{"id":"https://openalex.org/W1965598877","doi":"https://doi.org/10.1109/tim.2010.2049216","title":"Rapid Rotary Scanner and Portable Coherent Wideband Q-Band Transceiver for High-Resolution Millimeter-Wave Imaging Applications","display_name":"Rapid Rotary Scanner and Portable Coherent Wideband Q-Band Transceiver for High-Resolution Millimeter-Wave Imaging Applications","publication_year":2010,"publication_date":"2010-05-27","ids":{"openalex":"https://openalex.org/W1965598877","doi":"https://doi.org/10.1109/tim.2010.2049216","mag":"1965598877"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2010.2049216","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2049216","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110664538","display_name":"Mohammad Tayeb Ghasr","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Mohammad Tayeb Ghasr","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058942455","display_name":"David Pommerenke","orcid":"https://orcid.org/0000-0002-0649-8159"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Pommerenke","raw_affiliation_strings":["Electromagnetic Compatibility Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Electromagnetic Compatibility Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108676702","display_name":"Joseph T. Case","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Joseph T. Case","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057912138","display_name":"Andrew McClanahan","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrew McClanahan","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5097003568","display_name":"Aman Aflaki-Beni","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aman Aflaki-Beni","raw_affiliation_strings":["Electromagnetic Compatibility Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Electromagnetic Compatibility Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086097143","display_name":"Mohamed A. Abou\u2010Khousa","orcid":"https://orcid.org/0000-0002-0653-9539"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]},{"id":"https://openalex.org/I4210105758","display_name":"Robarts Clinical Trials","ror":"https://ror.org/01e36dv41","country_code":"CA","type":"facility","lineage":["https://openalex.org/I125749732","https://openalex.org/I4210105758","https://openalex.org/I4405252475"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Mohamed Abou-Khousa","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","Imaging Research Laboratories, Robarts Research Institute, London, ONT, Canada"],"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]},{"raw_affiliation_string":"Imaging Research Laboratories, Robarts Research Institute, London, ONT, Canada","institution_ids":["https://openalex.org/I4210105758"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110104153","display_name":"Sergey Kharkovsky","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sergey Kharkovsky","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111520498","display_name":"Kyle Guinn","orcid":null},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kyle Guinn","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077207569","display_name":"Francesco de Paulis","orcid":"https://orcid.org/0000-0002-5613-2454"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Francesco De Paulis","raw_affiliation_strings":["Electromagnetic Compatibility Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Electromagnetic Compatibility Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088505165","display_name":"Reza Zoughi","orcid":"https://orcid.org/0000-0001-9421-1551"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Reza Zoughi","raw_affiliation_strings":["Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5110664538"],"corresponding_institution_ids":["https://openalex.org/I20382870"],"apc_list":null,"apc_paid":null,"fwci":4.9069,"has_fulltext":false,"cited_by_count":53,"citation_normalized_percentile":{"value":0.95170943,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"60","issue":"1","first_page":"186","last_page":"197"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/raster-scan","display_name":"Raster scan","score":0.8187793493270874},{"id":"https://openalex.org/keywords/scanner","display_name":"Scanner","score":0.6869314312934875},{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.6097606420516968},{"id":"https://openalex.org/keywords/wideband","display_name":"Wideband","score":0.6094766855239868},{"id":"https://openalex.org/keywords/synthetic-aperture-radar","display_name":"Synthetic aperture radar","score":0.5110005140304565},{"id":"https://openalex.org/keywords/raster-graphics","display_name":"Raster graphics","score":0.4827548861503601},{"id":"https://openalex.org/keywords/extremely-high-frequency","display_name":"Extremely high frequency","score":0.47162675857543945},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.46484535932540894},{"id":"https://openalex.org/keywords/microwave-imaging","display_name":"Microwave imaging","score":0.45663076639175415},{"id":"https://openalex.org/keywords/radar-imaging","display_name":"Radar imaging","score":0.4395274519920349},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.43405407667160034},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42585843801498413},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4122948944568634},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.36811286211013794},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.2362702190876007},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23261457681655884},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.18945753574371338},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.1395309865474701},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10531914234161377}],"concepts":[{"id":"https://openalex.org/C145406643","wikidata":"https://www.wikidata.org/wiki/Q2641959","display_name":"Raster scan","level":2,"score":0.8187793493270874},{"id":"https://openalex.org/C2779751349","wikidata":"https://www.wikidata.org/wiki/Q1474480","display_name":"Scanner","level":2,"score":0.6869314312934875},{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.6097606420516968},{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.6094766855239868},{"id":"https://openalex.org/C87360688","wikidata":"https://www.wikidata.org/wiki/Q740686","display_name":"Synthetic