\u00e9rieure dIng\u00e9nieur en G\u00e9nie Electrique (ESIGELEC), Saint Etienne du Rouvray, France","institution_ids":["https://openalex.org/I2802505300"]},{"raw_affiliation_string":"Res. Inst. for Electron. Embedded Syst. (IRSEEM), Ecole Super. d'Ingenieur en Genie Electr. (ESIGELEC), St. Etienne du Rouvray, France","institution_ids":["https://openalex.org/I2802505300"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5040403385"],"corresponding_institution_ids":["https://openalex.org/I192268740"],"apc_list":null,"apc_paid":null,"fwci":2.348,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.89323891,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"60","issue":"2","first_page":"539","last_page":"546"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"Electromagnetic compatibility","score":0.7694619297981262},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.7393288612365723},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5750802755355835},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5071158409118652},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4827217757701874},{"id":"https://openalex.org/keywords/multilayer-perceptron","display_name":"Multilayer perceptron","score":0.4723176658153534},{"id":"https://openalex.org/keywords/near-and-far-field","display_name":"Near and far field","score":0.4358684718608856},{"id":"https://openalex.org/keywords/electromagnetic-field","display_name":"Electromagnetic field","score":0.4335884153842926},{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.4333050549030304},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.42561107873916626},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3239523470401764},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3199012577533722},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.12769776582717896},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1046285629272461},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09639179706573486}],"concepts":[{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.7694619297981262},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.7393288612365723},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5750802755355835},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5071158409118652},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4827217757701874},{"id":"https://openalex.org/C179717631","wikidata":"https://www.wikidata.org/wiki/Q2991667","display_name":"Multilayer perceptron","level":3,"score":0.4723176658153534},{"id":"https://openalex.org/C25227671","wikidata":"https://www.wikidata.org/wiki/Q13405516","display_name":"Near and far field","level":2,"score":0.4358684718608856},{"id":"https://openalex.org/C28843909","wikidata":"https://www.wikidata.org/wiki/Q177625","display_name":"Electromagnetic field","level":2,"score":0.4335884153842926},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.4333050549030304},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.42561107873916626},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3239523470401764},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3199012577533722},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.12769776582717896},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1046285629272461},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09639179706573486},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/tim.2010.2050373","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2050373","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-03215436v1","is_oa":false,"landing_page_url":"https://hal.science/hal-03215436","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement, 2011, 60 (2), pp.539-546. ⟨10.1109/TIM.2010.2050373⟩","raw_type":"Journal articles"},{"id":"pmh:oai:HAL:hal-03671879v1","is_oa":false,"landing_page_url":"https://hal-centralesupelec.archives-ouvertes.fr/hal-03671879","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISSN: 0018-9456","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:oskar-bordeaux.fr:20.500.12278/33926","is_oa":false,"landing_page_url":"https://oskar-bordeaux.fr/handle/20.500.12278/33926","pdf_url":null,"source":{"id":"https://openalex.org/S4306402569","display_name":"Oskar-Bordeaux (Universite de Bordeaux)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article de revue"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5699999928474426}],"awards":[],"funders":[{"id":"https://openalex.org/F4320329938","display_name":"R\u00e9gion Normandie","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1543571733","https://openalex.org/W2019256144","https://openalex.org/W2028243772","https://openalex.org/W2029921624","https://openalex.org/W2067452581","https://openalex.org/W2096681965","https://openalex.org/W2099399130","https://openalex.org/W2100142363","https://openalex.org/W2125235734","https://openalex.org/W2132103439","https://openalex.org/W2137983211","https://openalex.org/W2148529477","https://openalex.org/W2155482699","https://openalex.org/W2161916478","https://openalex.org/W2545669459","https://openalex.org/W3146803896","https://openalex.org/W4232457594","https://openalex.org/W4298203171","https://openalex.org/W6843816025","https://openalex.org/W6877464900"],"related_works":["https://openalex.org/W1632426050","https://openalex.org/W2327989369","https://openalex.org/W2115844176","https://openalex.org/W1995470043","https://openalex.org/W2375034536","https://openalex.org/W1589192924","https://openalex.org/W2374806902","https://openalex.org/W4309988865","https://openalex.org/W4313445150","https://openalex.org/W3000026465"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"postprocessing":[3],"based":[4],"on":[5],"neural":[6],"network":[7],"(NN)":[8],"models":[9,27],"to":[10,34,48,71,97],"reconstruct":[11],"the":[12,31,50,66,73,76,82,88,99,102],"magnetic":[13,51],"near-field":[14,36],"profile":[15],"with":[16,81,87],"an":[17],"improved":[18],"spatial":[19],"resolution":[20],"for":[21],"one":[22],"or":[23],"different":[24],"frequencies.":[25],"The":[26,41,78],"aim":[28],"at":[29],"decreasing":[30],"time":[32],"required":[33],"perform":[35],"electromagnetic":[37],"compatibility":[38],"(EMC)":[39],"measurements.":[40],"multilayer":[42],"perceptron":[43],"(MLP)":[44],"NNs":[45],"are":[46,85],"used":[47],"determine":[49,72],"near":[52],"field":[53],"radiated":[54],"by":[55],"passive":[56],"devices":[57],"and":[58],"power":[59],"electronics":[60],"components.":[61],"An":[62],"optimization":[63],"method,":[64,68],"called":[65],"split-sample":[67],"is":[69,95],"implemented":[70],"structures":[74],"of":[75,101],"NN.":[77],"results":[79],"obtained":[80],"proposed":[83],"method":[84],"compared":[86],"measurement":[89],"results.":[90],"A":[91],"graphic":[92],"interface":[93],"(GUI)":[94],"created":[96],"simplify":[98],"utilization":[100],"developed":[103],"NN":[104],"models.":[105]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}