aperture radar","level":2,"score":0.5110005140304565},{"id":"https://openalex.org/C181844469","wikidata":"https://www.wikidata.org/wiki/Q182270","display_name":"Raster graphics","level":2,"score":0.4827548861503601},{"id":"https://openalex.org/C45764600","wikidata":"https://www.wikidata.org/wiki/Q570342","display_name":"Extremely high frequency","level":2,"score":0.47162675857543945},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.46484535932540894},{"id":"https://openalex.org/C2779885931","wikidata":"https://www.wikidata.org/wiki/Q17010029","display_name":"Microwave imaging","level":3,"score":0.45663076639175415},{"id":"https://openalex.org/C10929652","wikidata":"https://www.wikidata.org/wiki/Q7279985","display_name":"Radar imaging","level":3,"score":0.4395274519920349},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.43405407667160034},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42585843801498413},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4122948944568634},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36811286211013794},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.2362702190876007},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23261457681655884},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.18945753574371338},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.1395309865474701},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10531914234161377},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2010.2049216","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2010.2049216","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.46000000834465027}],"awards":[],"funders":[{"id":"https://openalex.org/F4320312855","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12"},{"id":"https://openalex.org/F4320324094","display_name":"Technische Universit\u00e4t Berlin","ror":"https://ror.org/03v4gjf40"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W133710783","https://openalex.org/W603284775","https://openalex.org/W1494712161","https://openalex.org/W1597918345","https://openalex.org/W1644223362","https://openalex.org/W1656536982","https://openalex.org/W1983614486","https://openalex.org/W2001421076","https://openalex.org/W2075961265","https://openalex.org/W2078940259","https://openalex.org/W2107625025","https://openalex.org/W2112448459","https://openalex.org/W2129033542","https://openalex.org/W2142389558","https://openalex.org/W2155684415","https://openalex.org/W2215074867","https://openalex.org/W2798391485","https://openalex.org/W2798875205","https://openalex.org/W4248288458","https://openalex.org/W6676369166","https://openalex.org/W6688444423"],"related_works":["https://openalex.org/W2028294394","https://openalex.org/W2000057434","https://openalex.org/W4320058834","https://openalex.org/W2107398604","https://openalex.org/W1524663624","https://openalex.org/W2207211961","https://openalex.org/W3204642193","https://openalex.org/W1985349375","https://openalex.org/W1999212008","https://openalex.org/W2152543864"],"abstract_inverted_index":{"Millimeter-wave":[0],"imaging":[1,25,33,105,143,219,265],"techniques,":[2,144],"based":[3],"on":[4,84],"synthetic":[5,217],"aperture":[6,218],"focusing":[7],"(SAF),":[8],"have":[9],"been":[10],"successfully":[11],"used":[12],"for":[13,91,125,206,216],"nondestructive":[14],"testing":[15],"(NDT)":[16],"of":[17,65,102,114,141,164,175,193,227,238,250,262,268],"various":[18],"composite":[19],"and":[20,54,94,111,145,179,199,210,212,220,247,279],"aerospace":[21],"structures.":[22],"Most":[23,45],"current":[24],"mechanisms":[26],"utilize":[27],"raster":[28,46],"scanning":[29,47,85,128,165,241],"platforms,":[30,48],"whereby":[31],"the":[32,42,63,100,139,190,202,221,225,236,239,243,248,251,260,263,274],"system":[34,187,205],"is":[35,117,121],"scanned":[36],"in":[37,52,107,135,170,189],"a":[38,70,122,147,158,166,171,183,255],"rectangular":[39],"grid":[40],"over":[41],"structure-under-test":[43],"(SUT).":[44],"although":[49],"relatively":[50,167,172,228],"simple":[51],"design":[53,237],"construction,":[55],"are":[56,76,88,277],"inherently":[57],"slow.":[58],"Furthermore,":[59],"SAF":[60,267],"techniques":[61,106],"necessitates":[62],"use":[64],"vector-measuring":[66],"instruments":[67],"such":[68],"as":[69],"vector":[71],"network":[72],"analyzer":[73],"(VNA),":[74],"which":[75],"typically:":[77],"1)":[78],"bulky;":[79],"2)":[80],"cannot":[81],"be":[82],"mounted":[83],"platforms;":[86],"3)":[87],"not":[89],"suitable":[90,215],"in-field":[92],"use;":[93],"4)":[95],"expensive.":[96],"These":[97],"factors":[98],"limit":[99],"effectiveness":[101],"these":[103,142],"millimeter-wave":[104,230],"applications":[108],"where":[109],"frequent":[110],"rapid":[112,126],"inspection":[113],"large":[115,168],"structures":[116,271],"required.":[118],"Hence,":[119],"there":[120],"great":[123],"demand":[124],"mechanical":[127],"systems":[129,253],"combined":[130],"with":[131],"portable":[132,185],"wideband":[133],"transceivers":[134],"order":[136],"to":[137,150],"increase":[138],"utility":[140],"provide":[146],"real":[148],"solution":[149],"many":[151],"practical":[152],"NDT":[153],"applications.":[154],"To":[155,258],"this":[156],"end,":[157],"unique":[159],"rotary":[160,203,240],"scanner":[161,204],"system,":[162,242,266,276],"capable":[163],"area":[169],"short":[173],"span":[174],"time,":[176],"was":[177,197],"designed":[178],"constructed.":[180],"In":[181],"addition,":[182],"custom-designed":[184,256],"transceiver":[186,246],"operating":[188],"frequency":[191],"range":[192],"35-45":[194],"GHz":[195],"(Q-band)":[196],"developed":[198],"incorporated":[200],"into":[201],"producing":[207],"coherent":[208],"(amplitude":[209],"phase)":[211],"accurate":[213],"data":[214],"10-GHz":[222],"bandwidth":[223],"allows":[224],"generation":[226],"high-resolution":[229],"holographical":[231],"images.":[232],"This":[233],"paper":[234],"presents":[235],"associated":[244],"Q-band":[245],"integration":[249],"two":[252],"via":[254],"software.":[257],"illustrate":[259],"efficacy":[261],"complete":[264],"several":[269],"complex":[270],"produced":[272],"using":[273],"proposed":[275],"presented":[278],"discussed.":[280]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":6},{"year":2012,"cited_by_count":6}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}